Patents by Inventor Shinji Motomura
Shinji Motomura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10175369Abstract: To make correct determination of electric charge collection among signals from a semiconductor radiation detector, provided in an embodiment of the present invention is a signal data processing method. The method includes a step of calculating timing data sequences unique to channels (timing data calculation step S02), each of channels corresponding to each of plural electrodes of the radiation detector, from detection signal data sequences. Then, while making a comparison with a first threshold value, a data value for the timing data sequence at timing when a predetermined delay time is elapsed after the timing data sequence reached the first predetermined value is selected as a timing data value for determination for the channel (delay and selection step S04).Type: GrantFiled: July 17, 2014Date of Patent: January 8, 2019Assignee: RIKENInventors: Tomonori Fukuchi, Shinji Motomura, Shuichi Enomoto
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Patent number: 9784857Abstract: Focusing on a gamma ray detection phenomenon (event) in which a gamma ray from a gamma ray source is Compton scattered at a first-stage detector, the gamma ray is photoelectrically absorbed at a second-stage detector, the spatial distribution of the gamma ray source is imaged within a predetermined image space on the basis of measurement data for the interaction of the detectors and gamma rays. At this time, a probability parameter (vij) indicating the probability that Compton-scattered gamma ray arrived from within the image space and a detection sensitivity parameter (sij) indicating gamma ray detection sensitivity are set for each event and each pixel on the basis of the measurement data for each event, and these parameters are used to determine the pixel values (?j) for each pixel.Type: GrantFiled: August 28, 2015Date of Patent: October 10, 2017Assignee: RIKENInventors: Takahiro Ida, Shinji Motomura, Shuichi Enomoto
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Publication number: 20170261624Abstract: Focusing on a gamma ray detection phenomenon (event) in which a gamma ray from a gamma ray source is Compton scattered at a first-stage detector, the gamma ray is photoelectrically absorbed at a second-stage detector, the spatial distribution of the gamma ray source is imaged within a predetermined image space on the basis of measurement data for the interaction of the detectors and gamma rays. At this time, a probability parameter (vij) indicating the probability that Compton-scattered gamma ray arrived from within the image space and a detection sensitivity parameter (sij) indicating gamma ray detection sensitivity are set for each event and each pixel on the basis of the measurement data for each event, and these parameters are used to determine the pixel values (?j) for each pixel.Type: ApplicationFiled: August 28, 2015Publication date: September 14, 2017Applicant: RIKENInventors: Takahiro Ida, Shinji Motomura, Shuichi Enomoto
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Publication number: 20150025852Abstract: To make correct determination of electric charge collection among signals from a semiconductor radiation detector, provided in an embodiment of the present invention is a signal data processing method. The method includes a step of calculating timing data sequences unique to channels (timing data calculation step S02), each of channels corresponding to each of plural electrodes of the radiation detector, from detection signal data sequences. Then, while making a comparison with a first threshold value, a data value for the timing data sequence at timing when a predetermined delay time is elapsed after the timing data sequence reached the first predetermined value is selected as a timing data value for determination for the channel (delay and selection step S04).Type: ApplicationFiled: July 17, 2014Publication date: January 22, 2015Inventors: Tomonori FUKUCHI, Shinji MOTOMURA, Shuichi ENOMOTO
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Patent number: 8847166Abstract: To simultaneously image a plurality types of tracer molecules for a Compton image and a PET image. Provided is an imaging device comprising: a first Compton camera (10) for receiving one gamma ray emitted from an imaging target (900) administered by first probe having positron emitting nuclei and second probe having gamma ray emission nuclei; and a second Compton camera (20) which is arranged opposite to the first Compton camera (10) and receives another gamma ray emitted from the imaging target (900). The imaging device is also provided with: an imaging processor for distinguishing and reconstructing a PET image and a Compton image in accordance with the combination of the Compton cameras which detected the gamma rays; and a display for displaying the PET image and the Compton image in association respectively with the first and the second probes.Type: GrantFiled: November 15, 2011Date of Patent: September 30, 2014Assignee: RikenInventors: Tomonori Fukuchi, Shinji Motomura, Shin'ichiro Takeda, Shuichi Enomoto
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Publication number: 20130334429Abstract: To simultaneously image a plurality types of tracer molecules for a Compton image and a PET image. Provided is an imaging device comprising: a first Compton camera (10) for receiving one gamma ray emitted from an imaging target (900) administered by first probe having positron emitting nuclei and second probe having gamma ray emission nuclei; and a second Compton camera (20) which is arranged opposite to the first Compton camera (10) and receives another gamma ray emitted from the imaging target (900). The imaging device is also provided with: an imaging processor for distinguishing and reconstructing a PET image and a Compton image in accordance with the combination of the Compton cameras which detected the gamma rays; and a display for displaying the PET image and the Compton image in association respectively with the first and the second probes.Type: ApplicationFiled: November 15, 2011Publication date: December 19, 2013Applicant: RIKENInventors: Tomonori Fukuchi, Shinji Motomura, Shin'ichiro Takeda, Shuichi Enomoto
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Patent number: 8227759Abstract: The apparatus has an energy calculation section 32 that calculates energy deposit values of interactions based on signals obtained from segmented electrodes 11, 12 provided on two opposite surfaces of a semiconductor crystal, a reference waveform storing section 33 that stores beforehand waveforms that will be obtained from the segmented electrodes when a single interaction occurs for multiple positions in the crystal, a waveform synthesis section 34 that synthesizes reference waveforms corresponding to arbitrary two points in the crystal as candidate points of interaction at a ratio equal to a ratio of their energy deposit values, and a comparison section 35 that compares a measured waveform and the synthesized waveforms. The candidate points from which the synthesized waveform most similar to the measured waveform is obtained is determined to be the positions of interactions. Thus, even in cases where multiple interactions occur, the positions of the interactions can be detected.Type: GrantFiled: October 28, 2009Date of Patent: July 24, 2012Assignee: RikenInventors: Tomonori Fukuchi, Shinji Motomura, Shuichi Enomoto, Yousuke Kanayama
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Patent number: 8076645Abstract: A gamma ray detector is provided that increases a detectable energy range. A position-sensitive gamma ray detecting element for low energy gamma rays 101 that can detect an interaction position and energy of a gamma ray is disposed in front of a pair of position-sensitive gamma ray detecting elements for high energy gamma rays 102 and 103 that can detect an interaction position and energy of a gamma ray.Type: GrantFiled: August 9, 2007Date of Patent: December 13, 2011Assignee: RikenInventors: Shinji Motomura, Shuichi Enomoto
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Patent number: 7902523Abstract: To observe and analyze intermolecular interactions such as diffusion and/or binding behaviors of molecules in a sample in a reacting state against optical stimulation, while applying the optical stimulation to a desired region in the sample by irradiating stimulus light. There is provided a fluorescence microscope apparatus comprising: a fluorescence image-capturing optical system; a stimulus light-irradiation optical system which includes a scanner for; a control unit which acquires temporal observation data by repeatedly capturing images using said image-capturing optical system while applying optical stimulation using the stimulus light-irradiation optical system; an analysis unit; and a display unit.Type: GrantFiled: April 29, 2008Date of Patent: March 8, 2011Assignee: Olympus CorporationInventor: Shinji Motomura
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Publication number: 20100176303Abstract: A gamma ray detector is provided that increases a detectable energy range. A position-sensitive gamma ray detecting element for low energy gamma rays 101 that can detect an interaction position and energy of a gamma ray is disposed in front of a pair of position-sensitive gamma ray detecting elements for high energy gamma rays 102 and 103 that can detect an interaction position and energy of a gamma ray.Type: ApplicationFiled: August 9, 2007Publication date: July 15, 2010Inventors: Shinji Motomura, Shuichi Enomoto
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Publication number: 20100102240Abstract: The apparatus has an energy calculation section 32 that calculates energy deposit values of interactions based on signals obtained from segmented electrodes 11, 12 provided on two opposite surfaces of a semiconductor crystal, a reference waveform storing section 33 that stores beforehand waveforms that will be obtained from the segmented electrodes when a single interaction occurs for multiple positions in the crystal, a waveform synthesis section 34 that synthesizes reference waveforms corresponding to arbitrary two points in the crystal as candidate points of interaction at a ratio equal to a ratio of their energy deposit values, and a comparison section 35 that compares a measured waveform and the synthesized waveforms. The candidate points from which the synthesized waveform most similar to the measured waveform is obtained is determined to be the positions of interactions. Thus, even in cases where multiple interactions occur, the positions of the interactions can be detected.Type: ApplicationFiled: October 28, 2009Publication date: April 29, 2010Inventors: Tomonori FUKUCHI, Shinji Motomura, Shuichi Enomoto, Yousuke Kanayama
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Publication number: 20080290293Abstract: To observe and analyze intermolecular interactions such as diffusion and/or binding behaviors of molecules in a sample in a reacting state against optical stimulation, while applying the optical stimulation to a desired region in the sample by irradiating stimulus light.Type: ApplicationFiled: April 29, 2008Publication date: November 27, 2008Applicant: OLYMPUS CORPORATIONInventor: Shinji MOTOMURA
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Patent number: 7253420Abstract: A scanning microscope system includes an optical microscope observation unit that irradiates the sample with excitation light, and forms an optical image from fluorescence emitted from a sample. The system also includes a scanning map creator and a flying spot scanning observation unit. The scanning map creator creates a scanning map indicating a scanning region in which a substance to be scanned exists in the sample, based on brightness of pixels of the optical image. The flying spot scanning observation unit scans the scanning region of the sample with laser beam, and forms a scanning image based on fluorescence emitted from the sample.Type: GrantFiled: October 18, 2004Date of Patent: August 7, 2007Assignee: Olympus CorporationInventor: Shinji Motomura
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Patent number: 7238934Abstract: A distance is calculated between a target observation area which is an observation area in which a focusing position of an object lens provided for the microscope apparatus is positioned in a plurality of observation areas set for an observation specimen which is an observation target in the microscope apparatus; moving the observation specimen on a plane perpendicular to an optical axis of the object lens; and an observation area on which no image obtaining process or stimulating process are performed among the observation areas, and which has the shortest distance to the target observation area is positioned in the focusing position of the object lens.Type: GrantFiled: December 28, 2004Date of Patent: July 3, 2007Assignee: Olympus CorporationInventor: Shinji Motomura
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Patent number: 7158294Abstract: An image recording method for use in a confocal laser scanning microscope apparatus is configured to scan a specimen with each of a plurality of laser lights at least having different wavelengths as spotlight, to detect the light from the specimen based on the spotlight, and to partition and record obtained image information.Type: GrantFiled: December 5, 2002Date of Patent: January 2, 2007Assignee: Olympus Optical Co., Ltd.Inventors: Shinji Motomura, Tatsuo Nakata
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Publication number: 20050156106Abstract: A distance is calculated between a target observation area which is an observation area in which a focusing position of an object lens provided for the microscope apparatus is positioned in a plurality of observation areas set for an observation specimen which is an observation target in the microscope apparatus; moving the observation specimen on a plane perpendicular to an optical axis of the object lens; and an observation area on which no image obtaining process or stimulating process are performed among the observation areas, and which has the shortest distance to the target observation area is positioned in the focusing position of the object lens.Type: ApplicationFiled: December 28, 2004Publication date: July 21, 2005Applicant: Olympus CorporationInventor: Shinji Motomura
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Publication number: 20050139775Abstract: Disclosed is a gamma-ray image pickup apparatus having high energy resolution and high position resolution. A Compton camera is constructed by arranging two electrode split planar germanium semiconductor detectors in front and behind. This Compton camera processes a detection signal obtained from an anode and a cathode of the planar electrode split germanium detector, and can measure at how deep position from the detector surface the interaction of a gamma ray occurs. Moreover, with regard to the direction parallel to the electrode surface of the detector, the interaction position of the gamma ray was able to be measured with high accuracy, Accordingly, spatial resolution is improved by resolving a formula for the kinematics of Compton scattering with excellent accuracy.Type: ApplicationFiled: December 23, 2004Publication date: June 30, 2005Inventors: Yasuyuki Gono, Shinji Motomura, Shuichi Enomoto, Yasushige Yano
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Publication number: 20050082494Abstract: A scanning microscope system includes an optical microscope observation unit that irradiates the sample with excitation light, and forms an optical image from fluorescence emitted from a sample. The system also includes a scanning map creator and a flying spot scanning observation unit. The scanning map creator creates a scanning map indicating a scanning region in which a substance to be scanned exists in the sample, based on brightness of pixels of the optical image. The flying spot scanning observation unit scans the scanning region of the sample with laser beam, and forms a scanning image based on fluorescence emitted from the sample.Type: ApplicationFiled: October 18, 2004Publication date: April 21, 2005Applicant: Olympus CorporationInventor: Shinji Motomura
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Publication number: 20030128424Abstract: An image recording method for use in a confocal laser scanning microscope apparatus is configured to scan a specimen with each of a plurality of laser lights at least having different wavelengths as spotlight, to detect the light from the specimen based on the spotlight, and to partition and record obtained image information.Type: ApplicationFiled: December 5, 2002Publication date: July 10, 2003Applicant: Olympus Optical Co., Ltd.Inventors: Shinji Motomura, Tatsuo Nakata