Patents by Inventor Shinrin Takahashi

Shinrin Takahashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automated system and method for detecting defective edges of printed circuit boards and other objects using multiple sensors
    Patent number: 10088339
    Abstract: An automated system and method for detecting substantial edge defects on an object that can degrade or impede proper object performance. The defects, such as chips, cracks, or bumps, if sufficiently substantial, can interfere with the proper operation of the object. The inspection may be performed with four electronic sensors, two on each side of the object, or with two electronic sensors that each take two sets of measurements spaced apart by a certain time interval. Sensor measurements are periodically obtained and used by a controller to calculate a value based on the four sensor measurements. The calculated value is compared to a threshold to determine whether or not any defects are significant.
    Type: Grant
    Filed: June 30, 2015
    Date of Patent: October 2, 2018
    Assignee: Azbil Corporation
    Inventors: Tasuku Imanishi, Shinrin Takahashi
  • AUTOMATED SYSTEM AND METHOD FOR DETECTING DEFECTIVE EDGES OF PRINTED CIRCUIT BOARDS AND OTHER OBJECTS USING MULTIPLE SENSORS
    Publication number: 20160238372
    Abstract: An automated system and method for detecting substantial edge defects on an object that can degrade or impede proper object performance. The defects, such as chips, cracks, or bumps, if sufficiently substantial, can interfere with the proper operation of the object. The inspection may be performed with four electronic sensors, two on each side of the object, or with two electronic sensors that each take two sets of measurements spaced apart by a certain time interval. Sensor measurements are periodically obtained and used by a controller to calculate a value based on the four sensor measurements. The calculated value is compared to a threshold to determine whether or not any defects are significant.
    Type: Application
    Filed: June 30, 2015
    Publication date: August 18, 2016
    Inventors: Tasuku Imanishi, Shinrin Takahashi