Abstract: Provided is a test system of a semiconductor integrated circuit including an output device and an input device for conducting an input/output characteristics test of the output device and the input device inside the semiconductor integrated circuit. In the system, a transmission line provided in a test board where the semiconductor integrated circuit is mounted on establishes a wired connection between an external terminal of one circuit of one of the output device and the input device and external terminals of a plurality of circuits of another one of the output device and the input device.

Abstract: Provided is a test system of a semiconductor integrated circuit including an output device and an input device for conducting an input/output characteristics test of the output device and the input device inside the semiconductor integrated circuit. In the system, a transmission line provided in a test board where the semiconductor integrated circuit is mounted on establishes a wired connection between an external terminal of one circuit of one of the output device and the input device and external terminals of a plurality of circuits of another one of the output device and the input device.

Abstract: A plurality of transistor pairs of Pch and Nch transistors are connected in series between VDD and GND. An I/O terminal is connected to each connection point of the transistor pairs. Two transistor pairs constitute one transistor set, in which each of two Pch transistors and two Nch transistors have the same on-resistance. In input mode, one of the two transistor pairs in a first set is turned on, and a transistor pair of a second or later set is selectively turned on. In output mode, two Pch transistors or two Nch transistors of the first set are turned on, and a transistor of the second or later set is selectively turned on.

Abstract: A plurality of transistor pairs of Pch and Nch transistors are connected in series between VDD and GND. An I/O terminal is connected to each connection point of the transistor pairs. Two transistor pairs constitute one transistor set, in which each of two Pch transistors and two Nch transistors have the same on-resistance. In input mode, one of the two transistor pairs in a first set is turned on, and a transistor pair of a second or later set is selectively turned on. In output mode, two Pch transistors or two Nch transistors of the first set are turned on, and a transistor of the second or later set is selectively turned on.

Abstract: A plurality of transistor pairs of Pch and Nch transistors are connected in series between VDD and GND. An I/O terminal is connected to each connection point of the transistor pairs. Two transistor pairs constitute one transistor set, in which each of two Pch transistors and two Nch transistors have the same on-resistance. In input mode, one of the two transistor pairs in a first set is turned on, and a transistor pair of a second or later set is selectively turned on. In output mode, two Pch transistors or two Nch transistors of the first set are turned on, and a transistor of the second or later set is selectively turned on.

Abstract: A flicker correction apparatus for correcting a flicker component of an image signal obtained by imaging an object using an imaging device is provided. The apparatus comprises an image average calculation section for calculating an average of the image signal, a flicker frequency calculation section for calculating a flicker frequency, a flicker data extraction section for extracting flicker data using the average of the image signal and the flicker frequency, a flicker determination section for determining the presence or absence of a flicker phenomenon using the flicker data, a flicker correction amount calculation section for calculating a flicker correction amount using the flicker data, and a flicker correction section for removing the flicker component of the image data using the flicker correction amount.

Abstract: A plurality of transistor pairs of Pch and Nch transistors are connected in series between VDD and GND. An I/O terminal is connected to each connection point of the transistor pairs. Two transistor pairs constitute one transistor set, in which each of two Pch transistors and two Nch transistors have the same on-resistance. In input mode, one of the two transistor pairs in a first set is turned on, and a transistor pair of a second or later set is selectively turned on. In output mode, two Pch transistors or two Nch transistors of the first set are turned on, and a transistor of the second or later set is selectively turned on.

Abstract: A flicker correction apparatus for correcting a flicker component of an image signal obtained by imaging an object using an imaging device is provided. The apparatus comprises an image average calculation section for calculating an average of the image signal, a flicker frequency calculation section for calculating a flicker frequency, a flicker data extraction section for extracting flicker data using the average of the image signal and the flicker frequency, a flicker determination section for determining the presence or absence of a flicker phenomenon using the flicker data, a flicker correction amount calculation section for calculating a flicker correction amount using the flicker data, and a flicker correction section for removing the flicker component of the image data using the flicker correction amount.