Patents by Inventor Shinsuke Miki
Shinsuke Miki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11984833Abstract: An electric vehicle control device includes a first inverter controlling a first group defined by induction motors, and a second inverter controlling a second group defined by induction motors. The first inverter and the induction motors of the first group are connected to each other by a first conductor. The second inverter and the induction motors of the second group are connected by a second conductor. A first length is equal to or less than three times the average value of a second length and a third length. The first length is an inter-center distance between the first conductor and the second conductor, the second length is the maximum length of a conductor portion of the first conductor in the cross section of the first conductor, and the third length is the maximum length of a conductor portion of the second conductor in the cross section of the second conductor.Type: GrantFiled: August 1, 2019Date of Patent: May 14, 2024Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Naoki Nishio, Yasuhiro Shiraki, Takayoshi Miki, Shinsuke Kadoi, Hisanori Yamasaki, Sho Kato, Tetsuo Sugahara
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Patent number: 11977373Abstract: An abnormality diagnosis method for diagnosing an abnormality in operational state of a diagnosis subject includes creating a unit space from normal operation data of the diagnosis subject, the unit space serving as a reference for determining the operational state of the diagnosis subject, acquiring data having state quantities of a plurality of evaluation items from the diagnosis subject, calculating a Mahalanobis distance of the data acquired, using the unit space created, and determining an abnormality in the operational state of the diagnosis subject based on the Mahalanobis distance calculated. The creating a unit space includes creating a plurality of unit spaces having mutually different data lengths The calculating a Mahalanobis distance includes calculating a plurality of Mahalanobis distances using the plurality of unit spaces created. The determining an abnormality includes determining an abnormality based on the plurality of Mahalanobis distances calculated.Type: GrantFiled: April 28, 2020Date of Patent: May 7, 2024Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Misa Nozuki, Shinsuke Miki
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Patent number: 11885848Abstract: A device for assessing remaining life of a rotating electrical machine includes: a data acquisition unit configured to acquire actual running performance data and electrical data about the rotating electrical machine to be assessed; an index value calculation unit configured to calculate a first index value to a third index value based on the acquired data, and to calculate, as a fourth index value, an estimation value of a residual withstand voltage value of the rotating electrical machine by performing analysis that uses an MT method on each piece of the electrical data; and an insulation deterioration estimation unit configured to assess the remaining life of the rotating electrical machine by estimating the remaining life of the rotating electrical machine with use of four index values from the first index value to the fourth index value.Type: GrantFiled: November 15, 2019Date of Patent: January 30, 2024Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Tadao Otani, Kazuo Hayashi, Hiroshige Fujita, Wataru Nagaya, Shinsuke Miki
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Patent number: 11782430Abstract: An abnormality diagnosis method for diagnosing an abnormality in equipment includes acquiring multivariate time-series data for a plurality of measurement items from the equipment, diagnosing an abnormality in operational state of the equipment based on the multivariate time-series data, and diagnosing a cause of the abnormality. The diagnosing a cause of the abnormality includes extracting a feature of a first section before the occurrence of the abnormality from the multivariate time-series data of the first section, extracting a feature of a second section after the occurrence of the abnormality from the multivariate time-series data of the second section, obtaining an amount of change in feature from a difference between the feature of the first section and the feature of the second section, and diagnosing a measurement item that is the cause of the abnormality based on the amounts of change in features of the plurality of measurement items.Type: GrantFiled: April 27, 2020Date of Patent: October 10, 2023Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Misa Nozuki, Shinsuke Miki
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Publication number: 20230081892Abstract: An abnormality diagnosis method for diagnosing an abnormality in equipment includes acquiring multivariate time-series data for a plurality of measurement items from the equipment, diagnosing an abnormality in operational state of the equipment based on the multivariate time-series data, and diagnosing a cause of the abnormality. The diagnosing a cause of the abnormality includes extracting a feature of a first section before the occurrence of the abnormality from the multivariate time-series data of the first section, extracting a feature of a second section after the occurrence of the abnormality from the multivariate time-series data of the second section, obtaining an amount of change in feature from a difference between the feature of the first section and the feature of the second section, and diagnosing a measurement item that is the cause of the abnormality based on the amounts of change in features of the plurality of measurement items.Type: ApplicationFiled: April 27, 2020Publication date: March 16, 2023Applicant: Mitsubishi Electric CorporationInventors: Misa NOZUKI, Shinsuke MIKI
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Publication number: 20220413478Abstract: An abnormality diagnosis method for diagnosing an abnormality in operational state of a diagnosis subject includes creating a unit space from normal operation data of the diagnosis subject, the unit space serving as a reference for determining the operational state of the diagnosis subject, acquiring data having state quantities of a plurality of evaluation items from the diagnosis subject, calculating a Mahalanobis distance of the data acquired, using the unit space created, and determining an abnormality in the operational state of the diagnosis subject based on the Mahalanobis distance calculated. The creating a unit space includes creating a plurality of unit spaces having mutually different data lengths The calculating a Mahalanobis distance includes calculating a plurality of Mahalanobis distances using the plurality of unit spaces created. The determining an abnormality includes determining an abnormality based on the plurality of Mahalanobis distances calculated.Type: ApplicationFiled: April 28, 2020Publication date: December 29, 2022Applicant: Mitsubishi Electric CorporationInventors: Misa NOZUKI, Shinsuke MIKI
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Publication number: 20210405117Abstract: A device for assessing remaining life of a rotating electrical machine includes: a data acquisition unit configured to acquire actual running performance data and electrical data about the rotating electrical machine to be assessed; an index value calculation unit configured to calculate a first index value to a third index value based on the acquired data, and to calculate, as a fourth index value, an estimation value of a residual withstand voltage value of the rotating electrical machine by performing analysis that uses an MT method on each piece of the electrical data; and an insulation deterioration estimation unit configured to assess the remaining life of the rotating electrical machine by estimating the remaining life of the rotating electrical machine with use of four index values from the first index value to the fourth index value.Type: ApplicationFiled: November 15, 2019Publication date: December 30, 2021Applicant: Mitsubishi Electric CorporationInventors: Tadao OTANI, Kazuo HAYASHI, Hiroshige FUJITA, Wataru NAGAYA, Shinsuke MIKI
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Patent number: 9841464Abstract: A life prediction apparatus for an electrical storage device, which has a life predictor, includes: an operation controller for life prediction that controls operation of the electrical storage device; a data collector that collects measurement data with respect to a plurality of operation conditions and calculates and successively accumulates evaluation characteristics; a data analyzer that creates a regression formula representing a relationship between the evaluation characteristic and an operation time by curve fitting, with an appropriate approximation function, the accumulated evaluation characteristic data; and a life prediction formula creator that creates a life prediction formula for calculating a predicted value of the evaluation characteristic under random operation conditions on the basis of the regression formula.Type: GrantFiled: December 10, 2013Date of Patent: December 12, 2017Assignee: Mitsubishi Electric CorporationInventors: Makiko Kise, Shinsuke Miki, Shoji Yoshioka
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Publication number: 20150323611Abstract: A life prediction apparatus for an electrical storage device, which has a life predictor, includes: an operation controller for life prediction that controls operation of the electrical storage device; a data collector that collects measurement data with respect to a plurality of operation conditions and calculates and successively accumulates evaluation characteristics; a data analyzer that creates a regression formula representing a relationship between the evaluation characteristic and an operation time by curve fitting, with an appropriate approximation function, the accumulated evaluation characteristic data; and a life prediction formula creator that creates a life prediction formula for calculating a predicted value of the evaluation characteristic under random operation conditions on the basis of the regression formula.Type: ApplicationFiled: December 10, 2013Publication date: November 12, 2015Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Makiko KISE, Shinsuke MIKI, Shoji YOSHIOKA
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Patent number: 7790625Abstract: A method of manufacturing a semiconductor device includes preparing a semiconductor wafer, forming a semiconductor function element on the semiconductor wafer, drying the semiconductor wafer after forming the semiconductor function element by using an isopropyl alcohol vapor, heating the semiconductor wafer after drying the semiconductor wafer, and performing a cleaning on the semiconductor wafer after heating the semiconductor wafer by using a fuming nitric acid.Type: GrantFiled: March 6, 2008Date of Patent: September 7, 2010Assignee: Oki Semiconductor Co., Ltd.Inventor: Shinsuke Miki
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Patent number: 7652222Abstract: A discharge voltage detecting unit of an electric discharge machine detects a discharge voltage and determines an average discharge voltage in a specified period of time. An optimum machining condition computing unit determines a discharge current that makes an average discharge voltage detected by a discharge voltage detecting unit equal to an average discharge voltage when a new machining liquid is used. The optimum machining condition computing unit determines an optimal discharging time, an optimal non-operating time, and an optimal servo reference voltage from relational equations depending on the determined discharge current. A machining condition data base storing unit stores the discharge current, the discharging time, the non-operating time, and the servo reference voltage. A servo control unit establishes the optimum machining conditions at the time of machining.Type: GrantFiled: January 24, 2005Date of Patent: January 26, 2010Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Shinsuke Miki, Hidetaka Katougi
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Publication number: 20090025478Abstract: The present invention provides an acceleration sensor that improves endurance by avoiding damage to stopper portions. When a downward vibration is applied to a weight member and the weight member displaces downward, a bottom face of the weight member abuts a bottom plate, and the weight member stops and downward displacement is obstructed. Furthermore, when the weight member displaces upward, peripheral weight portions abut stopper portions, and the weight member stops and upward displacement is obstructed. Because displacement of the weight member is obstructed by abutting the stopper portions, if the strength of the stopper portions is low, the stopper portions may be damaged. However, by providing reinforcement portions which reinforce the stopper portions, damage to the stopper portions may be prevented, and endurance of the acceleration sensor is improved.Type: ApplicationFiled: May 20, 2008Publication date: January 29, 2009Applicant: OKI ELECTRIC INDUSTRY CO., LTD.Inventor: Shinsuke Miki
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Publication number: 20080245780Abstract: A discharge voltage detecting unit 7 detects a discharge voltage and determines an average discharge voltage in a specified period of time. An optimum machining condition computing unit 8 determines a discharge current that makes an average discharge voltage detected by the discharge voltage detecting unit equal to an average discharge voltage when a new machining liquid is used and determines discharging time, non-operating time, and a servo reference voltage depending on the determined discharge current from the relational equations with a discharge current, discharging time, non-operating time, and a servo reference voltage that are stored in the machining condition data base storing unit 9 and establish optimum machining conditions and controls a servo 4 and a machining electrode 5 under the optimum machining conditions by a servo control unit 6 at the time of machining.Type: ApplicationFiled: January 24, 2005Publication date: October 9, 2008Applicant: MITSUBISHI DENKI KABUSHIKI KAISHAInventors: Shinsuke Miki, Hidetaka Katougi
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Publication number: 20080227292Abstract: A method of manufacturing a semiconductor device includes preparing a semiconductor wafer, forming a semiconductor function element on the semiconductor wafer, drying the semiconductor wafer after forming the semiconductor function element by using an isopropyl alcohol vapor, heating the semiconductor wafer after drying the semiconductor wafer, and performing an RA cleaning on the semiconductor wafer after heating the semiconductor wafer by using a fuming nitric acid.Type: ApplicationFiled: March 6, 2008Publication date: September 18, 2008Applicant: OKI ELECTRIC INDUSTRY CO., LTD.Inventor: Shinsuke Miki
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Patent number: 6189322Abstract: A refrigerant-circulating system which comprises a refrigeration cycle comprising a refrigerant compressor, a condenser, an expansion mechanism and an evaporator to form a refrigerant circuit and employing a refrigerant which contains no chlorine, wherein an aromatic polyether oil having as a base oil structure a benzene ring having an ether bond is employed as a refrigerator oil.Type: GrantFiled: March 11, 1999Date of Patent: February 20, 2001Assignee: Mitsubishi Denki Kabushiki KaishaInventors: Keisaku Ishihara, Yoshinori Shirafuji, Shin Sekiya, Noboru Masuda, Takeshi Izawa, Hideto Nakao, Makoto Tsukiji, Shinsuke Miki