Patents by Inventor Shinsuke Takeda
Shinsuke Takeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10647452Abstract: An ablator is provided to improve a fuselage protection performance while having flexibility. The ablator includes a base material formed from fiber, granular resin, and binder resin impregnated in the fiber to couple the granular resin and the base material.Type: GrantFiled: April 9, 2015Date of Patent: May 12, 2020Assignees: MITSUBISHI HEAVY INDUSTRIES, LTD., LIGNYTE CO., LTD.Inventors: Aiichiro Tsukahara, Fumihito Takeda, Junko Watanabe, Isamu Ide, Shinsuke Takeda
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Patent number: 10571412Abstract: An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.Type: GrantFiled: August 7, 2014Date of Patent: February 25, 2020Assignee: Nikon CorporationInventors: Toshihisa Tanaka, Shinsuke Takeda, Naoshi Sakaguchi
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Patent number: 10533958Abstract: An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.Type: GrantFiled: August 7, 2014Date of Patent: January 14, 2020Assignee: Nikon CorporationInventors: Toshihisa Tanaka, Shinsuke Takeda, Naoshi Sakaguchi
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Patent number: 10502699Abstract: An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.Type: GrantFiled: August 7, 2014Date of Patent: December 10, 2019Assignee: Nikon CorporationInventors: Toshihisa Tanaka, Shinsuke Takeda, Naoshi Sakaguchi
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Publication number: 20170219499Abstract: An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.Type: ApplicationFiled: August 7, 2014Publication date: August 3, 2017Applicant: NIKON CORPORATIONInventors: Toshihisa TANAKA, Shinsuke TAKEDA, Naoshi SAKAGUCHI
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Publication number: 20170029140Abstract: An ablator is provided to improve a fuselage protection performance while having flexibility. The ablator includes a base material formed from fiber, granular resin, and binder resin impregnated in the fiber to couple the granular resin and the base material.Type: ApplicationFiled: April 9, 2015Publication date: February 2, 2017Inventors: Aiichiro TSUKAHARA, Fumihito TAKEDA, Junko WATANABE, Isamu IDE, Shinsuke TAKEDA
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Patent number: 9322788Abstract: A surface inspection apparatus includes: a detection unit configured to detect a first detection signal according to a first diffracted light beam and a second detection signal according to a second diffracted light beam; a storage unit which is configured to store a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.Type: GrantFiled: October 19, 2015Date of Patent: April 26, 2016Assignee: NIKON CORPORATIONInventors: Kazuhiko Fukazawa, Yoshihiko Fujimori, Shinsuke Takeda
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Publication number: 20160041108Abstract: A surface inspection apparatus includes: a detection unit configured to detect a first detection signal according to a first diffracted light beam and a second detection signal according to a second diffracted light beam; a storage unit which is configured to store a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.Type: ApplicationFiled: October 19, 2015Publication date: February 11, 2016Inventors: Kazuhiko FUKAZAWA, Yoshihiko FUJIMORI, Shinsuke TAKEDA
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Patent number: 9240356Abstract: A surface inspection apparatus includes: an irradiation unit; a detection unit configured to detect a first detection signal according to a first light beam and a second detection signal according to a second light beam; a providing unit which is configured to provide a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.Type: GrantFiled: December 14, 2011Date of Patent: January 19, 2016Assignee: NIKON CORPORATIONInventors: Kazuhiko Fukazawa, Yoshihiko Fujimori, Shinsuke Takeda
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Patent number: 9196550Abstract: A surface inspection apparatus includes: an irradiation unit; a detection unit configured to detect a first detection signal according to a first light beam and a second detection signal according to a second light beam; a providing unit which is configured to provide a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.Type: GrantFiled: December 14, 2011Date of Patent: November 24, 2015Assignee: NIKON CORPORATIONInventors: Kazuhiko Fukazawa, Yoshihiko Fujimori, Shinsuke Takeda
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Publication number: 20140356571Abstract: A composition for a heat insulator, a heat insulator, and a spacecraft equipped with the heat insulator are provided which are able to satisfy a desired level of heat insulation performance while suppressing recession. The composition for a heat insulator comprises a fibrous substance, inorganic foam particles, a thermosetting resin and a foaming agent, wherein the fibrous substance includes at least a first fibrous substance, and a second fibrous substance composed of a material different from the first fibrous substance, the melting point of the first fibrous substance is higher than the melting point of the second fibrous substance, and the thermal conductivity of the second fibrous substance is lower than the thermal conductivity of the first fibrous substance.Type: ApplicationFiled: January 16, 2013Publication date: December 4, 2014Applicant: LIGNYTE CO., LTDInventors: Junko Watanabe, Aiichiro Tsukahara, Masayuki Yamashita, Fumihito Takeda, Hisato Higuchi, Shinsuke Takeda, Nagaharu Hara
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Publication number: 20140037894Abstract: Provided is a composition for a lightweight heat-insulating material having high heat-insulating properties. The composition for a heat-insulating material contains a fibrous material, inorganic foamed particles, a thermosetting resin, and a foaming agent. Since the composition for a heat-insulating material contains the inorganic foamed particles and the foaming agent in addition to the fibrous material and the thermosetting resin, the weight can be reduced and the thermal conductivity can be lowered due to the inorganic foamed particles having low specific gravity. Further, the thermosetting resin is caused to foam by the foaming agent, and the weight can be reduced and the thermal conductivity can be lowered. A lightweight heat-insulating material having high-insulating properties can be obtained.Type: ApplicationFiled: February 23, 2012Publication date: February 6, 2014Applicants: MITSUBISHI HEAVY INDUSTRIES, LTD., LIGNYTE CO., LTD.Inventors: Hisato Higuchi, Shinsuke Takeda, Nagaharu Hara, Tetsuro Ise, Junko Watanabe, Aiichiro Tsukahara, Masayuki Yamashita, Fumihito Takeda
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Publication number: 20120164763Abstract: A surface inspection apparatus includes: an irradiation unit; a detection unit configured to detect a first detection signal according to a first light beam and a second detection signal according to a second light beam; a providing unit which is configured to provide a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.Type: ApplicationFiled: December 14, 2011Publication date: June 28, 2012Inventors: Kazuhiko FUKAZAWA, Yoshihiko Fujimori, Shinsuke Takeda