Patents by Inventor Shinsuke Takeda

Shinsuke Takeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10647452
    Abstract: An ablator is provided to improve a fuselage protection performance while having flexibility. The ablator includes a base material formed from fiber, granular resin, and binder resin impregnated in the fiber to couple the granular resin and the base material.
    Type: Grant
    Filed: April 9, 2015
    Date of Patent: May 12, 2020
    Assignees: MITSUBISHI HEAVY INDUSTRIES, LTD., LIGNYTE CO., LTD.
    Inventors: Aiichiro Tsukahara, Fumihito Takeda, Junko Watanabe, Isamu Ide, Shinsuke Takeda
  • Patent number: 10571412
    Abstract: An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.
    Type: Grant
    Filed: August 7, 2014
    Date of Patent: February 25, 2020
    Assignee: Nikon Corporation
    Inventors: Toshihisa Tanaka, Shinsuke Takeda, Naoshi Sakaguchi
  • Patent number: 10533958
    Abstract: An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.
    Type: Grant
    Filed: August 7, 2014
    Date of Patent: January 14, 2020
    Assignee: Nikon Corporation
    Inventors: Toshihisa Tanaka, Shinsuke Takeda, Naoshi Sakaguchi
  • Patent number: 10502699
    Abstract: An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.
    Type: Grant
    Filed: August 7, 2014
    Date of Patent: December 10, 2019
    Assignee: Nikon Corporation
    Inventors: Toshihisa Tanaka, Shinsuke Takeda, Naoshi Sakaguchi
  • Publication number: 20170219499
    Abstract: An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.
    Type: Application
    Filed: August 7, 2014
    Publication date: August 3, 2017
    Applicant: NIKON CORPORATION
    Inventors: Toshihisa TANAKA, Shinsuke TAKEDA, Naoshi SAKAGUCHI
  • Publication number: 20170029140
    Abstract: An ablator is provided to improve a fuselage protection performance while having flexibility. The ablator includes a base material formed from fiber, granular resin, and binder resin impregnated in the fiber to couple the granular resin and the base material.
    Type: Application
    Filed: April 9, 2015
    Publication date: February 2, 2017
    Inventors: Aiichiro TSUKAHARA, Fumihito TAKEDA, Junko WATANABE, Isamu IDE, Shinsuke TAKEDA
  • Patent number: 9322788
    Abstract: A surface inspection apparatus includes: a detection unit configured to detect a first detection signal according to a first diffracted light beam and a second detection signal according to a second diffracted light beam; a storage unit which is configured to store a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.
    Type: Grant
    Filed: October 19, 2015
    Date of Patent: April 26, 2016
    Assignee: NIKON CORPORATION
    Inventors: Kazuhiko Fukazawa, Yoshihiko Fujimori, Shinsuke Takeda
  • Publication number: 20160041108
    Abstract: A surface inspection apparatus includes: a detection unit configured to detect a first detection signal according to a first diffracted light beam and a second detection signal according to a second diffracted light beam; a storage unit which is configured to store a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.
    Type: Application
    Filed: October 19, 2015
    Publication date: February 11, 2016
    Inventors: Kazuhiko FUKAZAWA, Yoshihiko FUJIMORI, Shinsuke TAKEDA
  • Patent number: 9240356
    Abstract: A surface inspection apparatus includes: an irradiation unit; a detection unit configured to detect a first detection signal according to a first light beam and a second detection signal according to a second light beam; a providing unit which is configured to provide a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.
    Type: Grant
    Filed: December 14, 2011
    Date of Patent: January 19, 2016
    Assignee: NIKON CORPORATION
    Inventors: Kazuhiko Fukazawa, Yoshihiko Fujimori, Shinsuke Takeda
  • Patent number: 9196550
    Abstract: A surface inspection apparatus includes: an irradiation unit; a detection unit configured to detect a first detection signal according to a first light beam and a second detection signal according to a second light beam; a providing unit which is configured to provide a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.
    Type: Grant
    Filed: December 14, 2011
    Date of Patent: November 24, 2015
    Assignee: NIKON CORPORATION
    Inventors: Kazuhiko Fukazawa, Yoshihiko Fujimori, Shinsuke Takeda
  • Publication number: 20140356571
    Abstract: A composition for a heat insulator, a heat insulator, and a spacecraft equipped with the heat insulator are provided which are able to satisfy a desired level of heat insulation performance while suppressing recession. The composition for a heat insulator comprises a fibrous substance, inorganic foam particles, a thermosetting resin and a foaming agent, wherein the fibrous substance includes at least a first fibrous substance, and a second fibrous substance composed of a material different from the first fibrous substance, the melting point of the first fibrous substance is higher than the melting point of the second fibrous substance, and the thermal conductivity of the second fibrous substance is lower than the thermal conductivity of the first fibrous substance.
    Type: Application
    Filed: January 16, 2013
    Publication date: December 4, 2014
    Applicant: LIGNYTE CO., LTD
    Inventors: Junko Watanabe, Aiichiro Tsukahara, Masayuki Yamashita, Fumihito Takeda, Hisato Higuchi, Shinsuke Takeda, Nagaharu Hara
  • Publication number: 20140037894
    Abstract: Provided is a composition for a lightweight heat-insulating material having high heat-insulating properties. The composition for a heat-insulating material contains a fibrous material, inorganic foamed particles, a thermosetting resin, and a foaming agent. Since the composition for a heat-insulating material contains the inorganic foamed particles and the foaming agent in addition to the fibrous material and the thermosetting resin, the weight can be reduced and the thermal conductivity can be lowered due to the inorganic foamed particles having low specific gravity. Further, the thermosetting resin is caused to foam by the foaming agent, and the weight can be reduced and the thermal conductivity can be lowered. A lightweight heat-insulating material having high-insulating properties can be obtained.
    Type: Application
    Filed: February 23, 2012
    Publication date: February 6, 2014
    Applicants: MITSUBISHI HEAVY INDUSTRIES, LTD., LIGNYTE CO., LTD.
    Inventors: Hisato Higuchi, Shinsuke Takeda, Nagaharu Hara, Tetsuro Ise, Junko Watanabe, Aiichiro Tsukahara, Masayuki Yamashita, Fumihito Takeda
  • Publication number: 20120164763
    Abstract: A surface inspection apparatus includes: an irradiation unit; a detection unit configured to detect a first detection signal according to a first light beam and a second detection signal according to a second light beam; a providing unit which is configured to provide a first reference data and a second reference data; and a determination unit which is configured to determine a processing condition of the pattern in the substrate as an inspection object substrate, based on consistency between the first detection signal and the first reference data, and consistency between the second detection signal and the second reference data.
    Type: Application
    Filed: December 14, 2011
    Publication date: June 28, 2012
    Inventors: Kazuhiko FUKAZAWA, Yoshihiko Fujimori, Shinsuke Takeda