Patents by Inventor Shintaro Kumano

Shintaro Kumano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200103883
    Abstract: An indicator detection system includes: a data acquiring unit configured to acquire operation data of a machine and operation history data indicating an operation history of the machine; an estimation unit configured to calculate a first estimated value of a parameter of the machine which is to be monitored on the basis of the operation data, the operation history data and an estimation model for estimating a value of the parameter at a time point corresponding to the operation history data for the parameter; and a state evaluating unit configured to evaluate a state of the machine on the basis of a difference between the first estimated value of the parameter from the estimation unit and a measured value or a second estimated value of the parameter included in the operation data acquired by the data acquiring unit.
    Type: Application
    Filed: March 23, 2018
    Publication date: April 2, 2020
    Applicants: MITSUBISHI HEAVY INDUSTRIES, LTD., Mitsubishi Hitachi Power Systems, Ltd.
    Inventors: Makoto Kishi, Shintaro Kumano, Katsuhiko Abe, Keisuke Yamamoto, Yukihiko Inoue, Shun Niizuma
  • Publication number: 20200034407
    Abstract: In an information processing device according to the present invention, an estimation unit is configured to estimate each of a plurality of estimation values related to a target state quantity by using a plurality of models for explaining a target device. A probability specification unit is configured to specify each of a plurality of probabilities corresponding to the plurality of estimation values on the basis of a probability distribution of values of state quantities related to the target state quantity. A management value specification unit is configured to specify a value to be used for management of the target device on the basis of the plurality of estimation values and the plurality of probabilities.
    Type: Application
    Filed: March 26, 2018
    Publication date: January 30, 2020
    Applicants: MITSUBISHI HEAVY INDUSTRIES, LTD., Mitsubishi Hitachi Power Systems, Ltd.
    Inventors: Shintaro Kumano, Makoto Kishi, Keisuke Yamamoto, Katsuhiko Abe
  • Publication number: 20200029135
    Abstract: An acquisition unit is configured to acquire a measurement value of a first state quantity of a target device. A model determination unit is configured to determine a model for estimating a value of a second state quantity of the target device for each evaluation item for management of the target device. An estimation unit is configured to estimate the value of the second state quantity on the basis of the measurement value using the model determined by the model determination unit. A management unit calculates a value of the evaluation item using the value estimated by the estimation unit.
    Type: Application
    Filed: March 26, 2018
    Publication date: January 23, 2020
    Applicants: MITSUBISHI HEAVY INDUSTRIES, LTD., Mitsubishi Hitachi Power Systems, Ltd.
    Inventors: Shintaro Kumano, Makoto Kishi, Keisuke Yamamoto, Katsuhiko Abe
  • Publication number: 20190264573
    Abstract: An acquisition unit is configured to acquire measurement values of a target device. The measurement values that are acquired include at least a temperature and a flow rate of an input fluid to be input to the target device, and a temperature and a flow rate of an output fluid to be output from the target device. A correction unit is configured to obtain a correction measurement value by which the measurement values are corrected through thermal equilibrium calculations based on the measurement values. A distance calculation unit is configured to calculate a Mahalanobis distance with a factor of the correction measurement value.
    Type: Application
    Filed: May 31, 2017
    Publication date: August 29, 2019
    Inventors: Ichiro NAGANO, Kuniaki AOYAMA, Mayumi SAITO, Shintaro KUMANO, Katsuhiko ABE, Toru TANAKA, Takahiro YAMAUCHI
  • Publication number: 20190187676
    Abstract: An acquisition unit is configured to acquire measurement values of a target device. A likelihood calculation unit is configured to calculate an occurrence likelihood for each of a plurality of phenomena that are liable to occur to the target device based on the measurement values acquired by the acquisition unit. A table storage unit is configured to store a table in which the plurality of phenomena and occurrence causes of abnormalities of the target device are associated to each other. As estimation unit is configured to estimate the occurrence causes based on the occurrence likelihood and the table.
    Type: Application
    Filed: May 31, 2017
    Publication date: June 20, 2019
    Inventors: Ichiro NAGANO, Kuniaki AOYAMA, Mayumi SAITO, Shintaro KUMANO, Katsuhiko ABE, Toru TANAKA, Takahiro YAMAUCHI
  • Publication number: 20190018384
    Abstract: A state quantity acquiring unit is configured to acquire a state quantity of a turbine including a temperature of the turbine. A variable calculation unit is configured to calculate a history variable with respect to a history of the state quantity. A time calculation unit is configured to calculate the operable time at an over firing operation of the turbine based on a history variable corresponding to a design life of the turbine and a calculated history variable.
    Type: Application
    Filed: December 8, 2016
    Publication date: January 17, 2019
    Inventors: Yasuoki TOMITA, Katsuhiko ABE, Shintaro KUMANO, Motoshi TAKASU, Etsushi KANNO, Takahiro KAWAGUCHI, Masao OGINO
  • Publication number: 20190018380
    Abstract: A state quantity acquiring unit is configured to acquire a state quantity of a turbine. A time calculation unit is configured to calculate an operable time at an over firing operation of the turbine based on a design life of the turbine and a state quantity. A distance calculation unit configured to calculate a Mahalanobis distance based on the state quantity. A determination unit configured to determine whether or not the over firing operation of the turbine is possible by the Mahalanobis distance and the operable time.
    Type: Application
    Filed: December 8, 2016
    Publication date: January 17, 2019
    Inventors: Yasuoki TOMITA, Katsuhiko ABE, Shintaro KUMANO, Motoshi TAKASU, Etsushi KANNO, Takahiro KAWAGUCHI, Takayoshi ISODA, Yuki ENOMOTO, Nobuhiro OSAKI, Kazuyuki MISAWA, Akihisa ENDO, Masao OGINO
  • Patent number: 9696718
    Abstract: A method for trouble managing in equipment is provided, with which optimal timing of repairing the equipment and occurrence of malfunction probable to occur concurrently with present malfunction or later stage can be inferred with sufficient accuracy, and which can be adopted for large-scale equipment used in a plant.
    Type: Grant
    Filed: September 9, 2009
    Date of Patent: July 4, 2017
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Nobuhiko Nishimura, Fumitoshi Sakata, Mayumi Saito, Kouji Satake, Shintaro Kumano
  • Patent number: 8109150
    Abstract: The precision of crack-propagation prediction is improved by taking into consideration a variation in the error due to inspectors and inspection methods. There is provided a crack-propagation prediction method including a correlation-information preparing step of measuring the length of a crack initiated in a test object by a plurality of inspectors and/or a plurality of inspection methods and obtaining correlation information between data acquired through the measurement and the condition of an actual crack; a crack-length estimating step of estimating the actual length of the crack initiated in an inspection target on the basis of the crack length measured by an inspector during inspection of the inspection target and the correlation information; and a crack-propagation-curve estimating step of estimating a crack-propagation curve of the inspection target originating from the crack length estimated in the crack-length estimating step.
    Type: Grant
    Filed: July 24, 2008
    Date of Patent: February 7, 2012
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Yoichi Sato, Koichi Morimura, Shinichiro Hori, Shintaro Kumano, Takanori Karato, Masato Kurita
  • Publication number: 20110046995
    Abstract: A method for trouble managing in equipment is provided, with which optimal timing of repairing the equipment and occurrence of malfunction probable to occur concurrently with present malfunction or later stage can be inferred with sufficient accuracy, and which can be adopted for large-scale equipment used in a plant.
    Type: Application
    Filed: September 9, 2009
    Publication date: February 24, 2011
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Nobuhiko Nishimura, Fumitoshi Sakata, Mayumi Saito, Kouji Satake, Shintaro Kumano
  • Publication number: 20100116062
    Abstract: The precision of crack-propagation prediction is improved by taking into consideration a variation in the error due to inspectors and inspection methods. There is provided a crack-propagation prediction method including a correlation-information preparing step of measuring the length of a crack initiated in a test object by a plurality of inspectors and/or a plurality of inspection methods and obtaining correlation information between data acquired through the measurement and the condition of an actual crack; a crack-length estimating step of estimating the actual length of the crack initiated in an inspection target on the basis of the crack length measured by an inspector during inspection of the inspection target and the correlation information; and a crack-propagation-curve estimating step of estimating a crack-propagation curve of the inspection target originating from the crack length estimated in the crack-length estimating step.
    Type: Application
    Filed: July 24, 2008
    Publication date: May 13, 2010
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Yoichi Sato, Koichi Morimura, Shinichiro Hori, Shintaro Kumano, Takanori Karato, Masato Kurita
  • Patent number: 6993178
    Abstract: A lifetime evaluating system includes a digitalizing unit, an acquiring unit and a determining unit. The digitalizing unit digitizes an original metallographic image of a mechanical element to form a digital image. The acquiring unit acquires a plurality of labels from the digital image. Here, each of the plurality of labels is a set of pixels with a predetermined property. The determining unit classifies the plurality of labels into a class of voids and a class of non-voids based on evaluation data. A lifetime of the mechanical element is determined based on a number of labels in the void class and a size of each of the labels in the void class.
    Type: Grant
    Filed: April 5, 2002
    Date of Patent: January 31, 2006
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Masashi Ozaki, Nobuhiko Nishimura, Nobuya Yoshimoto, Shintaro Kumano, Naoto Kawase
  • Publication number: 20050010460
    Abstract: In an aspect of the present invention, a facilities control system includes a simulation section which carries out a simulation of a time change of a status of an object of a target based on a status data showing the target status in the facilities by using a facilities model; and a display section which displays a simulation result. The facilities model includes a plurality of nodes, in each of which a process is carried out the target based on a first condition, which is set to the node to determine a throughput of the process in the node. A plurality of links, each of which connects between two of the plurality of nodes, and in each of which a process is carried out the target based on a second condition, which is set to the link to determine a throughput of the process in the link.
    Type: Application
    Filed: August 10, 2004
    Publication date: January 13, 2005
    Inventors: Masanobu Mizoguchi, Shintaro Kumano
  • Publication number: 20020146162
    Abstract: A lifetime evaluating system includes a digitalizing unit, an acquiring unit and a determining unit. The digitalizing unit digitizes an original metallographic image of a mechanical element to form a digital image. The acquiring unit acquires a plurality of labels from the digital image. Here, each of the plurality of labels is a set of pixels with a predetermined property. The determining unit classifies the plurality of labels into a class of voids and a class of non-voids based on evaluation data. A lifetime of the mechanical element is determined based on a number of labels in the void class and a size of each of the labels in the void class.
    Type: Application
    Filed: April 5, 2002
    Publication date: October 10, 2002
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Masashi Ozaki, Nobuhiko Nishimura, Nobuya Yoshimoto, Shintaro Kumano, Naoto Kawase
  • Patent number: 6370485
    Abstract: A signal processing apparatus includes a 2-dimensional conversion processing section, a 2-dimensional emphasis and attenuation processing section and a 2-dimensional smoothing processing section. The 2-dimensional conversion processing section maps an observation signal in a first coordinate system onto a second coordinate system to output a 2-dimensional converted signal. The observation signal includes a detection object component and a noise component to be attenuated. The noise component is composed of a first noise component and a second noise component. The 2-dimensional emphasis and attenuation processing section attenuates the first noise component to emphasize the detection object component and outputs a 2-dimensional filtered signal in which the detection object component is emphasized.
    Type: Grant
    Filed: August 4, 1999
    Date of Patent: April 9, 2002
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Kayoko Kawata, Shintaro Kumano, Mitsuyoshi Matsumoto
  • Patent number: 5761953
    Abstract: The main object of the present invention is to permit the non-destructive examination of the embrittlement of two-phase stainless steel. There remains anxiety about the reliability of methods based on conventional formulae because an actual machine is not examined to confirm its degree of embrittlement, and its Charpy impact absorption energy at room temperature cannot be estimated accurately.
    Type: Grant
    Filed: October 4, 1996
    Date of Patent: June 9, 1998
    Assignee: Mitsubishi Jukogyo Kabushiki Kaisha
    Inventors: Toru Goto, Takeshi Naito, Shintaro Kumano