Patents by Inventor Shintaro Tamura

Shintaro Tamura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240122309
    Abstract: Stop member for slide fastener includes: a main body having first and second surfaces; a first superficial region formed at a side of the first surface of the main body; and a slit or interface interposed between the first and second surfaces of the main body. The first superficial region extends over and covers the slit or interface, and has a thickness defined between the first surface and an end of the slit or interface at the side of the first surface.
    Type: Application
    Filed: March 11, 2021
    Publication date: April 18, 2024
    Inventors: Tiantian Feng, Kazuo Tamura, Shintaro Metani, Atsushi Takata
  • Patent number: 9466323
    Abstract: A method for moving magnetic heads in a magnetic recording/reproducing apparatus, which comprises the steps of writing high-frequency signals in the magnetic recording/reproducing tracks; and then, either (i) conducting DC erasing or AC erasing to inspect extra pulse signals reproduced from the erased tracks, or (ii) inspecting concurrently occurring signals of missing pulse and spike pulse, which are reproduced from the written signals, whereby minute protrusions on a surface of the tracks were detected. Reading and writing of information are conducted while the magnetic heads are moved in a manner controlled so that reading and writing of information in specific tracks having defects is avoided. This method enhances reliability and life of the magnetic recording/reproducing apparatus.
    Type: Grant
    Filed: June 8, 2011
    Date of Patent: October 11, 2016
    Assignee: SHOWA DENKO K.K.
    Inventors: Jun Fujii, Shintaro Tamura
  • Patent number: 8547547
    Abstract: The present invention is to provide an optical surface defect inspection apparatus or an optical surface defect inspection method that can improve a signal-to-noise ratio according to a multi-segmented cell method without performing autofocus operations, and can implement highly sensitive inspection. The present invention is an optical surface defect inspection apparatus or an optical surface defect inspection method in which an inspection beam is applied onto a test subject, an image of a scattered light from the surface of the test subject is formed on a photo-detector, and a defect on the surface of the test subject is inspected based on an output from the photo-detector. The photo-detector has an optical fiber bundle. One end thereof forms a circular light receiving surface to receive the scattered light. The other end thereof is connected to a plurality of light receiving devices.
    Type: Grant
    Filed: August 19, 2011
    Date of Patent: October 1, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Shintaro Tamura, Masanori Fukawa, Ayumu Ishihara, Kenichi Shitara, Hiroshi Nakajima
  • Publication number: 20120075625
    Abstract: The present invention is to provide an optical surface defect inspection apparatus or an optical surface defect inspection method that can improve a signal-to-noise ratio according to a multi-segmented cell method without performing autofocus operations, and can implement highly sensitive inspection. The present invention is an optical surface defect inspection apparatus or an optical surface defect inspection method in which an inspection beam is applied onto a test subject, an image of a scattered light from the surface of the test subject is formed on a photo-detector, and a defect on the surface of the test subject is inspected based on an output from the photo-detector. The photo-detector has an optical fiber bundle. One end thereof forms a circular light receiving surface to receive the scattered light. The other end thereof is connected to a plurality of light receiving devices.
    Type: Application
    Filed: August 19, 2011
    Publication date: March 29, 2012
    Inventors: Shintaro TAMURA, Masanori Fukawa, Ayumu Ishihara, Kenichi Shitara, Hiroshi Nakajima
  • Publication number: 20110310508
    Abstract: A method for moving magnetic heads in a magnetic recording/reproducing apparatus, which comprises the steps of writing high-frequency signals in the magnetic recording/reproducing tracks; and then, either (i) conducting DC erasing or AC erasing to inspect extra pulse signals reproduced from the erased tracks, or (ii) inspecting concurrently occurring signals of missing pulse and spike pulse, which are reproduced from the written signals, whereby minute protrusions on a surface of the tracks were detected. Reading and writing of information are conducted while the magnetic heads are moved in a manner controlled so that reading and writing of information in specific tracks having defects is avoided. This method enhances reliability and life of the magnetic recording/reproducing apparatus.
    Type: Application
    Filed: June 8, 2011
    Publication date: December 22, 2011
    Applicant: SHOWA DENKO K.K.
    Inventors: Jun Fujii, Shintaro Tamura