Patents by Inventor Shinya Kishigami

Shinya Kishigami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing methods of a semiconductor integrated incorporating a high-frequency receiving circuit and a demodulation circuit
    Patent number: 7693223
    Abstract: A semiconductor integrated circuit that can be tested in a reduced test time includes a high-frequency receiving circuit for receiving a high-frequency signal, and a demodulation circuit for demodulating a signal received from the high-frequency receiving circuit. The demodulation circuit includes a Static Random Access Memory (SRAM), an SRAM control circuit, and a test data transmitting circuit. The SRAM control circuit receives, from a semiconductor test device, test data for driving and testing the high-frequency receiving circuit, and writes the test data into the SRAM. The test data transmitting circuit reads out from the SRAM test data for driving and testing the high-frequency receiving circuit, and transmits the test data to the high-frequency receiving circuit.
    Type: Grant
    Filed: November 16, 2006
    Date of Patent: April 6, 2010
    Assignee: Sharp Kabushiki Kaisha
    Inventor: Shinya Kishigami
  • Semiconductor integrated circuits and test methods thereof
    Publication number: 20070115735
    Abstract: A semiconductor integrated circuit that can be tested in a reduced test time includes a high-frequency receiving circuit for receiving a high-frequency signal, and a demodulation circuit for demodulating a signal received from the high-frequency receiving circuit. The demodulation circuit includes an SRAM, an SRAM control circuit, and a test data transmitting circuit. The SRAM control circuit receives, from a semiconductor test device, test data for driving and testing the high-frequency receiving circuit, and writes the test data into the SRAM. The test data transmitting circuit reads out from the SRAM test data for driving and testing the high-frequency receiving circuit, and transmits the test data to the high-frequency receiving circuit.
    Type: Application
    Filed: November 16, 2006
    Publication date: May 24, 2007
    Inventor: Shinya Kishigami