Patents by Inventor Shinya Ogiwara

Shinya Ogiwara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sample data reliability evaluation method and sample data reliability evaluation apparatus
    Patent number: 8024155
    Abstract: A sample data reliability evaluation method includes a first calculating step of calculating a representative distance between samples of a same cluster, which is a representative distance between the sample and the sample belonging to the same cluster to that to which the sample belongs, a second calculating step of calculating a representative distance between samples of different clusters, which is a representative distance between the sample and the sample belonging to the different cluster from that to which the sample belongs, a third calculating step of calculating a reliability evaluation index, which is an index for evaluating reliability of the sample data based on the representative distance between samples of the same cluster and the representative distance between samples of different clusters, and an evaluating step of evaluating the reliability of a subset of the sample data set or the whole sample data set.
    Type: Grant
    Filed: March 13, 2009
    Date of Patent: September 20, 2011
    Assignee: Olympus Corporation
    Inventors: Shinya Ogiwara, Tetsuya Tanabe
  • SAMPLE DATA RELIABILITY EVALUATION METHOD AND SAMPLE DATA RELIABILITY EVALUATION APPARATUS
    Publication number: 20090187376
    Abstract: A sample data reliability evaluation method includes a first calculating step of calculating a representative distance between samples of a same cluster, which is a representative distance between the sample and the sample belonging to the same cluster to that to which the sample belongs, a second calculating step of calculating a representative distance between samples of different clusters, which is a representative distance between the sample and the sample belonging to the different cluster from that to which the sample belongs, a third calculating step of calculating a reliability evaluation index, which is an index for evaluating reliability of the sample data based on the representative distance between samples of the same cluster and the representative distance between samples of different clusters, and an evaluating step of evaluating the reliability of a subset of the sample data set or the whole sample data set.
    Type: Application
    Filed: March 13, 2009
    Publication date: July 23, 2009
    Applicant: OLYMPUS CORPORATION
    Inventors: Shinya OGIWARA, Tetsuya TANABE