Patents by Inventor Shinya Yuda

Shinya Yuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10235658
    Abstract: The maintenance management device 3 includes an error status diagnosis unit 11, a grace period estimation unit 14, a maintenance cost estimation unit 15, and a screen display unit 17. When the error status diagnosis unit 11 has diagnosed the occurrence of an anomaly, the grace period estimation unit 14 estimates a first grace period leading up to the occurrence of a failure. The maintenance cost estimation unit 15 estimates the cost of corrective maintenance incurred when the failure occurs after the elapse of the first grace period. The screen display unit 17 displays a combination of the first grace period and the cost of corrective maintenance. Alternatively, the grace period estimation unit 14 estimates a second grace period over which preventive maintenance may be postponed without a failure.
    Type: Grant
    Filed: July 10, 2013
    Date of Patent: March 19, 2019
    Assignee: Hitachi Construction Machinery Co., Ltd.
    Inventors: Hideaki Suzuki, Kozo Nakamura, Shinya Yuda, Munetoshi Unuma, Junsuke Fujiwara, Takayuki Uchida, Katsuaki Tanaka, Mitsuo Aihara, Teruo Nakamura, Nobuyoshi Hirowatari, Hiroshi Ogura
  • Patent number: 10234360
    Abstract: A degradation cause estimation device is provided with a degradation detector for detecting the amount of degradation undergone by a device, a state observation device for detecting observation values for internal portions, values observed from outside, or device control and operation information, a degradation section detector for detecting a section undergoing degradation using the output values of the degradation detector, and a cause estimator for estimating the cause of the degradation using the device state observations for the degradation section, and outputs the cause for the degradation section.
    Type: Grant
    Filed: July 30, 2014
    Date of Patent: March 19, 2019
    Assignee: HITACHI, LTD.
    Inventors: Munetoshi Unuma, Takashi Saeki, Shinya Yuda
  • Patent number: 10204321
    Abstract: The device for searching for similar breakdown cases according to the present invention includes: a first means that detects a signal abnormality from a repair target machine, calculates the correlations between the signal abnormality and past abnormality cases by means of quantification, and regards the past abnormality cases as similar abnormality cases; a second means that obtains the component repair histories of the repair target machine in the similar abnormality cases by means of quantification; and a third means that, in accordance with the quantified correlations and the quantified component repair histories, determines and provides the priority levels of the plural past similar abnormality cases.
    Type: Grant
    Filed: July 11, 2012
    Date of Patent: February 12, 2019
    Assignee: Hitachi, Ltd.
    Inventors: Takayuki Uchida, Hideaki Suzuki, Junsuke Fujiwara, Shinya Yuda
  • Patent number: 10098215
    Abstract: A learning unit in learning mode generates a cluster from a cluster analysis of data formed from frequency constituent data and state data, obtained from a sensor unit. An abnormality calculation unit computes, as abnormalities, the minimum values among distances to surfaces of the clusters of the data formed from the frequency constituent data and the state data, obtained when in predictive fault indicator sensing mode. A predictive fault indicator determination unit determines a predictive fault indicator of an X-ray tube by comparing the abnormalities with a predetermined threshold.
    Type: Grant
    Filed: April 27, 2015
    Date of Patent: October 9, 2018
    Assignee: Hitachi, Ltd.
    Inventors: Takashi Nakahara, Shinya Yuda, Takanori Aono, Tetsu Inahara, Yoshitaka Seki, Kouji Akita, Kiyomi Abe
  • Patent number: 9810743
    Abstract: Provided is a deterioration diagnosis system which diagnoses deterioration of an N-phase rotational machine (N denotes a natural number). The deterioration diagnosis system includes a first current sensor to be attached individually to at least lead wires of (N-1)-phases in a rotational machine, the first current sensor being able to detect a current amplitude arising from a plurality of deterioration causes, and a second current sensor to be attached collectively to the lead wires of all phases in the rotational machine, the second current sensor being able to detect a current amplitude arising from a plurality of deterioration causes.
    Type: Grant
    Filed: May 8, 2015
    Date of Patent: November 7, 2017
    Assignee: Hitachi, Ltd.
    Inventors: Kohji Maki, Shinya Yuda, Hiroaki Kojima, Satoshi Kikuchi, Hisashi Endo
  • Publication number: 20170212012
    Abstract: A degradation cause estimation device is provided with a degradation detector for detecting the amount of degradation undergone by a device, a state observation device for detecting observation values for internal portions, values observed from outside, or device control and operation information, a degradation section detector for detecting a section undergoing degradation using the output values of the degradation detector, and a cause estimator for estimating the cause of the degradation using the device state observations for the degradation section, and outputs the cause for the degradation section.
    Type: Application
    Filed: July 30, 2014
    Publication date: July 27, 2017
    Applicant: HITACHI, LTD.
    Inventors: Munetoshi UNUMA, Takashi SAEKI, Shinya YUDA
  • Publication number: 20170188443
    Abstract: A learning unit in learning mode generates a cluster from a cluster analysis of data formed from frequency constituent data and state data, obtained from a sensor unit. An abnormality calculation unit computes, as abnormalities, the minimum values among distances to surfaces of the clusters of the data formed from the frequency constituent data and the state data, obtained when in predictive fault indicator sensing mode. A predictive fault indicator determination unit determines a predictive fault indicator of an X-ray tube by comparing the abnormalities with a predetermined threshold.
    Type: Application
    Filed: April 27, 2015
    Publication date: June 29, 2017
    Inventors: Takashi NAKAHARA, Shinya YUDA, Takanori AONO, Tetsu INAHARA, Yoshitaka SEKI, Kouji AKITA, Kiyomi ABE
  • Patent number: 9678845
    Abstract: An object of the present invention is to provide an abnormality diagnostic system that can enhance diagnostic precision even if a computer arranged on the machine side does not have sufficient throughput in diagnosing a condition of a machine or equipment based upon time series data generated by a sensor and can reduce communication capacity because communication data volume decreases and industrial machinery provided with the abnormality diagnostic system. A diagnostic device on the machine side 2 diagnoses time series data generated by a sensor, acquires a primary diagnostic result, extracts time series data related to the primary diagnostic result and outputs it to a diagnostic device on the server side 3 together with the primary diagnostic result, the diagnostic device on the server side 3 diagnoses the time series data, acquires a secondary diagnostic result, and displays the secondary diagnostic result together with the primary diagnostic result.
    Type: Grant
    Filed: October 20, 2011
    Date of Patent: June 13, 2017
    Assignee: HITACHI, LTD.
    Inventors: Hideaki Suzuki, Kozo Nakamura, Shinya Yuda, Hiroki Uchiyama
  • Publication number: 20170131707
    Abstract: In the conventional technique, network performances of a machine and a server become different due to the diagnosis target machine when a fault symptom diagnosis function is provided to a plurality of different diagnosis target machines. Therefore, the plurality of different machines are not able to be handled using one system. The present invention is a fault symptom diagnosis system including: a diagnosis execution unit; an arrangement unit; a diagnosis target machine; a diagnosis server; and a network, wherein the diagnosis execution unit includes processing modules of a sensor input processing, a preprocessing, a diagnosis processing, and a postprocessing, and a common interface that connects the processing modules, and wherein the arrangement unit arranges and executes the processing modules in the diagnosis target machine or the diagnosis server.
    Type: Application
    Filed: February 12, 2015
    Publication date: May 11, 2017
    Inventors: Shigetoshi SAKIMURA, Takayuki UCHIDA, Shinya YUDA, Takahiro FUJISHIRO, Kazuyuki TAKADO
  • Publication number: 20160320262
    Abstract: An objective of the present invention is to associate condition information, such as (a) a location in a movement section at which fatigue occurred, (b) a type of work or operation during which fatigue occurred, and (c) a type of natural phenomenon experienced when fatigue occurred, with machine fatigue occurring when a machine is moved or placed in a work environment, natural environment, or other condition and to visualize and display the machine fatigue. To achieve this objective, this device for displaying the material fatigue of a machine is characterized by being provided with a means for observing stress variation in a time series using a sensor correlated with the stress variation or stress of a machine, a means for detecting stress variation in a single cycle, and a means for detecting the time when the stress variation occurred, and by outputting or displaying the stress variation value and time of occurrence.
    Type: Application
    Filed: March 3, 2014
    Publication date: November 3, 2016
    Inventors: Munetoshi UNUMA, Shinya YUDA, Takashi SAEKI, Hideaki SUZUKI
  • Publication number: 20160239552
    Abstract: Times in association with a portion of data designated by an input device from a graph indicating distribution of data of a certain item are divided into plural groups based on the respective time intervals, data relating to desired items included in time ranges respectively regulated by the plural groups are searched from a storage device, and time waveforms of data relating to the desired items are created for each of the groups based on the search results. With this configuration, around the time of generating a portion of data included in a set of data relating to a certain item, aspects of temporal changes of data of a certain item or other items can be easily recognized.
    Type: Application
    Filed: October 29, 2014
    Publication date: August 18, 2016
    Inventors: Takayuki UCHIDA, Tomoaki HIRUTA, Shigetoshi SAKIMURA, Shinya YUDA, Takahiro FUJISHIRO
  • Publication number: 20160217398
    Abstract: An analysis device for time series data from an apparatus to be diagnosed according to the present invention is characterized by being provided with an accumulation device which accumulates sensor data, operation data, or control data, obtained from the apparatus to be diagnosed, while accumulating time information, an algorithm accumulation unit which accumulates algorithms for recognizing behavior of the apparatus to be diagnosed, a behavior recognition unit which recognizes behavior of the apparatus to be diagnosed by use a recognition algorithm, and a specification unit which specifies a behavioral item to be recognized, wherein: a behavior recognition algorithm corresponding to the specified behavioral item to be recognized is selected from the algorithm accumulation unit; sensor data, operation data, or control data to be used by the behavior recognition algorithm is selected from the accumulation device; the start and end times of a selected behavior are recognized by the behavior recognition unit; and
    Type: Application
    Filed: September 11, 2013
    Publication date: July 28, 2016
    Inventors: Munetoshi UNUMA, Hideaki SUZUKI, Tomoaki HIRUTA, Junsuke FUJIWARA, Takayuki UCHIDA, Shinya YUDA
  • Patent number: 9292011
    Abstract: A hydraulic shovel includes: a storage unit which stores an operation history of a target component of the shovel targeted for life span estimation, a discrimination threshold value used for classifying usage of the target component into a plurality of usage modes based on the operation history, and a usage mode-specific estimated life span indicative of an estimated life span of the target component in each of the usage modes; and an arithmetic and control unit which calculates an operating time of the target component in each of the usage modes in accordance with the operation history and the discrimination threshold value, and estimates the life span of the target component based on the operating time calculated for each of the usage modes and on the usage mode-specific estimated life span.
    Type: Grant
    Filed: April 24, 2012
    Date of Patent: March 22, 2016
    Assignee: HITACHI CONSTRUCTION MACHINERY CO., LTD.
    Inventors: Hideaki Suzuki, Kozo Nakamura, Shinya Yuda, Hiroki Uchiyama, Takashi Saeki, Kesaaki Minemura, Jyunsuke Fujiwara
  • Publication number: 20150331051
    Abstract: Provided is a deterioration diagnosis system which diagnoses deterioration of an N-phase rotational machine (N denotes a natural number). The deterioration diagnosis system includes a first current sensor to be attached individually to at least lead wires of (N-1)-phases in a rotational machine, the first current sensor being able to detect a current amplitude arising from a plurality of deterioration causes, and a second current sensor to be attached collectively to the lead wires of all phases in the rotational machine, the second current sensor being able to detect a current amplitude arising from a plurality of deterioration causes.
    Type: Application
    Filed: May 8, 2015
    Publication date: November 19, 2015
    Inventors: Kohji MAKI, Shinya YUDA, Hiroaki KOJIMA, Satoshi KIKUCHI, Hisashi ENDO
  • Patent number: 9122273
    Abstract: The invention is related to a system and a method to determine whether a target equipment deviates from a normal state. If it is determined that the target equipment to be diagnosed deviates from the normal state, the degree of deviation of each parameter from the normal state as the reference is calculated as an abnormal contribution ratio. A failure cause is estimated from a similarity ratio between the calculated abnormal contribution ratio and the abnormal contribution ratio of each of the failure causes collected in the past and including failure phenomena and failure parts.
    Type: Grant
    Filed: February 26, 2010
    Date of Patent: September 1, 2015
    Assignee: HITACHI, LTD.
    Inventors: Hiroki Uchiyama, Shinya Yuda, Hideaki Suzuki, Kozo Nakamura
  • Publication number: 20150206104
    Abstract: The maintenance management device 3 includes an error status diagnosis unit 11, a grace period estimation unit 14, a maintenance cost estimation unit 15, and a screen display unit 17. When the error status diagnosis unit 11 has diagnosed the occurrence of an anomaly, the grace period estimation unit 14 estimates a first grace period leading up to the occurrence of a failure. The maintenance cost estimation unit 15 estimates the cost of corrective maintenance incurred when the failure occurs after the elapse of the first grace period. The screen display unit 17 displays a combination of the first grace period and the cost of corrective maintenance. Alternatively, the grace period estimation unit 14 estimates a second grace period over which preventive maintenance may be postponed without a failure.
    Type: Application
    Filed: July 10, 2013
    Publication date: July 23, 2015
    Inventors: Hideaki Suzuki, Kozo Nakamura, Shinya Yuda, Munetoshi Unuma, Junsuke Fujiwara, Takayuki Uchida, Katsuaki Tanaka, Mitsuo Aihara, Teruo Nakamura, Nobuyoshi Hirowatari, Hiroshi Ogura
  • Patent number: 9074348
    Abstract: A learning diagnostic system for a working machine is capable of making a fault diagnosis of the working machine universally relative to various types of sensor information, and preventing a failure in the working machine by enabling a fault diagnosis even in a transient operating state that represents a transitional state between operating states. A state learning device 201 sorts inputted sensor data 101a into one under a steady operating state and one under a transient operating state, and generates, through learning, steady state data 102a and intermediate state data 103a, each including a permissible error. A state diagnostic device 202 uses the steady state data 102a to determine whether an operating state of the working machine related to the inputted sensor data is the steady operating state or the transient operating state, and make a fault determination in the steady operating state.
    Type: Grant
    Filed: February 19, 2010
    Date of Patent: July 7, 2015
    Assignee: HITACHI CONSTRUCTION MACHINERY CO., LTD.
    Inventors: Hideaki Suzuki, Yoshinori Furuno, Kenji Araki, Kozo Nakamura, Shinya Yuda, Hirotaka Takahashi
  • Publication number: 20150161573
    Abstract: The device for searching for similar breakdown cases according to the present invention includes: a first means that detects a signal abnormality from a repair target machine, calculates the correlations between the signal abnormality and past abnormality cases by means of quantification, and regards the past abnormality cases as similar abnormality cases; a second means that obtains the component repair histories of the repair target machine in the similar abnormality cases by means of quantification; and a third means that, in accordance with the quantified correlations and the quantified component repair histories, determines and provides the priority levels of the plural past similar abnormality cases.
    Type: Application
    Filed: July 11, 2012
    Publication date: June 11, 2015
    Applicant: Hitachi, Ltd.
    Inventors: Takayuki Uchida, Hideaki Suzuki, Junsuke Fujiwara, Shinya Yuda
  • Patent number: 9020942
    Abstract: A maintenance operation instance collection apparatus includes: a storage unit that includes a maintenance operation instance database in which operation information obtained from a device via a sensor and maintenance information on a measure to deal with the operation information corresponding thereto are stored in association with each other; and a control unit that receives an input of new operation information, receives an input of new maintenance information, searches the maintenance operation instance database using the newly-received maintenance information as a search key, acquires searched operation information, compares the newly-received operation information to the acquired operation information, determines whether or not the newly-received operation information is close to the acquired operation information in such a degree of satisfying a prescribed criterion, and, if the newly-received operation information is not determined to be close to the acquired operation information, prompts a re-input
    Type: Grant
    Filed: June 8, 2010
    Date of Patent: April 28, 2015
    Assignee: Hitachi, Ltd.
    Inventors: Hiroki Uchiyama, Shinya Yuda, Kozo Nakamura
  • Patent number: 8838324
    Abstract: Monitoring and diagnosing device including: a classification information storage section; frequency information storage section: a first data classifier section reading out reference classification information from the classification information storage section, comparing operational data, detected by a plurality of sensors and inputted in time sequence, with the reference classification information to classify the operational data, and then generating operational data classification information; a frequency comparator section compiling the operational data classification information, generating operational data frequency information by adding, to the operational data classification information, appearance frequency information for each classification of operational data, reading out reference frequency information from the frequency information storage section, and then generating operational data frequency comparison information by comparing operational data frequency information with the reference frequenc
    Type: Grant
    Filed: January 28, 2010
    Date of Patent: September 16, 2014
    Assignee: Hitachi Construction Machinery Co., Ltd.
    Inventors: Hideaki Suzuki, Yoshinori Furuno, Kozo Nakamura, Shinya Yuda, Hiroki Uchiyama