Abstract: A method for calibrating at least one analytic device with repeated hardware components is disclosed and comprises providing at least one calibrator sample i having a known target value of a concentration of at least one analyte; at least one measuring step, wherein the measuring step comprises conducting at least one measurement on the calibrator sample using the analytic device, wherein at least one detector signal sijk is acquired; at least one calibration step, wherein a relationship between the detector signal and the concentration of the analyte and/or between the detector signal and a theoretical signal value is determined, wherein the calibration step comprises providing at least one parametrized function; determining calibration values by conducting a calibration based on the parametrized function; and determining an analysis function on basis of an inverse of the parametrized function and the determined calibration values.

Abstract: A method for calibrating at least one mass spectrometry device having a first defined hardware configuration comprises at least one manufacturer-site pre-calibration step establishing at least one reference calibration function fp for a generic type of mass spectrometry devices having a second defined hardware configuration, wherein the second defined hardware configuration is equivalent to the first defined hardware configuration, wherein the reference calibration function fp describes a relationship of at least one concentration c of at least one analyte in at least one calibrator sample, wherein the reference calibration function fp is a parametrized function fp(concentration), with p=(p1,p2, . . . pn) being a set of parameters of the reference calibration function and n being a positive integer; determining calibration values {circumflex over (p)}=({circumflex over (p)}1,{circumflex over (p)}2, . . .