Patents by Inventor Shiro Nozaki

Shiro Nozaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card cassette and probe card
    Patent number: 8040147
    Abstract: A holding section (2) holds a probe card (1). Transport mechanisms (3a to 3d) have the function of transporting the probe card (1) from the holding section (2). A lock mechanism (4) is provided for the transport mechanism (3d). When the probe card cassette is placed in prober equipment, the lock mechanism (4) is released to allow the probe card (1) to be transported from the holding section (2) by the transport mechanisms (3a to 3d). When the probe card cassette is not placed in the prober equipment, the lock mechanism (4) operates to fix the probe card (1) in the holding section (2).
    Type: Grant
    Filed: September 9, 2010
    Date of Patent: October 18, 2011
    Assignee: Panasonic Corporation
    Inventors: Shiro Nozaki, Takashi Ohtori, Kenichi Tsunogaki
  • PROBE CARD CASSETTE AND PROBE CARD
    Publication number: 20110006798
    Abstract: A holding section (2) holds a probe card (1). Transport mechanisms (3a to 3d) have the function of transporting the probe card (1) from the holding section (2). A lock mechanism (4) is provided for the transport mechanism (3d). When the probe card cassette is placed in prober equipment, the lock mechanism (4) is released to allow the probe card (1) to be transported from the holding section (2) by the transport mechanisms (3a to 3d). When the probe card cassette is not placed in the prober equipment, the lock mechanism (4) operates to fix the probe card (1) in the holding section (2).
    Type: Application
    Filed: September 9, 2010
    Publication date: January 13, 2011
    Applicant: PANASONIC CORPORATION
    Inventors: Shiro NOZAKI, Takashi Ohtori, Kenichi Tsunogaki
  • PROBE CARD CASSETTE AND PROBE CARD
    Publication number: 20100013508
    Abstract: A holding section (2) holds a probe card (1). Transport mechanisms (3a to 3d) have the function of transporting the probe card (1) from the holding section (2). A lock mechanism (4) is provided for the transport mechanism (3d). When the probe card cassette is placed in prober equipment, the lock mechanism (4) is released to allow the probe card (1) to be transported from the holding section (2) by the transport mechanisms (3a to 3d). When the probe card cassette is not placed in the prober equipment, the lock mechanism (4) operates to fix the probe card (1) in the holding section (2).
    Type: Application
    Filed: July 23, 2007
    Publication date: January 21, 2010
    Inventors: Shiro Nozaki, Takashi Ohtori, Kenichi Tsunogaki
  • Lsi inspection method and apparatus, and ls1 tester
    Publication number: 20040133834
    Abstract: A test of an LSI device under test (20) including a physical layer section (21) which has a high-speed interface function is performed. An LSI device test unit (1) including a reference LSI device (10) which has already been confirmed as being non-defective is placed on a test board (2), and high-speed pins of the LSI devices (10, 20) are connected to each other. An LSI tester (3) accesses logical layer sections (12, 22) at a low speed to control a high-speed communication between physical layer sections (11, 21) and read received data, and determines whether or not the LSI device under test (20) is defective.
    Type: Application
    Filed: October 21, 2003
    Publication date: July 8, 2004
    Inventors: Tomohiko Kanemitsu, Wataru Ito, Akihiko Watanabe, Shiro Nozaki, Tomomitsu Masuda