Abstract: A MOS IC includes a MOS logic cell that includes first and second sets of transistor logic in first and second subcells, respectively. The first and second sets of transistor logic are functionally isolated from each other. The MOS logic cell includes a first set of Mx layer interconnects on an Mx layer extending in a first direction over the first and second subcells. A first subset of the first set of Mx layer interconnects is coupled to inputs/outputs of the first set of transistor logic in the first subcell and is unconnected to the second set of transistor logic. Each of the first subset of the first set of Mx layer interconnects extends from the corresponding input/output of the first set of transistor logic of the first subcell to the second subcell, and is the corresponding input/output of the first set of transistor logic.

Abstract: A MOS IC includes a MOS logic cell that includes first and second sets of transistor logic in first and second subcells, respectively. The first and second sets of transistor logic are functionally isolated from each other. The MOS logic cell includes a first set of Mx layer interconnects on an Mx layer extending in a first direction over the first and second subcells. A first subset of the first set of Mx layer interconnects is coupled to inputs/outputs of the first set of transistor logic in the first subcell and is unconnected to the second set of transistor logic. Each of the first subset of the first set of Mx layer interconnects extends from the corresponding input/output of the first set of transistor logic of the first subcell to the second subcell, and is the corresponding input/output of the first set of transistor logic.

Abstract: A method includes providing a semiconductor interconnect implementation tool, and designing, using any one, a combination or all of the self-aligned double-patterning-friendly rule(s) described herein and in conjunction with the semiconductor interconnect implementation tool, at least two routing layers, each routing layer having routing lines, the routing lines including line(s) having a default width and line(s) having a non-default width. A system and program product corresponding to the method are also provided.

Abstract: A method of performing layout verification for an integrated circuit (IC) layout is described. The method comprises receiving layout information for the IC layout, identifying at least one IC component within the IC layout, extracting localized layout information for the at least one IC component from the received layout information, defining the localized layout information for the at least one IC component within at least one component instance parameter therefor, and performing at least one layout verification check for the at least one component based at least partly on the at least one component instance parameter.

Abstract: A method of performing layout verification for an integrated circuit (IC) layout is described. The method comprises receiving layout information for the IC layout, identifying at least one IC component within the IC layout, extracting localised layout information for the at least one IC component from the received layout information, defining the localised layout information for the at least one IC component within at least one component instance parameter therefor, and performing at least one layout verification check for the at least one component based at least partly on the at least one component instance parameter.