Patents by Inventor Shitong Mao

Shitong Mao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250117917
    Abstract: Provided are various mechanisms and processes for automatic computer vision-based defect detection using a neural network. A system is configured for receiving historical datasets that include training images corresponding to one or more known defects. Each training image is converted into a corresponding matrix representation for training the neural network to adjust weighted parameters based on the known defects. Once sufficiently trained, a test image of an object that is not part of the historical dataset is obtained. Portions of the test image are extracted as input patches for input into the neural network as respective matrix representations. A probability score indicating the likelihood that the input patch includes a defect is automatically generated for each input patch using the weighted parameters. An overall defect score for the test image is then generated based on the probability scores to indicate the condition of the object.
    Type: Application
    Filed: November 16, 2023
    Publication date: April 10, 2025
    Applicant: QEEXO, CO.
    Inventors: Rajen Bhatt, Shitong Mao, Raviprakash Kandury, Michelle Tai, Geoffrey Newman
  • Patent number: 11847775
    Abstract: Provided are various mechanisms and processes for automatic computer vision-based defect detection using a neural network. A system is configured for receiving historical datasets that include training images corresponding to one or more known defects. Each training image is converted into a corresponding matrix representation for training the neural network to adjust weighted parameters based on the known defects. Once sufficiently trained, a test image of an object that is not part of the historical dataset is obtained. Portions of the test image are extracted as input patches for input into the neural network as respective matrix representations. A probability score indicating the likelihood that the input patch includes a defect is automatically generated for each input patch using the weighted parameters. An overall defect score for the test image is then generated based on the probability scores to indicate the condition of the object.
    Type: Grant
    Filed: December 9, 2022
    Date of Patent: December 19, 2023
    Assignee: QEEXO, CO.
    Inventors: Rajen Bhatt, Shitong Mao, Raviprakash Kandury, Michelle Tai, Geoffrey Newman
  • Publication number: 20230109179
    Abstract: Provided are various mechanisms and processes for automatic computer vision-based defect detection using a neural network. A system is configured for receiving historical datasets that include training images corresponding to one or more known defects. Each training image is converted into a corresponding matrix representation for training the neural network to adjust weighted parameters based on the known defects. Once sufficiently trained, a test image of an object that is not part of the historical dataset is obtained. Portions of the test image are extracted as input patches for input into the neural network as respective matrix representations. A probability score indicating the likelihood that the input patch includes a defect is automatically generated for each input patch using the weighted parameters. An overall defect score for the test image is then generated based on the probability scores to indicate the condition of the object.
    Type: Application
    Filed: December 9, 2022
    Publication date: April 6, 2023
    Applicant: QEEXO, CO.
    Inventors: Rajen Bhatt, Shitong Mao, Raviprakash Kandury, Michelle Tai, Geoffrey Newman
  • Patent number: 11538146
    Abstract: Provided are various mechanisms and processes for automatic computer vision-based defect detection using a neural network. A system is configured for receiving historical datasets that include training images corresponding to one or more known defects. Each training image is converted into a corresponding matrix representation for training the neural network to adjust weighted parameters based on the known defects. Once sufficiently trained, a test image of an object that is not part of the historical dataset is obtained. Portions of the test image are extracted as input patches for input into the neural network as respective matrix representations. A probability score indicating the likelihood that the input patch includes a defect is automatically generated for each input patch using the weighted parameters. An overall defect score for the test image is then generated based on the probability scores to indicate the condition of the object.
    Type: Grant
    Filed: December 2, 2020
    Date of Patent: December 27, 2022
    Assignee: QEEXO, CO.
    Inventors: Rajen Bhatt, Shitong Mao, Raviprakash Kandury, Michelle Tai, Geoffrey Newman
  • Publication number: 20210192714
    Abstract: Provided are various mechanisms and processes for automatic computer vision-based defect detection using a neural network. A system is configured for receiving historical datasets that include training images corresponding to one or more known defects. Each training image is converted into a corresponding matrix representation for training the neural network to adjust weighted parameters based on the known defects. Once sufficiently trained, a test image of an object that is not part of the historical dataset is obtained. Portions of the test image are extracted as input patches for input into the neural network as respective matrix representations. A probability score indicating the likelihood that the input patch includes a defect is automatically generated for each input patch using the weighted parameters. An overall defect score for the test image is then generated based on the probability scores to indicate the condition of the object.
    Type: Application
    Filed: December 2, 2020
    Publication date: June 24, 2021
    Applicant: QEEXO, CO.
    Inventors: Rajen Bhatt, Shitong Mao, Raviprakash Kandury, Michelle Tai, Geoffrey Newman