Patents by Inventor Shitou WU

Shitou WU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for simultaneously measuring the value of forsterite and trace elements in olivine
    Patent number: 11664208
    Abstract: The present disclosure provides a method for simultaneously measuring the value of forsterite and trace elements in olivine, comprising the following steps: Step S1: selecting samples, wherein the samples are olivine samples; Step S2: placing the samples in a sample chamber of LA-ICP-MS, and adjusting the position of the samples in the optical axis direction so that the laser beam is well focused; Step S3: optimizing the instrument to make the signal-to-noise ratio of 57Fe be the best; Step S4: adopting LA-ICP-MS peak hopping mode and receiving all the mass peaks of the samples by single electron multiplier (SEM). The present disclosure overcomes the disadvantages of long test cycle and high test cost in the prior art.
    Type: Grant
    Filed: November 13, 2020
    Date of Patent: May 30, 2023
    Assignee: INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
    Inventors: Shitou Wu, Yadong Wu, Yueheng Yang, Hao Wang, Chao Huang, Liewen Xie
  • METHOD FOR SIMULTANEOUSLY MEASURING THE VALUE OF FORSTERITE AND TRACE ELEMENTS IN OLIVINE
    Publication number: 20210358731
    Abstract: The present disclosure provides a method for simultaneously measuring the value of forsterite and trace elements in olivine, comprising the following steps: Step S1: selecting samples, wherein the samples are olivine samples; Step S2: placing the samples in a sample chamber of LA-ICP-MS, and adjusting the position of the samples in the optical axis direction so that the laser beam is well focused; Step S3: optimizing the instrument to make the signal-to-noise ratio of 57Fe be the best; Step S4: adopting LA-ICP-MS peak hopping mode and receiving all the mass peaks of the samples by single electron multiplier (SEM). The present disclosure overcomes the disadvantages of long test cycle and high test cost in the prior art.
    Type: Application
    Filed: November 13, 2020
    Publication date: November 18, 2021
    Applicant: INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
    Inventors: Shitou WU, Yadong WU, Yueheng YANG, Hao WANG, Chao HUANG, Liewen XIE