Patents by Inventor Shivang Rajendra Dave

Shivang Rajendra Dave has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for wide field-of-view, highly oblique illumination microscopy for scatter-based discrimination of cells
    Patent number: 9772282
    Abstract: System for scatter-based differentiation of cells. The system includes a planar substrate having cells disposed thereon for imaging and a microscope employing relatively low magnification detection optics providing a wide field of view focused on the cells on the substrate and defining a microscope optical axis. An illuminator delivers light to the ceils on the substrate focused to a spot larger than the field of view of the microscope, the illuminator having an illumination optical axis highly oblique to the microscope optical axis wherein scattered light is collected by the microscope. A defection system receives the scattered light from the microscope to provide a measure of signal intensity and a measure of size for each cell for discrimination of cell type.
    Type: Grant
    Filed: July 19, 2016
    Date of Patent: September 26, 2017
    Assignee: Massachusetts Institute of Technology
    Inventors: Jason Michael Tucker-Schwartz, Shivang Rajendra Dave, German Gonzalez Serrano
  • SYSTEM FOR WIDE FIELD-OF-VIEW, HIGHLY OBLIQUE ILLUMINATION MICROSCOPY FOR SCATTER-BASED DISCRIMINATION OF CELLS
    Publication number: 20170138849
    Abstract: System for scatter-based differentiation of cells. The system includes a planar substrate having cells disposed thereon for imaging and a microscope employing relatively low magnification detection optics providing a wide field of view focused on the cells on the substrate and defining a microscope optical axis. An illuminator delivers light to the ceils on the substrate focused to a spot larger than the field of view of the microscope, the illuminator having an illumination optical axis highly oblique to the microscope optical axis wherein scattered light is collected by the microscope. A defection system receives the scattered light from the microscope to provide a measure of signal intensity and a measure of size for each cell for discrimination of cell type.
    Type: Application
    Filed: July 19, 2016
    Publication date: May 18, 2017
    Inventors: Jason Michael Tucker-Schwartz, Shivang Rajendra Dave, German Gonzalez Serrano