Abstract: Optical assemblies may include a projector assembly, a waveguide, and a mounting mechanism. The projector assembly may be configured for generating an image, and the waveguide may be configured for transmitting the image to a location in front of a user's eye. The mounting mechanism may removably couple the waveguide to an underlying frame. The mounting mechanism may include a detachable coupling, at least one flexure secured to a peripheral edge of the waveguide, and at least one flexure support coupled to the at least one flexure. The flexure support may be removably secured to the detachable coupling by a removable retainer. Various other related systems, methods, and devices are also disclosed.

Abstract: A method for image capture using artificial intelligence (AI) techniques to generate a user-personalized and noise-corrected final image from a captured image, that includes classifying a noise associated with a lens of an imaging device, preprocessing the captured image based on the classified noise to determine an initial region of interest (ROI), generating a first processed image by inputting the initial ROI and the captured image to a deep learning network, receiving a passive user input corresponding to a portion of a first preview of the first processed image, determining an additional ROI based on the passive user input and the classified noise, generating a second processed image by inputting the second ROI and the captured image to the deep learning network, and generating a user-personalization based noise-corrected final image based on the second processed image.

Abstract: Optical assemblies may include a projector assembly, a waveguide, and a mounting mechanism. The projector assembly may be configured for generating an image, and the waveguide may be configured for transmitting the image to a location in front of a user's eye. The mounting mechanism may removably couple the waveguide to an underlying frame. The mounting mechanism may include a detachable coupling, at least one flexure secured to a peripheral edge of the waveguide, and at least one flexure support coupled to the at least one flexure. The flexure support may be removably secured to the detachable coupling by a removable retainer. Various other related systems, methods, and devices are also disclosed.

Abstract: A sensor apparatus may include an array of protruding members that each extend outward in a different radial direction from a central axis, each protruding member including a projector that projects structured light into a local environment, one or more cameras that capture reflections of the structured light from the local environment, and another camera that captures visible-spectrum light from the local environment. The sensor apparatus may also include one or more localization devices for determining a location of the sensor apparatus. Various other apparatuses, systems, and methods are also disclosed.

Abstract: An inspection system with selectable apodization includes a selectably configurable apodization device disposed along an optical pathway of an optical system. The apodization device includes one or more apodization elements operatively coupled to one or more actuation stages. The one or more actuation stages are configured to selectably actuate the one or more apodization elements along one or more directions. The inspection system includes a control system communicatively coupled to the one or more actuation stages. The control system is configured to selectably control an actuation state of at the one or more apodization elements so as to apply a selected apodization profile formed with the one or more apodization elements.

Abstract: An inspection system with selectable apodization includes a selectably configurable apodization device disposed along an optical pathway of an optical system. The apodization device includes one or more apodization elements operatively coupled to one or more actuation stages. The one or more actuation stages are configured to selectably actuate the one or more apodization elements along one or more directions. The inspection system includes a control system communicatively coupled to the one or more actuation stages. The control system is configured to selectably control an actuation state of at the one or more apodization elements so as to apply a selected apodization profile formed with the one or more apodization elements.

Abstract: An inspection system with selectable apodization includes an illumination source configured to illuminate a surface of a sample, a detector configured to detect at least a portion of light emanating from the surface of the sample, the illumination source and the detector being optically coupled via an optical pathway of an optical system, a selectably configurable apodization device disposed along the optical pathway, wherein the apodization device includes one or more apodization elements operatively coupled to one or more actuation stages configured to selectably actuate the one or more apodization elements along one or more directions, and a control system communicatively coupled to the one or more actuation and configured to selectably control apodization of illumination transmitted along the optical pathway by controlling an actuation state of the one or more apodization elements.