Patents by Inventor Shogo Kataoka
Shogo Kataoka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11945984Abstract: A reinforcing film comprises a pressure sensitive adhesive layer laminated and fixed on a principal surface of a film substrate. The pressure sensitive adhesive layer is formed of a photocurable composition containing a photocurable agent and a base polymer having a crosslinked structure. The gel fraction of the photocurable composition is preferably 60% or more. The shear storage elastic modulus at 25° C. of the pressure sensitive adhesive layer is preferably 1×104 to 1.2×105 Pa. The shear storage elastic modulus at 25° C. of the pressure sensitive adhesive layer after photocuring is preferably 1.5×105 to 2×106 Pa.Type: GrantFiled: September 18, 2018Date of Patent: April 2, 2024Assignee: NITTO DENKO CORPORATIONInventors: Takeshi Nakano, Keiji Hayashi, Souya Jo, Shogo Sasaki, Kenichi Kataoka
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Patent number: 11621143Abstract: An ion milling apparatus includes a pair of shielding members sandwiching a sample, and an ion source configured to irradiate the sample with an ion beam. The ion milling apparatus is configured to be capable of irradiating the sample with the ion beam in a first mode of irradiating the sample with the ion beam via one shielding member and in a second mode of irradiating the sample with the ion beam via the other shielding member.Type: GrantFiled: July 19, 2021Date of Patent: April 4, 2023Assignee: JEOL Ltd.Inventors: Shogo Kataoka, Tatsuro Mino, Koji Todoroki
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Patent number: 11562886Abstract: An ion milling apparatus has: a sample holder including a shield member for shielding the sample except for a portion to be milled; and a sample locking member cooperating with the shield member such that the sample is sandwiched and held therebetween. The shield member has an edge portion that determines a milling position on or in the sample. The sample locking member is disposed downstream of the edge portion in the direction of irradiation by the ion beam and has a support portion cooperating with the edge portion to support the milled portion therebetween. The support portion has a first surface making contact with the sample and a second surface making a given angle to the first surface. The given angle is equal to or less than 90°.Type: GrantFiled: August 12, 2021Date of Patent: January 24, 2023Assignee: JEOL Ltd.Inventors: Shogo Kataoka, Tatsuro Mino, Koji Todoroki
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Publication number: 20220277925Abstract: A specimen machining device includes an ion source which irradiates a specimen with an ion beam, a first rotating body (specimen holder) that holds the specimen and is rotatable about a first axis serving as a rotation axis, and a second rotating body on which the first rotating body is disposed and which is rotatable about a second axis serving as a rotation axis different from the first axis. The specimen machining device irradiates the specimen with the ion beam while moving the specimen by the rotation of the first rotating body and the rotation of the second rotating body.Type: ApplicationFiled: February 24, 2022Publication date: September 1, 2022Inventors: Shogo Kataoka, Koji Todoroki
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Publication number: 20220051870Abstract: An ion milling apparatus has: a sample holder including a shield member for shielding the sample except for a portion to be milled; and a sample locking member cooperating with the shield member such that the sample is sandwiched and held therebetween. The shield member has an edge portion that determines a milling position on or in the sample. The sample locking member is disposed downstream of the edge portion in the direction of irradiation by the ion beam and has a support portion cooperating with the edge portion to support the milled portion therebetween. The support portion has a first surface making contact with the sample and a second surface making a given angle to the first surface. The given angle is equal to or less than 90°.Type: ApplicationFiled: August 12, 2021Publication date: February 17, 2022Inventors: Shogo Kataoka, Tatsuro Mino, Koji Todoroki
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Publication number: 20220020558Abstract: An ion milling apparatus includes a pair of shielding members sandwiching a sample, and an ion source configured to irradiate the sample with an ion beam. The ion milling apparatus is configured to be capable of irradiating the sample with the ion beam in a first mode of irradiating the sample with the ion beam via one shielding member and in a second mode of irradiating the sample with the ion beam via the other shielding member.Type: ApplicationFiled: July 19, 2021Publication date: January 20, 2022Inventors: Shogo Kataoka, Tatsuro Mino, Koji Todoroki
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Patent number: 10930466Abstract: An ion milling apparatus includes an ion irradiation source, a sample holder, a sample stage, a rotation mechanism, and a slide mechanism. The sample holder holds a sample such that the sample protrudes from a shielding plate in a direction perpendicular to an optical axis of an ion beam. The rotation mechanism is disposed such that a rotation center of a rotation shaft is perpendicular to the optical axis of the ion beam and parallel to a direction in which the sample protrudes from the shielding plate. The rotation mechanism supports the sample stage such that the sample stage is rotatable. The slide mechanism supports the sample held by the sample holder such that the sample is movable along the optical axis of the ion beam.Type: GrantFiled: May 24, 2018Date of Patent: February 23, 2021Assignee: JEOL Ltd.Inventors: Shogo Kataoka, Shunsuke Asahina
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Patent number: 10832888Abstract: There is provided an ion milling apparatus and sample holder permitting one to observe a sample, which has been milled, with an electron microscope without transferring the sample to a different holding member. The ion milling apparatus has an ion source, a sample holder, and a sample stage. The sample holder includes: a holder body having a sample holding portion for holding the sample; and a cover member detachably mounted to the holder body and hermetically sealing the sample held on the sample holding portion. The holder body has a shield plate and a field-correcting plate for correcting electric fields around the sample held on the sample holding portion.Type: GrantFiled: March 12, 2019Date of Patent: November 10, 2020Assignee: JEOL Ltd.Inventors: Shogo Kataoka, Toru Kagawa
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Publication number: 20190287755Abstract: There is provided an ion milling apparatus and sample holder permitting one to observe a sample, which has been milled, with an electron microscope without transferring the sample to a different holding member. The ion milling apparatus has an ion source, a sample holder, and a sample stage. The sample holder includes: a holder body having a sample holding portion for holding the sample; and a cover member detachably mounted to the holder body and hermetically sealing the sample held on the sample holding portion. The holder body has a shield plate and a field-correcting plate for correcting electric fields around the sample held on the sample holding portion.Type: ApplicationFiled: March 12, 2019Publication date: September 19, 2019Inventors: Shogo Kataoka, Toru Kagawa
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Patent number: 10381191Abstract: A sample holder unit includes a sample holding portion, a shielding plate, and a rotating mechanism. The rotating mechanism supports the sample and the shielding plate and allows the sample and the shielding plate to rotate. The rotating mechanism is oriented such that an axis of rotation thereof is parallel to both a processing surface of the sample and a direction orthogonal to a direction of projection of the sample from the shielding plate. A center of rotation of the rotating mechanism resides on the processing surface of the sample.Type: GrantFiled: April 30, 2018Date of Patent: August 13, 2019Assignee: JEOL Ltd.Inventors: Shogo Kataoka, Akio Isono
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Publication number: 20180342369Abstract: An ion milling apparatus includes an ion irradiation source, a sample holder, a sample stage, a rotation mechanism, and a slide mechanism. The sample holder holds a sample such that the sample protrudes from a shielding plate in a direction perpendicular to an optical axis of an ion beam. The rotation mechanism is disposed such that a rotation center of a rotation shaft is perpendicular to the optical axis of the ion beam and parallel to a direction in which the sample protrudes from the shielding plate. The rotation mechanism supports the sample stage such that the sample stage is rotatable. The slide mechanism supports the sample held by the sample holder such that the sample is movable along the optical axis of the ion beam.Type: ApplicationFiled: May 24, 2018Publication date: November 29, 2018Inventors: Shogo Kataoka, Shunsuke Asahina
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Publication number: 20180330913Abstract: A sample holder unit includes a sample holding portion, a shielding plate, and a rotating mechanism. The rotating mechanism supports the sample and the shielding plate and allows the sample and the shielding plate to rotate. The rotating mechanism is oriented such that an axis of rotation thereof is parallel to both a processing surface of the sample and a direction orthogonal to a direction of projection of the sample from the shielding plate. A center of rotation of the rotating mechanism resides on the processing surface of the sample.Type: ApplicationFiled: April 30, 2018Publication date: November 15, 2018Inventors: Shogo Kataoka, Akio Isono