Patents by Inventor Shogoro IWAKIRI

Shogoro IWAKIRI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Material testing machine and gripping force detecting method
    Patent number: 10928281
    Abstract: Provided are a material testing machine and a gripping force detecting method that can easily judge whether a test piece is gripped with an appropriate gripping force by a gripper. A controlling section is connected to a FFT transforming section via a load cell; the FFT transforming section calculates a natural frequency of a system comprising a test piece and an upper gripper which is connected to a load cell based on a detected value of a force of the load cell. In addition, the controlling section is connected to a storing section which stores the natural frequency calculated by the FFT transforming section. Furthermore, the controlling section is also connected to a comparing section which compares the natural frequency calculated by the FFT transforming section and the natural frequency stored by the storing section before a test starts.
    Type: Grant
    Filed: October 22, 2018
    Date of Patent: February 23, 2021
    Assignee: SHIMADZU CORPORATION
    Inventors: Shogoro Iwakiri, Zen Miyazaki
  • MATERIAL TESTING MACHINE AND GRIPPING FORCE DETECTING METHOD
    Publication number: 20190154554
    Abstract: Provided are a material testing machine and a gripping force detecting method that can easily judge whether a test piece is gripped with an appropriate gripping force by a gripper. A controlling section is connected to a FFT transforming section via a load cell; the FFT transforming section calculates a natural frequency of a system comprising a test piece and an upper gripper which is connected to a load cell based on a detected value of a force of the load cell. In addition, the controlling section is connected to a storing section which stores the natural frequency calculated by the FFT transforming section. Furthermore, the controlling section is also connected to a comparing section which compares the natural frequency calculated by the FFT transforming section and the natural frequency stored by the storing section before a test starts.
    Type: Application
    Filed: October 22, 2018
    Publication date: May 23, 2019
    Applicant: SHIMADZU CORPORATION
    Inventors: Shogoro IWAKIRI, Zen MIYAZAKI