Patents by Inventor Shoichi NAKANISHI

Shoichi NAKANISHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Image acquisition device, image acquisition method, and image correction program
    Patent number: 10520453
    Abstract: Provided are an image acquisition device and an image acquisition method capable of acquiring the internal and external contours of a measured object with a high degree of accuracy.
    Type: Grant
    Filed: June 3, 2016
    Date of Patent: December 31, 2019
    Assignee: Tokyo Metropolitan Industrial Technology Research Institute
    Inventors: Akira Monkawa, Shoichi Nakanishi, Shinya Abe
  • Device and method for image reconstruction at different X-ray energies, and device and method for X-ray three-dimensional measurement
    Patent number: 10521936
    Abstract: The present invention provides a device and a method for image reconstruction at different X-ray energies that make it possible to achieve image reconstruction with higher accuracy. A device for image reconstruction at different X-ray energies includes: an X-ray source 1 that irradiates a specimen to be imaged 2 with X-rays; an energy-dispersive detector 4 that detects a characteristic X-ray emitted from the specimen to be imaged 2; a signal processing means that quantifies the peak of the characteristic X-ray detected by the detector 4; and an image reconstruction means that reconstructs an image on the basis of a signal from the signal processing means.
    Type: Grant
    Filed: August 10, 2017
    Date of Patent: December 31, 2019
    Assignee: TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Akira Monkawa, Shoichi Nakanishi, Shinya Abe, Mikiya Kondo, Koh Harada
  • IMAGE ACQUISITION DEVICE, IMAGE ACQUISITION METHOD, AND IMAGE CORRECTION PROGRAM
    Publication number: 20180172606
    Abstract: Provided are an image acquisition device and an image acquisition method capable of acquiring the internal and external contours of a measured object with a high degree of accuracy.
    Type: Application
    Filed: June 3, 2016
    Publication date: June 21, 2018
    Applicant: Tokyo Metropolitan Industrial Technology Research Institute
    Inventors: Akira MONKAWA, Shoichi NAKANISHI, Shinya ABE
  • Device and method for image reconstruction at different X-ray energies, and device and method for X-ray three-dimensional measurement
    Patent number: 9928619
    Abstract: A device and a method for image reconstruction at different X-ray energies that make it possible to achieve image reconstruction with higher accuracy. A device for image reconstruction at different X-ray energies includes: an X-ray source 1 that irradiates a specimen to be imaged 2 with X-rays; an energy-dispersive detector 4 that detects a characteristic X-ray emitted from the specimen to be imaged 2; a signal processor that quantifies the peak of the characteristic X-ray detected by the detector 4; and an image reconstruction device that reconstructs an image on the basis of a signal from the signal processor.
    Type: Grant
    Filed: May 29, 2014
    Date of Patent: March 27, 2018
    Assignee: Tokyo Metropolitan Industrial Technology Research Institute
    Inventors: Akira Monkawa, Shoichi Nakanishi, Shinya Abe, Mikiya Kondo, Koh Harada
  • DEVICE AND METHOD FOR IMAGE RECONSTRUCTION AT DIFFERENT X-RAY ENERGIES, AND DEVICE AND METHOD FOR X-RAY THREE-DIMENSIONAL MEASUREMENT
    Publication number: 20170365077
    Abstract: The present invention provides a device and a method for image reconstruction at different X-ray energies that make it possible to achieve image reconstruction with higher accuracy. A device for image reconstruction at different X-ray energies includes: an X-ray source 1 that irradiates a specimen to be imaged 2 with X-rays; an energy-dispersive detector 4 that detects a characteristic X-ray emitted from the specimen to be imaged 2; a signal processing means that quantifies the peak of the characteristic X-ray detected by the detector 4; and an image reconstruction means that reconstructs an image on the basis of a signal from the signal processing means.
    Type: Application
    Filed: August 10, 2017
    Publication date: December 21, 2017
    Applicant: TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Akira MONKAWA, Shoichi NAKANISHI, Shinya ABE, Mikiya KONDO, Koh HARADA
  • DEVICE AND METHOD FOR IMAGE RECONSTRUCTION AT DIFFERENT X-RAY ENERGIES, AND DEVICE AND METHOD FOR X-RAY THREE-DIMENSIONAL MEASUREMENT
    Publication number: 20160133032
    Abstract: A device and a method for image reconstruction at different X-ray energies that make it possible to achieve image reconstruction with higher accuracy. A device for image reconstruction at different X-ray energies includes: an X-ray source 1 that irradiates a specimen to be imaged 2 with X-rays; an energy-dispersive detector 4 that detects a characteristic X-ray emitted from the specimen to be imaged 2; a signal processor that quantifies the peak of the characteristic X-ray detected by the detector 4; and an image reconstruction device that reconstructs an image on the basis of a signal from the signal processor.
    Type: Application
    Filed: May 29, 2014
    Publication date: May 12, 2016
    Applicant: TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Akira MONKAWA, Shoichi NAKANISHI, Shinya ABE, Mikiya KONDO, Koh HARADA