Patents by Inventor Shoichiro Nakayama

Shoichiro Nakayama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5231297
    Abstract: A thin film transistor with a noncrystalline semiconductor film, wherein an amorphous semiconductor in a position corresponding to a channel between a source electrode and a drain electrode is polycrystallized, while on both side areas or around the polycrystallized area remains amorphous. The thin film transistor may be a noncrystalline semiconductor film with a heterojunction between a channel area and a source and drain area.
    Type: Grant
    Filed: January 7, 1992
    Date of Patent: July 27, 1993
    Assignee: Sanyo Electric Co., Ltd.
    Inventors: Shoichiro Nakayama, Shigeru Noguchi, Keiichi Sano, Hiroshi Iwata, Hiroyuki Kuriyama
  • Patent number: 5183780
    Abstract: In a method of fabricating a semiconductor device according to the present invention, a semiconductor film is formed on a substrate, and an insulator film is formed so as to cover the semiconductor film. Then, a dopant source is arranged on the insulator film and then, a region for electrical contact is irradiated with a high-energy beam through the dopant source. Consequently, the insulator film and the semiconductor film in the irradiated region are melted, to form a polycrystalline contact region having impurities supplied from the dopant source doped therein. Thus, the high-energy beam is irradiated to the region for electrical contact through the dopant source to form the polycrystalline contact region, thereby to make it possible to omit the patterning process such as etching processing for providing a contact hole.
    Type: Grant
    Filed: February 20, 1991
    Date of Patent: February 2, 1993
    Assignee: Sanyo Electric Co., Ltd.
    Inventors: Shigeru Noguchi, Satoshi Ishida, Hiroshi Iwata, Keiichi Sano, Shoichiro Nakayama
  • Patent number: 5144391
    Abstract: A semiconductor device according to the present invention comprises a semiconductor thin film, and first and second insulator films formed in such arrangement that the semiconductor thin film being sandwiched therebetween. First and second graded layers each containing a constitutent element of the semiconductor thin film and impurities and having a content of the impurities decreased in the direction of the semiconductor thin film are interposed between the semiconductor thin film and the respective insulator films, thereby to relax internal stress produced in the junction interfaces of the semiconductor thin film and the insulator films and to prevent cracking from occurring in the junction interfaces.
    Type: Grant
    Filed: February 20, 1991
    Date of Patent: September 1, 1992
    Assignee: Sanyo Electric Co., Ltd.
    Inventors: Hiroshi Iwata, Shigeru Noguchi, Satoshi Ishida, Keiichi Sano, Shoichiro Nakayama
  • Patent number: 4831429
    Abstract: A transparent photo detector device according to an aspect of the present invention comprises: a transparent insulator substrate; a plurality of light sensor elements dispersively disposed on a main surface of the substrate, said sensor element including a transparent front electrode, a semiconductor layer for photo electric function and an opaque back electrode formed in that order on the main surface of the substrate, said semiconductor layer being neither protracting from nor retracting into between said front and back electrodes; and a transparent wire pattern formed on the main surface of the substrate for electrically connecting the plurality of sensor elements.
    Type: Grant
    Filed: June 23, 1986
    Date of Patent: May 16, 1989
    Assignee: Sanyo Electric Co., Ltd.
    Inventors: Saburo Nakashima, Shoichiro Nakayama, Shigeru Noguchi, Shoichi Nakano, Yukinori Kuwano, Kaneo Watanabe, Hiroyuki Kuriyama