Abstract: An inspection device for a display device includes: an inspection circuit which judges a defect of each of pixels based on current which flows through an inspection interconnect connected with interconnects of the display device; and an inspection driver circuit which drives by supplying a necessary signal to the display device. The inspection circuit includes: a correction circuit which generates a first correction current which substantially cancels a first current which flows through the inspection interconnect when all the pixels are set to an off-state based on the first current; a detection circuit which detects a measured value for each pixel obtained by correcting a measured current which flows through the inspection interconnect by the first correction current each time the pixels are sequentially set to an on-state; and a defect judgment circuit which judges a defect of each of the pixels based on the measured value.

Abstract: An inspection device for a display device includes: an inspection circuit which judges a defect of each of pixels based on current which flows through an inspection interconnect connected with interconnects of the display device; and an inspection driver circuit which drives by supplying a necessary signal to the display device. The inspection circuit includes: a correction circuit which generates a first correction current which substantially cancels a first current which flows through the inspection interconnect when all the pixels are set to an off-state based on the first current; a detection circuit which detects a measured value for each pixel obtained by correcting a measured current which flows through the inspection interconnect by the first correction current each time the pixels are sequentially set to an on-state; and a defect judgment circuit which judges a defect of each of the pixels based on the measured value.

Abstract: An inspection device for a display device includes: an inspection circuit which judges a defect of each of pixels based on current which flows through an inspection interconnect connected with interconnects of the display device; and an inspection driver circuit which drives by supplying a necessary signal to the display device. The inspection circuit includes: a correction circuit which generates a first correction current which substantially cancels a first current which flows through the inspection interconnect when all the pixels are set to an off-state based on the first current; a detection circuit which detects a measured value for each pixel obtained by correcting a measured current which flows through the inspection interconnect by the first correction current each time the pixels are sequentially set to an on-state; and a defect judgment circuit which judges a defect of each of the pixels based on the measured value.

Abstract: An active matrix substrate has a plurality of pixel drive cells, each of which includes a switching element and a capacitor. The capacitor is charged and discharged through the switching element, and a charging current based on a charge stored in the capacitor and a discharge current after discharging the capacitor are sampled. The charging current is sampled at a plurality of points on a time axis in consideration of the variation of the on-resistance of the switching element. Since the load on a path through which an inspection current (charging current or discharge current) flows depends on the position of the pixel drive cells, the wave height value between the charging current and the discharge current is calculated for each pixel drive cell based on the discharge current, and whether or not the pixel drive cell has a defect is determined based on the wave height value.

Abstract: An inspection method and device are provided. The inspection method includes charging a parasitic capacitor between the gate and the drain of an operating transistor by supplying a potential from an inspection device, measuring discharge current from the parasitic capacitor by using the inspection device by discharging the parasitic capacitor, and determining whether or not a defect exists in each of a plurality of pixels by using the inspection device based on a value of the discharge current.

Abstract: An active matrix substrate has a plurality of pixel drive cells, each of which includes a switching element and a capacitor. The capacitor is charged and discharged through the switching element, and a charging current based on a charge stored in the capacitor and a discharge current after discharging the capacitor are sampled. The charging current is sampled at a plurality of points on a time axis in consideration of the variation of the on-resistance of the switching element. Since the load on a path through which an inspection current (charging current or discharge current) flows depends on the position of the pixel drive cells, the wave height value between the charging current and the discharge current is calculated for each pixel drive cell based on the discharge current, and whether or not the pixel drive cell has a defect is determined based on the wave height value.

Abstract: An object of inspection is an active matrix substrate including a plurality of pixels, each of the plurality of pixels being connected with one of a plurality of signal lines, one of a plurality of scanning lines, and one of a plurality of voltage supply lines, and including a pixel select transistor connected with the one signal line and the one scanning line and an operating transistor, a gate of the operating transistor being connected with the pixel select transistor, a drain of the operating transistor being connected with the one voltage supply line, and a source of the operating transistor being in an open state.