Abstract: A coin holding device includes a mechanism for treating coins fed in a plurality of feeding ports thereby supplying an article. The coin holding device capable of holding the fed coins, comprises a first opening in which some coins are fed, a second opening in which other coins are fed, a first path part through which coins fed in the first opening pass, a second path part through which coins fed in the second opening pass, a first holding unit capable of holding coins which pass through the first path part and a second holding unit capable of holding coins which pass through the path part, wherein the first path part and the second path port are arranged so as to face each other.

Abstract: In a capacitive input switch that is accommodated in a housing of electronic equipment, the capacitive input switch includes a rigidity imparting layer having rigidity and a laminate sheet laminated on the rigidity imparting layer. The rigidity imparting layer and the laminate sheet are three dimensionally formed. The laminate sheet is formed by a substrate sheet, a conductive pattern layer for capacitor formation, and a decorative layer that is laminated at least on any one of the substrate sheet and the conductive pattern layer. A separate conductor is caused to contact with the conductive pattern layer and the conductive pattern layer is caused to be electrically connected to an external electric circuit by the conductor.

Abstract: In a capacitive input switch that is accommodated in a housing of electronic equipment, the capacitive input switch includes a rigidity imparting layer having rigidity and a laminate sheet laminated on the rigidity imparting layer. The rigidity imparting layer and the laminate sheet are three dimensionally formed. The laminate sheet is formed by a substrate sheet, a conductive pattern layer for capacitor formation, and a decorative layer that is laminated at least on any one of the substrate sheet and the conductive pattern layer. A separate conductor is caused to contact with the conductive pattern layer and the conductive pattern layer is caused to be electrically connected to an external electric circuit by the conductor.

Abstract: In equipment which measures current of ICs for testing them, there are provided a first current detector for detecting current which flows through an IC under test when applying voltage from a voltage source to a power source terminal of the IC to which a smoothing capacitor is connected, a buffer amplifier for extracting the voltage to be applied to the power source terminal, a compensating capacitor which is supplied with the output of the buffer amplifier and provides a charging/discharging current equivalent to that which flows through the smoothing capacitor, a second current detector for detecting the charging/discharging current of the compensating capacitor, and a subtractor for subtracting the output of the second current detector from the output of the first current detector.