Abstract: An abnormality detection circuit includes: a first current source configured to generate a first current flowing from an external terminal toward a reference potential terminal; a second current source configured to generate a second current flowing from a power supply potential terminal toward the external terminal; a comparator configured to generate an abnormality detection signal by comparing a detection voltage corresponding to an application voltage of the external terminal with a predetermined threshold voltage; and a controller configured to switch between a first abnormality detection mode in which an operation of generating the first current is performed and a second abnormality detection mode in which an operation of generating the second current is performed.

Abstract: A semiconductor device includes an insulated gate type first transistor that is formed at a semiconductor chip, an insulated gate type second transistor that is formed at the semiconductor chip, and a control wiring that transmits a control signal controlling the first transistor and the second transistor to reach an ON state during a normal operation and controlling the first transistor to reach an OFF state and the second transistor to reach an ON state during an active clamp operation.

Abstract: An abnormality detection circuit includes: a first current source configured to generate a first current flowing from an external terminal toward a reference potential terminal; a second current source configured to generate a second current flowing from a power supply potential terminal toward the external terminal; a comparator configured to generate an abnormality detection signal by comparing a detection voltage corresponding to an application voltage of the external terminal with a predetermined threshold voltage; and a controller configured to switch between a first abnormality detection mode in which an operation of generating the first current is performed and a second abnormality detection mode in which an operation of generating the second current is performed.