Patents by Inventor Shota Umeda

Shota Umeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240395518
    Abstract: A diagnostic device separates sensor waveform data obtained in each plasma process into components of individuals of a plurality of predefined sensor waveform change types, calculates a deterioration degree indicating a deterioration state of the part for each separated sensor waveform component based on sensor waveform components at a normal time and a diagnosis time or sensor waveform components at a deterioration time and the diagnosis time, diagnoses necessity for the maintenance of a part using the deterioration degree, executes a filtering process on time-series data of the deterioration degree calculated for each plasma process, and sets a threshold used for deterioration diagnosis for each plasma processing apparatus based on a distribution calculated using a plurality of deterioration degrees after the filter processing is performed during a learning interval from time of component maintenance to time after the process is executed a predetermined number of times.
    Type: Application
    Filed: February 7, 2022
    Publication date: November 28, 2024
    Inventors: Shota UMEDA, Masahiro SUMIYA, Ryoji ASAKURA
  • Patent number: 12040167
    Abstract: In a diagnosis apparatus for diagnosing a state of a plasma processing apparatus, prior distribution information including a probability distribution function is previously obtained for each of first sensors by using first sensor values obtained by the first sensors in a first plasma processing apparatus, a probability distribution in each of second sensors corresponding to each of the first sensors is estimated based on the previously obtained prior distribution information and second sensor values obtained by the second sensors in a second plasma processing apparatus different from the first plasma processing apparatus, and a state of the second plasma processing apparatus is diagnosed by using the estimated probability distribution.
    Type: Grant
    Filed: July 30, 2019
    Date of Patent: July 16, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Shota Umeda, Kenji Tamaki, Masahiro Sumiya, Masaki Ishiguro
  • Publication number: 20240213003
    Abstract: A diagnosis device that uses information from state sensors provided in a plasma processing apparatus for plasma processing a specimen to diagnose deterioration states of components configuring the plasma processing apparatus includes an execution unit that computes and calculates deterioration degree of each of the components configuring the plasma processing apparatus on the basis of the information from the state sensors, and an analysis unit that sets a computation condition for computing and calculating the deterioration degree by the execution unit on the basis of the information from the state sensors and calculates a maintenance period of the plasma processing apparatus on the basis of the information of the deterioration degree of each of the components configuring the plasma processing apparatus computed and calculated by the execution unit, and makes it possible to decide deterioration degree computation condition having high robustness for each of the components.
    Type: Application
    Filed: July 13, 2021
    Publication date: June 27, 2024
    Inventors: Shota UMEDA, Kenji TAMAKI, Masahiro SUMIYA, Yoshito KAMAJI
  • Patent number: 12014909
    Abstract: The plasma processing apparatus includes a plasma processing unit that performs plasma processing of a sample and a control unit that controls the plasma processing. The control unit selects one of a plurality of the prediction models for predicting a result of the plasma processing based on a state of the plasma processing unit, and predicts the result of the plasma processing by using a selected prediction model.
    Type: Grant
    Filed: November 17, 2020
    Date of Patent: June 18, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Ryoji Asakura, Shota Umeda, Daisuke Shiraishi, Akira Kagoshima, Satomi Inoue
  • Publication number: 20220399182
    Abstract: In a plasma processing apparatus, occurrence of unplanned maintenance is predicted in advance so that a time when the work should be incorporated into planned maintenance can be determined. An apparatus diagnostic apparatus including a degradation score estimation unit that receives an output of a sensor mounted on a plasma processing apparatus and estimates a degradation score of the plasma processing device; a maintenance work occurrence probability estimation unit that calculates a probability of occurrence of an unplanned maintenance work that is not included in an original maintenance plan based on the degradation score; an actual maintenance cost calculation unit that calculates an actual maintenance cost; and a plan incorporated maintenance cost calculation unit that outputs a correction plan of maintenance plan in which the original maintenance plan is corrected by incorporating the unplanned maintenance work based on the probability of occurrence of the unplanned maintenance work.
    Type: Application
    Filed: June 15, 2020
    Publication date: December 15, 2022
    Inventors: Shota Umeda, Masahiro Sumiya, Yoshito Kamaji, Kenji Tamaki
  • Publication number: 20220291756
    Abstract: A character input device according to one or more embodiments may include a candidate retrieval unit configured to retrieve conversion candidates for an input character string that is input, and a sequence determination unit configured to determine a sequence of the conversion candidates. The sequence determination unit dynamically changes a parameter used to determine the sequence of the conversion candidates.
    Type: Application
    Filed: February 16, 2022
    Publication date: September 15, 2022
    Applicant: OMRON Corporation
    Inventor: Shota UMEDA
  • Publication number: 20220157580
    Abstract: In a diagnosis apparatus for diagnosing a state of a plasma processing apparatus, prior distribution information including a probability distribution function is previously obtained for each of first sensors by using first sensor values obtained by the first sensors in a first plasma processing apparatus, a probability distribution in each of second sensors corresponding to each of the first sensors is estimated based on the previously obtained prior distribution information and second sensor values obtained by the second sensors in a second plasma processing apparatus different from the first plasma processing apparatus, and a state of the second plasma processing apparatus is diagnosed by using the estimated probability distribution.
    Type: Application
    Filed: July 30, 2019
    Publication date: May 19, 2022
    Inventors: Shota Umeda, Kenji Tamaki, Masahiro Sumiya, Masaki Ishiguro
  • Publication number: 20220137609
    Abstract: A production information management system includes: a storage device that stores 4M (man, machine, material, and method) data information including time series data in which a state of each element of 4M per unit time is associated with acquisition accuracy of 4M data defined for each target and acquisition method of 4M, and analysis model information defining a criterion for determining a production loss from a combination of the 4M data information; a processor that analyzes the 4M data information by the analysis model information to estimate a production loss, and calculates estimation accuracy for the each production loss to generate production loss information; and a production loss display unit that displays the production loss information.
    Type: Application
    Filed: October 19, 2021
    Publication date: May 5, 2022
    Inventors: Daisuke TSUTSUMI, Shota UMEDA, Keita NOGI
  • Patent number: 11289313
    Abstract: Provided is a plasma processing apparatus including a processing unit in which a sample is plasma processed and which includes a monitor (optical emission spectroscopy) that monitors light emission of plasma, wherein the processing unit includes a prediction model storage unit that stores a prediction model predicting a plasma processing result, and a control device in which the plasma processing result is predicted by using a prediction model selected based on light emission data and device data as an indicator of state change of the processing unit.
    Type: Grant
    Filed: September 6, 2018
    Date of Patent: March 29, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Shota Umeda, Keita Nogi, Akira Kagoshima, Daisuke Shiraishi
  • Publication number: 20210074528
    Abstract: The plasma processing apparatus includes a plasma processing unit that performs plasma processing of a sample and a control unit that controls the plasma processing. The control unit selects one of a plurality of the prediction models for predicting a result of the plasma processing based on a state of the plasma processing unit, and predicts the result of the plasma processing by using a selected prediction model.
    Type: Application
    Filed: November 17, 2020
    Publication date: March 11, 2021
    Inventors: Ryoji Asakura, Shota Umeda, Daisuke Shiraishi, Akira Kagoshima, Satomi Inoue
  • Patent number: 10872750
    Abstract: The plasma processing apparatus includes a plasma processing unit that performs plasma processing of a sample and a control unit that controls the plasma processing. The control unit selects one of a plurality of the prediction models for predicting a result of the plasma processing based on a state of the plasma processing unit, and predicts the result of the plasma processing by using a selected prediction model.
    Type: Grant
    Filed: February 8, 2018
    Date of Patent: December 22, 2020
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Ryoji Asakura, Shota Umeda, Daisuke Shiraishi, Akira Kagoshima, Satomi Inoue
  • Patent number: 10390710
    Abstract: An electronic sphygmomanometer includes a cuff including an air bladder, a pressure sensor, an artery volume sensor, and a computation device. The computation device includes an inner pressure control section, a volume sensor signal receive section for receiving a pulse wave signal detected by the artery volume sensor, a pressure sensor signal receive section for receiving a pressure pulse wave signal superimposed on the inner pressure of the air bladder and detected by the pressure sensor, a judgment section for choosing either the pulse wave signal or the pressure pulse wave signal as a signal for calculating pulse rate of the patient during a period when the inner pressure of the air bladder is increased and/or decreased by the inner pressure control section, and a pulse rate calculation section for calculating pulse rate of the patient based on the pulse wave signal and the signal chosen by the judgment section.
    Type: Grant
    Filed: January 24, 2013
    Date of Patent: August 27, 2019
    Assignee: OMRON HEALTHCARE Co., Ltd.
    Inventors: Shota Umeda, Yukiya Sawanoi, Naomi Matsumura, Tsuyoshi Kitagawa
  • Publication number: 20190221407
    Abstract: Provided is a plasma processing apparatus including a processing unit in which a sample is plasma processed and which includes a monitor (optical emission spectroscopy) that monitors light emission of plasma, wherein the processing unit includes a prediction model storage unit that stores a prediction model predicting a plasma processing result, and a control device in which the plasma processing result is predicted by using a prediction model selected based on light emission data and device data as an indicator of state change of the processing unit.
    Type: Application
    Filed: September 6, 2018
    Publication date: July 18, 2019
    Inventors: Shota UMEDA, Keita NOGI, Akira KAGOSHIMA, Daisuke SHIRAISHI
  • Publication number: 20190051502
    Abstract: The plasma processing apparatus includes a plasma processing unit that performs plasma processing of a sample and a control unit that controls the plasma processing. The control unit selects one of a plurality of the prediction models for predicting a result of the plasma processing based on a state of the plasma processing unit, and predicts the result of the plasma processing by using a selected prediction model.
    Type: Application
    Filed: February 8, 2018
    Publication date: February 14, 2019
    Inventors: Ryoji ASAKURA, Shota UMEDA, Daisuke SHIRAISHI, Akira KAGOSHIMA, Satomi INOUE
  • Patent number: 10098552
    Abstract: A blood pressure and pulse measurement device includes a cuff including a first air bladder, a pressure sensor, a pressing member, a pulse wave sensor, and an operation unit. When measurement of the blood pressure is instructed by the operation unit, the first air bladder of the cuff is inflated to increase inner pressure to a sufficient level such that the blood pressure of the patient can be measured by the pressure sensor and then deflated. When measurement of the blood pressure is not instructed by the operation unit, air of the first air bladder of the cuff is released such that the measurement location of the patient is not substantially pressed by the first air bladder, and the measurement location of the patient is pressed by the pressing member with sufficient pressure such that pulse of the patient can be detected by the pulse wave sensor.
    Type: Grant
    Filed: January 24, 2013
    Date of Patent: October 16, 2018
    Assignee: OMRON HEALTHCARE Co., Ltd.
    Inventors: Naomi Matsumura, Yukiya Sawanoi, Tsuyoshi Kitagawa, Shota Umeda
  • Publication number: 20130190576
    Abstract: A blood pressure and pulse measurement device includes a cuff including a first air bladder, a pressure sensor, a pressing member, a pulse wave sensor, and an operation unit. When measurement of the blood pressure is instructed by the operation unit, the first air bladder of the cuff is inflated to increase inner pressure to a sufficient level such that the blood pressure of the patient can be measured by the pressure sensor and then deflated. When measurement of the blood pressure is not instructed by the operation unit, air of the first air bladder of the cuff is released such that the measurement location of the patient is not substantially pressed by the first air bladder, and the measurement location of the patient is pressed by the pressing member with sufficient pressure such that pulse of the patient can be detected by the pulse wave sensor.
    Type: Application
    Filed: January 24, 2013
    Publication date: July 25, 2013
    Inventors: Naomi Matsumura, Yukiya Sawanoi, Tsuyoshi Kitagawa, Shota Umeda
  • Publication number: 20130190629
    Abstract: An electronic sphygmomanometer includes a cuff including an air bladder, a pressure sensor, an artery volume sensor, and a computation device. The computation device includes an inner pressure control section, a volume sensor signal receive section for receiving a pulse wave signal detected by the artery volume sensor, a pressure sensor signal receive section for receiving a pressure pulse wave signal superimposed on the inner pressure of the air bladder and detected by the pressure sensor, a judgment section for choosing either the pulse wave signal or the pressure pulse wave signal as a signal for calculating pulse rate of the patient during a period when the inner pressure of the air bladder is increased and/or decreased by the inner pressure control section, and a pulse rate calculation section for calculating pulse rate of the patient based on the pulse wave signal and the signal chosen by the judgment section.
    Type: Application
    Filed: January 24, 2013
    Publication date: July 25, 2013
    Inventors: Shota Umeda, Yukiya Sawanoi, Naomi Matsumura, Tsuyoshi Kitagawa