Patents by Inventor SHOU-JEN TSAI
SHOU-JEN TSAI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11536765Abstract: A probing apparatus includes a frame, a testing device, a rotatable testing platform, and a probe module. The testing device is disposed on the frame and is displaceable along an X direction and a Y direction perpendicular to the X direction. The rotatable testing platform is disposed on the frame and is rotatable around a rotating axis extending in the X direction. A direction perpendicular to the X direction and the Y direction is a Z direction, and the rotatable testing platform and the testing device are located at different positions of the Z direction. The probe module is disposed on the rotatable testing platform.Type: GrantFiled: June 3, 2020Date of Patent: December 27, 2022Assignee: MPI CORPORATIONInventors: Kang-Yen Fu, Ya-Hung Lo, Shou-Jen Tsai, Wei-Cheng Ku
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Patent number: 11460498Abstract: An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.Type: GrantFiled: September 28, 2020Date of Patent: October 4, 2022Assignee: MPI CORPORATIONInventors: Yang-Hung Cheng, Ya-Hung Lo, Chien-Hsun Chen, Chia-Nan Chou, Chung-Yen Huang, Shou-Jen Tsai, Fuh-Chyun Tang
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Publication number: 20210102992Abstract: An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.Type: ApplicationFiled: September 28, 2020Publication date: April 8, 2021Applicant: MPI CORPORATIONInventors: YANG-HUNG CHENG, YA-HUNG LO, CHIEN-HSUN CHEN, CHIA-NAN CHOU, CHUNG-YEN HUANG, SHOU-JEN TSAI, FUH-CHYUN TANG
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Publication number: 20200400740Abstract: A probing apparatus includes a frame, a testing device, a rotatable testing platform, and a probe module. The testing device is disposed on the frame and is displaceable along an X direction and a Y direction perpendicular to the X direction. The rotatable testing platform is disposed on the frame and is rotatable around a rotating axis extending in the X direction. A direction perpendicular to the X direction and the Y direction is a Z direction, and the rotatable testing platform and the testing device are located at different positions of the Z direction. The probe module is disposed on the rotatable testing platform.Type: ApplicationFiled: June 3, 2020Publication date: December 24, 2020Applicant: MPI CorporationInventors: Kang-Yen Fu, Ya-Hung Lo, Shou-Jen Tsai, Wei-Cheng Ku
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Patent number: 9523708Abstract: An electrical testing device includes a base having two parallel first rails, a platform provided on the base, a support provided between the first rails, a test arm, a rotary table provided on the test arm, a plurality of holders provided on the rotary table, and a plurality of probe sets respectively provided on the holders. The support has a second rail provided thereon, and is moveable relative to the base and the platform. The test arm is provided on the second rail and above the platform, wherein the test arm is moveable along with the support, and is also movable relative to the support. The rotary table is moveable or rotatable relative to the test arm. The holders are moveable along with the rotary table, and are also moveable or rotatable relative to the rotary table. The probe sets are moveable along with the holders.Type: GrantFiled: December 1, 2014Date of Patent: December 20, 2016Assignee: MPI CorporationInventors: Wei-Cheng Ku, Shao-Wei Lu, Ya-Hung Lo, Shou-Jen Tsai
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Publication number: 20150212186Abstract: A method of calibrating and operating a testing system is provided, wherein the testing system has a test machine, a conducting wire set, a calibration module, and a probe module. The method includes the following steps: electrically connect the test machine and the conducting wire set; electrically connect the conducting wire set and the calibration module; send out electrical signals from the test machine to the calibration module for doing at least one test among a short-circuit test, an open-circuit test, and an impedance test, and then calibrate the testing system by correspondingly performing compensation based on results of these tests; electrically disconnect the conducting wire set and the calibration module, and electrically connect the conducting wire set and the probe module; abut the probe module against a DUT; send out electrical signals from the test machine to the probe module to do electrical tests on the DUT.Type: ApplicationFiled: December 2, 2014Publication date: July 30, 2015Applicant: MPI CORPORATIONInventors: WEI-CHENG KU, SHAO-WEI LU, SHOU-JEN TSAI, YU-TSE WANG
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Publication number: 20150204907Abstract: An electrical testing device includes a base having two parallel first rails, a platform provided on the base, a support provided between the first rails, a test arm, a rotary table provided on the test arm, a plurality of holders provided on the rotary table, and a plurality of probe sets respectively provided on the holders. The support has a second rail provided thereon, and is moveable relative to the base and the platform. The test arm is provided on the second rail and above the platform, wherein the test arm is moveable along with the support, and is also movable relative to the support. The rotary table is moveable or rotatable relative to the test arm. The holders are moveable along with the rotary table, and are also moveable or rotatable relative to the rotary table. The probe sets are moveable along with the holders.Type: ApplicationFiled: December 1, 2014Publication date: July 23, 2015Applicant: MPI CORPORATIONInventors: WEI-CHENG KU, SHAO-WEI LU, YA-HUNG LO, SHOU-JEN TSAI