Patents by Inventor Shourya sarcar

Shourya sarcar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11727052
    Abstract: A method of inspecting a component using an image retrieval module includes storing an inspection image file in a memory and identifying a region of interest in the inspection image file. The method further includes accessing a database storing image files and determining feature vectors associated with the image files. The method also includes determining a hash code for each image file based on the feature vectors and classifying a subset of image files as relevant based on the hash codes. The method further includes sorting the subset of image files based on the feature vectors and generating search results based on the sorted subset of image files. The image retrieval module includes a convolutional neural network configured to learn from the determination of the feature vectors and increase the accuracy of the image retrieval module in classifying the image files.
    Type: Grant
    Filed: September 3, 2020
    Date of Patent: August 15, 2023
    Assignee: General Electric Company
    Inventors: Xiao Bian, Bernard Patrick Bewlay, Colin James Parris, Feng Xue, Shaopeng Liu, Arpit Jain, Shourya Sarcar
  • Patent number: 11301977
    Abstract: An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: April 12, 2022
    Assignee: General Electric Company
    Inventors: Alberto Santamaria-Pang, Yousef Al-Kofahi, Aritra Chowdhury, Shourya Sarcar, Michael John MacDonald, Peter Arjan Wassenaar, Patrick Joseph Howard, Bruce Courtney Amm, Eric Seth Moderbacher
  • Publication number: 20220067082
    Abstract: A method of inspecting a component using an image retrieval module includes storing an inspection image file in a memory and identifying a region of interest in the inspection image file. The method further includes accessing a database storing image files and determining feature vectors associated with the image files. The method also includes determining a hash code for each image file based on the feature vectors and classifying a subset of image files as relevant based on the hash codes. The method further includes sorting the subset of image files based on the feature vectors and generating search results based on the sorted subset of image files. The image retrieval module includes a convolutional neural network configured to learn from the determination of the feature vectors and increase the accuracy of the image retrieval module in classifying the image files.
    Type: Application
    Filed: September 3, 2020
    Publication date: March 3, 2022
    Inventors: Xiao Bian, Bernard Patrick Bewlay, Colin James Parris, Feng Xue, Shaopeng Liu, Arpit Jain, Shourya Sarcar
  • Publication number: 20210319544
    Abstract: An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.
    Type: Application
    Filed: April 10, 2020
    Publication date: October 14, 2021
    Inventors: Alberto Santamaria-Pang, Yousef Al-Kofahi, Aritra Chowdhury, Shourya Sarcar, Michael John MacDonald, Peter Arjan Wassenaar, Patrick Joseph Howard, Bruce Courtney Amm, Eric Seth Moderbacher
  • Publication number: 20080040460
    Abstract: A method of communicating in a communication system and the communication system are provided. The communication system comprises at least one imaging station with multiple network interfaces. Each network interface of the imaging station is identified with a network address. The method comprises steps of selecting a first network interface available for communication in an imaging station and configuring the imaging station to communicate via the first network interface. The method further comprises a step of communicating at least one imaging data from the imaging station via the first network interface.
    Type: Application
    Filed: June 29, 2006
    Publication date: February 14, 2008
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Vinayakumar Oruvilakott, Shourya sarcar, Smita Singh, Ferry Tamtoro, Ashish Ranjan