Abstract: A method and apparatus for speeding up the start-up process of a crystal oscillator. The energy required for starting oscillations is inserted to the crystal by a stimulus in the form of a time-variant voltage or current pattern, either periodic or aperiodic. The stimulus is stopped after a pre-established period, then the oscillator continues to operate in its normal mode and completes the start-up process significantly faster, compared to a start-up process not comprising the above stimulus.

Abstract: A method for internal calibration of a detector comprising using one or more hardware processors for the following actions. The method comprises an action of receiving a request for internal calibration of a detector comprising a switchable termination resistor (Dicke switch) and connecting electronically one or more internal calibration circuits to the termination resistor. The method comprises an action of applying two or more input voltage signals to the detector from the calibration circuit and measuring two or more output readings from the detector, each output reading corresponding to one of the input voltage signals. The method comprises an action of computing internal calibration coefficients based on the input voltage signals and the output readings. The method comprises an action of storing the internal calibration coefficients on a non-transitory computer-readable storage medium connected to the hardware processor(s) for subsequent calibration of output values from the detector.

Abstract: A method and apparatus for speeding up the start-up process of a crystal oscillator. The energy required for starting oscillations is inserted to the crystal by a stimulus in the form of a time-variant voltage or current pattern, either periodic or aperiodic. The stimulus is stopped after a pre-established period, then the oscillator continues to operate in its normal mode and completes the start-up process significantly faster, compared to a start-up process not comprising the above stimulus.

Abstract: A method for internal calibration of a detector comprising using one or more hardware processors for the following actions. The method comprises an action of receiving a request for internal calibration of a detector comprising a switchable termination resistor (Dicke switch) and connecting electronically one or more internal calibration circuits to the termination resistor. The method comprises an action of applying two or more input voltage signals to the detector from the calibration circuit and measuring two or more output readings from the detector, each output reading corresponding to one of the input voltage signals. The method comprises an action of computing internal calibration coefficients based on the input voltage signals and the output readings. The method comprises an action of storing the internal calibration coefficients on a non-transitory computer-readable storage medium connected to the hardware processor(s) for subsequent calibration of output values from the detector.