Patents by Inventor Shree Nayar
Shree Nayar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10375302Abstract: Imager arrays, array camera modules, and array cameras in accordance with embodiments of the invention utilize pixel apertures to control the amount of aliasing present in captured images of a scene. One embodiment includes a plurality of focal planes, control circuitry configured to control the capture of image information by the pixels within the focal planes, and sampling circuitry configured to convert pixel outputs into digital pixel data. In addition, the pixels in the plurality of focal planes include a pixel stack including a microlens and an active area, where light incident on the surface of the microlens is focused onto the active area by the microlens and the active area samples the incident light to capture image information, and the pixel stack defines a pixel area and includes a pixel aperture, where the size of the pixel apertures is smaller than the pixel area.Type: GrantFiled: October 16, 2017Date of Patent: August 6, 2019Assignee: FotoNation LimitedInventors: Shree Nayar, Kartik Venkataraman, Bedabrata Pain, Dan Lelescu
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Publication number: 20180097993Abstract: Imager arrays, array camera modules, and array cameras in accordance with embodiments of the invention utilize pixel apertures to control the amount of aliasing present in captured images of a scene. One embodiment includes a plurality of focal planes, control circuitry configured to control the capture of image information by the pixels within the focal planes, and sampling circuitry configured to convert pixel outputs into digital pixel data. In addition, the pixels in the plurality of focal planes include a pixel stack including a microlens and an active area, where light incident on the surface of the microlens is focused onto the active area by the microlens and the active area samples the incident light to capture image information, and the pixel stack defines a pixel area and includes a pixel aperture, where the size of the pixel apertures is smaller than the pixel area.Type: ApplicationFiled: October 16, 2017Publication date: April 5, 2018Applicant: FotoNation Cayman LimitedInventors: Shree Nayar, Kartik Venkataraman, Bedabrata Pain, Dan Lelescu
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Patent number: 9794476Abstract: Imager arrays, array camera modules, and array cameras in accordance with embodiments of the invention utilize pixel apertures to control the amount of aliasing present in captured images of a scene. One embodiment includes a plurality of focal planes, control circuitry configured to control the capture of image information by the pixels within the focal planes, and sampling circuitry configured to convert pixel outputs into digital pixel data. In addition, the pixels in the plurality of focal planes include a pixel stack including a microlens and an active area, where light incident on the surface of the microlens is focused onto the active area by the microlens and the active area samples the incident light to capture image information, and the pixel stack defines a pixel area and includes a pixel aperture, where the size of the pixel apertures is smaller than the pixel area.Type: GrantFiled: February 19, 2016Date of Patent: October 17, 2017Assignee: FotoNation Cayman LimitedInventors: Shree Nayar, Kartik Venkataraman, Bedabrata Pain, Dan Lelescu
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Publication number: 20160316140Abstract: Imager arrays, array camera modules, and array cameras in accordance with embodiments of the invention utilize pixel apertures to control the amount of aliasing present in captured images of a scene. One embodiment includes a plurality of focal planes, control circuitry configured to control the capture of image information by the pixels within the focal planes, and sampling circuitry configured to convert pixel outputs into digital pixel data. In addition, the pixels in the plurality of focal planes include a pixel stack including a microlens and an active area, where light incident on the surface of the microlens is focused onto the active area by the microlens and the active area samples the incident light to capture image information, and the pixel stack defines a pixel area and includes a pixel aperture, where the size of the pixel apertures is smaller than the pixel area.Type: ApplicationFiled: February 19, 2016Publication date: October 27, 2016Inventors: Shree Nayar, Kartik Venkataraman, Bedabrata Pain, Dan Lelescu
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Publication number: 20160065945Abstract: Systems and methods for generating structured light are provided. In some embodiments, systems for generating structured light are provided, the systems comprising: a light source that produces light; a scanner that reflects the light onto a scene; and a hardware processor that controls a scanning speed of the scanner, wherein the scanning speed of the scanner is controlled to provide variable light distributions. In some embodiments, methods for generating structured light are provided, the methods comprising: producing light using a light source; reflecting the light onto a scene using a scanner; and controlling a scanning speed of the scanner using a hardware processor, wherein the scanning speed of the scanner is controlled to provide variable light distributions.Type: ApplicationFiled: April 14, 2014Publication date: March 3, 2016Inventors: Qi YIN, Mohit GUPTA, Shree NAYAR
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Patent number: 8717578Abstract: An observing apparatus includes a lighting device for irradiating a surface of a measuring target with light having a first light source distribution, and an imaging section for imaging the surface of the measuring target. Considering a first plane passing through a measurement point, the first light source distribution is set such that: (1) a radiance L11(?) changes in a continuous or stepwise manner according to an angle ?, and (2) the radiance L11(?) is not zero in a local region of a predetermined range of ±? having a point located at a predetermined angle ?c as a center on the first plane when viewed from the measurement point, and the following equation substantially holds for arbitrary a satisfying 0<a??; L11(?c?a)+L11(?c+a)=2×L11(?c).Type: GrantFiled: April 9, 2010Date of Patent: May 6, 2014Assignee: OMRON CorporationInventors: Yasuhiro Ohnishi, Masatoshi Kimachi, Masaki Suwa, Shree Nayar
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Publication number: 20140098266Abstract: Imager arrays, array camera modules, and array cameras in accordance with embodiments of the invention utilize pixel apertures to control the amount of aliasing present in captured images of a scene. One embodiment includes a plurality of focal planes, control circuitry configured to control the capture of image information by the pixels within the focal planes, and sampling circuitry configured to convert pixel outputs into digital pixel data. In addition, the pixels in the plurality of focal planes include a pixel stack including a microlens and an active area, where light incident on the surface of the microlens is focused onto the active area by the microlens and the active area samples the incident light to capture image information, and the pixel stack defines a pixel area and includes a pixel aperture, where the size of the pixel apertures is smaller than the pixel area.Type: ApplicationFiled: December 10, 2013Publication date: April 10, 2014Applicant: Pelican Imaging CorporationInventors: Shree Nayar, Kartik Venkataraman, Bedabrata Pain, Dan Lelescu
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Patent number: 8615125Abstract: A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.Type: GrantFiled: October 8, 2010Date of Patent: December 24, 2013Assignee: Omron CorporationInventors: Yasumoto Mori, Daisuke Mitsumoto, Yasuhiro Ohnishi, Shree Nayar
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Patent number: 8334985Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape beiType: GrantFiled: October 8, 2010Date of Patent: December 18, 2012Assignee: OMRON CorporationInventors: To Sho, Takashi Sakai, Daisuke Mitsumoto, Yasuhiro Ohnishi, Takeshi Kojima, Yasumoto Mori, Shree Nayar
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Publication number: 20120086950Abstract: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape beiType: ApplicationFiled: October 8, 2010Publication date: April 12, 2012Applicant: OMRON CORPORATIONInventors: To Sho, Takashi Sakai, Daisuke Mitsumoto, Yasuhiro Ohnishi, Takeshi Kojima, Yasumoto Mori, Shree Nayar
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Publication number: 20120087566Abstract: A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.Type: ApplicationFiled: October 8, 2010Publication date: April 12, 2012Applicant: OMRON CORPORATIONInventors: Yasumoto Mori, Daisuke Mitsumoto, Yasuhiro Ohnishi, Shree Nayar
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Publication number: 20120044504Abstract: An observing apparatus includes a lighting device for irradiating a surface of a measuring target with light having a first light source distribution, and an imaging section for imaging the surface of the measuring target. Considering a first plane passing through a measurement point, the first light source distribution is set such that: (1) a radiance L11(?) changes in a continuous or stepwise manner according to an angle ?, and (2) the radiance L11(?) is not zero in a local region of a predetermined range of ±? having a point located at a predetermined angle ?c as a center on the first plane when viewed from the measurement point, and the following equation substantially holds for arbitrary a satisfying 0<a??; L11(?c?a)+L11(?c+a)=2×L11(?c).Type: ApplicationFiled: April 9, 2010Publication date: February 23, 2012Applicant: OMRON CORPORATIONInventors: Yasuhiro Ohnishi, Masatoshi Kimachi, Masaki Suwa, Shree Nayar
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Patent number: 8009192Abstract: An optical receiver is arranged at a location in a scene. The optical receiver includes a photo sensor configured to detect spatio-temporal modulated optical signals directed at the scene from a set of spatially dispersed optical transmitters, and to convert the optical signals from each of the optical transmitters to a corresponding electronic signal. The electronic signals can be analyzed to determine geometric properties of the location in the scene.Type: GrantFiled: May 17, 2006Date of Patent: August 30, 2011Assignee: Mitsubishi Electric Research Laboratories, Inc.Inventors: Ramesh Raskar, Hideaki Nii, Jay W. Summet, Yong Zhao, Paul H. Dietz, Jonathan Westhues, Michael Noland, Erich Bruns, Shree Nayar, Vlad Branzoi
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Publication number: 20100259746Abstract: A profilometer for measuring a surface profile of a measuring target has a lighting device for irradiating the measuring target with light, an imaging device for imaging a reflected light from the measuring target, and a normal calculation section for calculating a normal direction of a surface at each position of the measuring target from an imaged image. The lighting device has a light emission region of a predetermined extent. A radiance of center of gravity of a light source distribution of a point symmetric region coincides with a radiance of the center of the point symmetric region in an arbitrary point symmetric region of the light emission region.Type: ApplicationFiled: April 10, 2009Publication date: October 14, 2010Applicant: OMRON CorporationInventors: Yasuhiro Ohnishi, Masatoshi Kimachi, Masaki Suwa, Shree Nayar
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Patent number: 7663640Abstract: Methods and systems are provided for displaying images onto an arbitrary surface, using a projector, such that the quality of the images is preserved despite surface imperfections or color variations. Methods and systems are also provided for controlling the appearance of a projection surface. Various embodiments use a detailed radiometric model and a calibration method to determine the pixel values required to be projected by a projector in order for a camera to observe a desired image. Other embodiments use a compensation algorithm that uses a feedback approach to provide the desired image compensation. Geometric mapping may be used to establish a correspondence between points in the images to be displayed by the projector and the corresponding points in the images that are captured by the camera.Type: GrantFiled: July 2, 2004Date of Patent: February 16, 2010Assignee: The Trustees of Columbia University in the City of New YorkInventors: Shree Nayar, Michael Grossberg, Harish Peri, Peter Belhumeur
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Publication number: 20070285422Abstract: A method and apparatus for determine an effect of direct and global illumination in a scene. A scene is illuminated with spatially varying illumination. A set of images is acquired of the scene, and a direct and global radiance in the set of images is determined.Type: ApplicationFiled: January 17, 2007Publication date: December 13, 2007Inventors: Shree Nayar, Gurunandan Krishnan, Michael Grossberg, Ramesh Raskar
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Publication number: 20070268363Abstract: An optical receiver is arranged at a location in a scene. The optical receiver includes a photo sensor configured to detect spatio-temporal modulated optical signals directed at the scene from a set of spatially dispersed optical transmitters, and to convert the optical signals from each of the optical transmitters to a corresponding electronic signal. The electronic signals can be analyzed to determine geometric properties of the location in the scene.Type: ApplicationFiled: May 17, 2006Publication date: November 22, 2007Inventors: Ramesh Raskar, Hideaki Nii, Jay W. Summet, Yong Zhao, Paul H. Dietz, Jonathan Westhues, Michael Noland, Erich Bruns, Shree Nayar, Vlad Branzoi
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Publication number: 20070081815Abstract: Imaging devices and methods are provided. In some embodiments, a device includes a light modulator layer having a plurality of elements, each having a controllable transmittance, and a plurality of lenses, wherein each of the plurality of lenses is disposed to receive light independently of each other. The device further includes an image detector disposed at a distance from the light modulator layer and configured to acquire images from light that passes through the light modulator layer. In addition, the device includes a controller configured to control transmittance of the elements of the light modulator layer. Methods of acquiring images are also provided.Type: ApplicationFiled: May 4, 2006Publication date: April 12, 2007Applicant: THE TRUSTEES OF COLUMBIA UNIVERSITYInventors: Asaf Zomet, Shree Nayar
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Publication number: 20070081200Abstract: Embodiments of the present invention provide a lensless optical device for acquiring an image. The device can include a light attenuating layer having a plurality of elements, where transmittance of each of the plurality of elements is controllable, and an image detector disposed at a distance from the light attenuating layer, the image detector configured to acquire an image with light that passes through the light attenuating layer. The device also can include a light attenuating layer controller configured to simultaneously control transmittance of each of the plurality of elements independent of each other. Methods of detecting and tracking an object in a scene are also disclosed.Type: ApplicationFiled: March 16, 2006Publication date: April 12, 2007Applicant: Columbia UniversityInventors: Asaf Zomet, Shree Nayar
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Publication number: 20070053671Abstract: Systems and methods for reducing the visibility of rain in acquired images are provided. One or more inputs relating the scene desired to be acquired by the user are used to retrieve camera settings that will reduce the visibility of rain in acquired images. Additionally, features relating to the scene may be automatically determined and used alone, or in combination with user inputs, to retrieve camera settings. The acquired images may be part of a video. Another feature of the invention is its use as a rain gauge. The camera settings are adjusted to enhance the visibility of rain, then one ore more images are acquired and analyzed for the amount and size of raindrops. From this analysis the rain rate can be determined.Type: ApplicationFiled: March 16, 2006Publication date: March 8, 2007Inventors: Kshitiz Garg, Shree Nayar