Patents by Inventor Shreekant Gayaka

Shreekant Gayaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11948061
    Abstract: Implementations described herein generally relate to a method for detecting anomalies in time-series traces received from sensors of manufacturing tools. A server feeds a set of training time-series traces to a neural network configured to derive a model of the training time-series traces that minimizes reconstruction error of the training time-series traces. The server extracts a set of input time-series traces from one or more sensors associated with one or more manufacturing tools configured to produce a silicon substrate. The server feeds the set of input time-series traces to the trained neural network to produce a set of output time series traces reconstructed based on the model. The server calculates a mean square error between a first input time series trace of the set of input time series traces and a corresponding first output time series trace of the set of output time-series traces.
    Type: Grant
    Filed: January 6, 2023
    Date of Patent: April 2, 2024
    Assignee: Applied Materials, Inc.
    Inventors: Heng Hao, Sreekar Bhaviripudi, Shreekant Gayaka
  • Patent number: 11927963
    Abstract: A physical space contains stationary objects that do not move over time (e.g., a couch) and may have non-stationary objects that do move over time (e.g., people and pets). An autonomous mobile device (AMD) determines and uses an occupancy map of stationary objects to find a route from one point to another in a physical space. Non-stationary objects are detected and prevented from being incorrectly added to the occupancy map. Point cloud data is processed to determine first candidate objects. Image data is processed to determine second candidate objects. These candidate objects are associated with each other and their characteristics assessed to determine if the candidate objects are stationary or non-stationary. The occupancy map is updated with stationary obstacles. During navigation, the occupancy map may be used for route planning while the non-stationary objects are used for local avoidance.
    Type: Grant
    Filed: March 19, 2021
    Date of Patent: March 12, 2024
    Assignee: AMAZON TECHNOLOGIES, INC.
    Inventors: Shreekant Gayaka, Boshen Niu, Simon Edwards-Parton
  • Patent number: 11810345
    Abstract: An autonomous mobile device (AMD) that interacts with a user operates more effectively with reliable information about that user's pose. Occlusion due to obstacles or sensor field-of-view limits may prevent a sensor from “seeing” a user's torso or lower body while the face may remain visible. Face orientation alone produces unreliable results because a user frequently moves their head. Sensor data is acquired over time and used to determine face and body poses, with each pose representing a location and orientation in physical space of that portion of the user. A transform is determined that represents the relative arrangement of a face pose and a body pose at a particular time. If available, the body pose may be used as the user's pose. If the body pose is unavailable or unreliable at a given time, it may be inferred by applying the previously determined transform to the current face pose.
    Type: Grant
    Filed: October 4, 2021
    Date of Patent: November 7, 2023
    Assignee: AMAZON TECHNOLOGIES, INC.
    Inventors: Shreekant Gayaka, Menghan Zhang
  • Publication number: 20230153574
    Abstract: Implementations described herein generally relate to a method for detecting anomalies in time-series traces received from sensors of manufacturing tools. A server feeds a set of training time-series traces to a neural network configured to derive a model of the training time-series traces that minimizes reconstruction error of the training time-series traces. The server extracts a set of input time-series traces from one or more sensors associated with one or more manufacturing tools configured to produce a silicon substrate. The server feeds the set of input time-series traces to the trained neural network to produce a set of output time series traces reconstructed based on the model. The server calculates a mean square error between a first input time series trace of the set of input time series traces and a corresponding first output time series trace of the set of output time-series traces.
    Type: Application
    Filed: January 6, 2023
    Publication date: May 18, 2023
    Inventors: Heng HAO, Sreekar BHAVIRIPUDI, Shreekant GAYAKA
  • Patent number: 11568198
    Abstract: Implementations described herein generally relate to a method for detecting anomalies in time-series traces received from sensors of manufacturing tools. A server feeds a set of training time-series traces to a neural network configured to derive a model of the training time-series traces that minimizes reconstruction error of the training time-series traces. The server extracts a set of input time-series traces from one or more sensors associated with one or more manufacturing tools configured to produce a silicon substrate. The server feeds the set of input time-series traces to the trained neural network to produce a set of output time series traces reconstructed based on the model. The server calculates a mean square error between a first input time series trace of the set of input time series traces and a corresponding first output time series trace of the set of output time-series traces.
    Type: Grant
    Filed: August 20, 2019
    Date of Patent: January 31, 2023
    Assignee: APPLIED MATERIALS, INC.
    Inventors: Heng Hao, Sreekar Bhaviripudi, Shreekant Gayaka
  • Publication number: 20220300001
    Abstract: A physical space contains stationary objects that do not move over time (e.g., a couch) and may have non-stationary objects that do move over time (e.g., people and pets). An autonomous mobile device (AMD) determines and uses an occupancy map of stationary objects to find a route from one point to another in a physical space. Non-stationary objects are detected and prevented from being incorrectly added to the occupancy map. Point cloud data is processed to determine first candidate objects. Image data is processed to determine second candidate objects. These candidate objects are associated with each other and their characteristics assessed to determine if the candidate objects are stationary or non-stationary. The occupancy map is updated with stationary obstacles. During navigation, the occupancy map may be used for route planning while the non-stationary objects are used for local avoidance.
    Type: Application
    Filed: March 19, 2021
    Publication date: September 22, 2022
    Inventors: SHREEKANT GAYAKA, BOSHEN NIU, SIMON EDWARDS-PARTON
  • Publication number: 20200082245
    Abstract: Implementations described herein generally relate to a method for detecting anomalies in time-series traces received from sensors of manufacturing tools. A server feeds a set of training time-series traces to a neural network configured to derive a model of the training time-series traces that minimizes reconstruction error of the training time-series traces. The server extracts a set of input time-series traces from one or more sensors associated with one or more manufacturing tools configured to produce a silicon substrate. The server feeds the set of input time-series traces to the trained neural network to produce a set of output time series traces reconstructed based on the model. The server calculates a mean square error between a first input time series trace of the set of input time series traces and a corresponding first output time series trace of the set of output time-series traces.
    Type: Application
    Filed: August 20, 2019
    Publication date: March 12, 2020
    Inventors: Heng HAO, Sreekar BHAVIRIPUDI, Shreekant GAYAKA
  • Patent number: 10504006
    Abstract: A method of classifying substrates with a metrology tool is herein disclosed. The method begins by training a deep learning framework using convolutional neural networks with a training dataset for classifying image dataset. Obtaining a new image from the meteorology tool. Running the new image through the deep learning framework to classify the new image.
    Type: Grant
    Filed: July 25, 2019
    Date of Patent: December 10, 2019
    Assignee: APPLIED MATERIALS, INC.
    Inventors: Sreekar Bhaviripudi, Shreekant Gayaka
  • Publication number: 20190347527
    Abstract: A method of classifying substrates with a metrology tool is herein disclosed. The method begins by training a deep learning framework using convolutional neural networks with a training dataset for classifying image dataset. Obtaining a new image from the meteorology tool. Running the new image through the deep learning framework to classify the new image.
    Type: Application
    Filed: July 25, 2019
    Publication date: November 14, 2019
    Inventors: Sreekar BHAVIRIPUDI, Shreekant GAYAKA
  • Patent number: 10387755
    Abstract: A method of classifying substrates with a metrology tool is herein disclosed. The method begins by training a deep learning framework using convolutional neural networks with a training dataset for classifying image dataset. Obtaining a new image from the meteorology tool. Running the new image through the deep learning framework to classify the new image.
    Type: Grant
    Filed: June 28, 2017
    Date of Patent: August 20, 2019
    Assignee: Applied Materials, Inc.
    Inventors: Sreekar Bhaviripudi, Shreekant Gayaka
  • Patent number: 10312065
    Abstract: A method, apparatus and system for controlling the processing of a substrate within a process chamber are described herein. In some embodiments, a method of controlling a substrate process within a process chamber includes determining a position of a moveable magnetron in the process chamber relative to a reference location on a surface of the substrate and modulating a power parameter of at least one power supply affecting substrate processing based on the determined position of the magnetron to control, for example, at least one of a deposition rate or an etching rate of the substrate processing. In one embodiment, the modulated power parameter is a power set point of at least one of a direct current (DC) source power, a radio frequency (RF) bias power, a DC shield bias voltage, or an electromagnetic coil current of the at least one power supply.
    Type: Grant
    Filed: October 11, 2016
    Date of Patent: June 4, 2019
    Assignee: APPLIED MATERIALS, INC.
    Inventors: Martin Lee Riker, Keith A. Miller, Shreekant Gayaka, Carl R. Johnson
  • Publication number: 20190005357
    Abstract: A method of classifying substrates with a metrology tool is herein disclosed. The method begins by training a deep learning framework using convolutional neural networks with a training dataset for classifying image dataset. Obtaining a new image from the meteorology tool. Running the new image through the deep learning framework to classify the new image.
    Type: Application
    Filed: June 28, 2017
    Publication date: January 3, 2019
    Inventors: Sreekar BHAVIRIPUDI, Shreekant GAYAKA
  • Publication number: 20180025895
    Abstract: A method, apparatus and system for controlling the processing of a substrate within a process chamber are described herein. In some embodiments, a method of controlling a substrate process within a process chamber includes determining a position of a moveable magnetron in the process chamber relative to a reference location on a surface of the substrate and modulating a power parameter of at least one power supply affecting substrate processing based on the determined position of the magnetron to control, for example, at least one of a deposition rate or an etching rate of the substrate processing. In one embodiment, the modulated power parameter is a power set point of at least one of a direct current (DC) source power, a radio frequency (RF) bias power, a DC shield bias voltage, or an electromagnetic coil current of the at least one power supply.
    Type: Application
    Filed: October 11, 2016
    Publication date: January 25, 2018
    Inventors: Martin Lee RIKER, Keith A. MILLER, Shreekant GAYAKA, Carl R. JOHNSON
  • Patent number: 9147418
    Abstract: A disk drive is disclosed comprising a head, a disk surface comprising servo information, and a dual stage actuator (DSA) servo loop comprising a voice coil motor (VCM) servo loop comprising a VCM and a microactuator servo loop comprising a microactuator operable to actuate the head over the disk surface. A position error signal (PES) is generated based on the servo information, and a first control signal is generated based on the PES. The first control signal is adjusted based on a function of the first control signal to generate a second control signal that compensates for a gain variation of the microactuator, and the microactuator is controlled based on the second control signal.
    Type: Grant
    Filed: June 20, 2013
    Date of Patent: September 29, 2015
    Assignee: Western Digital Technologies, Inc.
    Inventors: Shreekant Gayaka, Min Chen, Young-Hoon Kim, Wei Xi
  • Patent number: 8780489
    Abstract: A disk drive is disclosed comprising a head, a disk surface, and a dual stage actuator (DSA) servo loop comprising a voice coil motor (VCM) servo loop comprising a VCM and a microactuator servo loop comprising a microactuator operable to actuate the head over the disk surface. A microactuator compensator processes a position error signal (PES) to generate a first control signal, and a disturbance sinusoid is injected into the first control signal to generate a second control signal, wherein the microactuator is controlled in response to the second control signal. Feed-forward compensation is generated corresponding to the injected disturbance sinusoid, and a third control signal is generated in response to the PES and the feed-forward compensation, wherein the VCM is controlled in response to the third control signal. A gain of the microactuator is estimated in response to the feed-forward compensation.
    Type: Grant
    Filed: November 20, 2012
    Date of Patent: July 15, 2014
    Assignee: Western Digital Technologies, Inc.
    Inventors: Shreekant Gayaka, Min Chen