Patents by Inventor Shreesh Narasimha
Shreesh Narasimha has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7091128Abstract: A method for forming a CMOS device in a manner so as to avoid dielectric layer undercut during a pre-silicide cleaning step is described. During formation of CMOS device comprising a gate stack on a semiconductor substrate surface, the patterned gate stack including gate dielectric below a conductor with vertical sidewalls, a dielectric layer is formed thereover and over the substrate surfaces. Respective nitride spacer elements overlying the dielectric layer are formed at each vertical sidewall. The dielectric layer on the substrate surface is removed using an etch process such that a portion of the dielectric layer underlying each spacer remains. Then, a nitride layer is deposited over the entire sample (the gate stack, the spacer elements at each gate sidewall, and substrate surfaces) and subsequently removed by an etch process such that only a portion of said nitride film (the “plug”) remains.Type: GrantFiled: November 4, 2005Date of Patent: August 15, 2006Assignee: International Business Machines CorporationInventors: Atul C. Ajmera, Andres Bryant, Percy V. Gilbert, Michael A. Gribelyuk, Edward P. Maciejewski, Renee T. Mo, Shreesh Narasimha
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Patent number: 7071072Abstract: Shallow trench isolation structures are formed without CMP by depositing a thick pad nitride and depositing oxide trench fill material such that: a) the material in the trenches is above the silicon surface by a process margin that allows for removal of trench fill in subsequent front end steps so that the final trench fill level is substantially coplanar with the silicon; and b) the oxide on the interior walls is easily removed, so that the pad nitride is removed in a wet etch.Type: GrantFiled: June 11, 2004Date of Patent: July 4, 2006Assignee: International Business Machines CorporationInventors: Renee T. Mo, Shreesh Narasimha
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Publication number: 20060128145Abstract: The present invention provides a semiconductor device having dual silicon nitride liners and a reformed silicide layer and related methods for the manufacture of such a device. The reformed silicide layer has a thickness and resistance substantially similar to a silicide layer not exposed to the formation of the dual silicon nitride liners. A first aspect of the invention provides a method for use in the manufacture of a semiconductor device comprising the steps of applying a first silicon nitride liner to a silicide layer, removing a portion of the first silicon nitride liner, reforming a portion of the silicide layer removed during the removal step, and applying a second silicon nitride liner to the silicide layer.Type: ApplicationFiled: December 10, 2004Publication date: June 15, 2006Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Dureseti Chidambarrao, Ying Li, Rajeev Malik, Shreesh Narasimha
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Publication number: 20060128086Abstract: The present invention provides a semiconductor device having dual nitride liners, a silicide layer, and a protective layer beneath one of the nitride liners for preventing the etching of the silicide layer. A first aspect of the invention provides a method for use in the manufacture of a semiconductor device comprising the steps of applying a protective layer to a device, applying a first silicon nitride liner to the device, removing a portion of the first silicon nitride liner, removing a portion of the protective layer, and applying a second silicon nitride liner to the device.Type: ApplicationFiled: December 10, 2004Publication date: June 15, 2006Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Dureseti Chidambarrao, Ying Li, Rajeev Malik, Shreesh Narasimha
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Publication number: 20060128091Abstract: The present invention provides a semiconductor device having dual nitride liners, which provide an increased transverse stress state for at least one FET and methods for the manufacture of such a device. A first aspect of the invention provides a method for use in the manufacture of a semiconductor device comprising the steps of applying a first silicon nitride liner to the device and applying a second silicon nitride liner adjacent the first silicon nitride liner, wherein at least one of the first and second silicon nitride liners induces a transverse stress in a silicon channel beneath at least one of the first and second silicon nitride liner.Type: ApplicationFiled: December 10, 2004Publication date: June 15, 2006Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Dureseti Chidambarrao, Ying Li, Rajeev Malik, Shreesh Narasimha, Haining Yang, Huilong Zhu
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Publication number: 20060057797Abstract: A method for forming a CMOS device in a manner so as to avoid dielectric layer undercut during a pre-silicide cleaning step is described. During formation of CMOS device comprising a gate stack on a semiconductor substrate surface, the patterned gate stack including gate dielectric below a conductor with vertical sidewalls, a dielectric layer is formed thereover and over the substrate surfaces. Respective nitride spacer elements overlying the dielectric layer are formed at each vertical sidewall. The dielectric layer on the substrate surface is removed using an etch process such that a portion of the dielectric layer underlying each spacer remains. Then, a nitride layer is deposited over the entire sample (the gate stack, the spacer elements at each gate sidewall, and substrate surfaces) and subsequently removed by an etch process such that only a portion of said nitride film (the “plug”) remains.Type: ApplicationFiled: November 4, 2005Publication date: March 16, 2006Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Atul Ajmera, Andres Bryant, Percy Gilbert, Michael Gribelyuk, Edward Maciejewski, Renee Mo, Shreesh Narasimha
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Publication number: 20060040497Abstract: Stress level of a nitride film is adjusted as a function of two or more of the following: identity of a starting material precursor used to make the nitride film; identity of a nitrogen-containing precursor with which is treated the starting material precursor; ratio of the starting material precursor to the nitrogen-containing precursor; a set of CVD conditions under which the film is grown; and/or a thickness to which the film is grown. A rapid thermal chemical vapor deposition (RTCVD) film produced by reacting a compound containing silicon, nitrogen and carbon (such as bis-tertiary butyl amino silane (BTBAS)) with NH3 can provide advantageous properties, such as high stress and excellent performance in an etch-stop application. An ammonia-treated BTBAS film is particularly excellent in providing a high-stress property, and further having maintainability of that high-stress property over repeated annealing.Type: ApplicationFiled: October 20, 2005Publication date: February 23, 2006Inventors: Ashima Chakravarti, Shreesh Narasimha, Victor Chan, Judson Holt, Satya Chakravarti
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Patent number: 7001844Abstract: Stress level of a nitride film is adjusted as a function of two or more of the following: identity of a starting material precursor used to make the nitride film; identity of a nitrogen-containing precursor with which is treated the starting material precursor; ratio of the starting material precursor to the nitrogen-containing precursor; a set of CVD conditions under which the film is grown; and/or a thickness to which the film is grown. A rapid thermal chemical vapor deposition (RTCVD) film produced by reacting a compound containing silicon, nitrogen and carbon (such as bis-tertiary butyl amino silane (BTBAS)) with NH3 can provide advantageous properties, such as high stress and excellent performance in an etch-stop application. An ammonia-treated BTBAS film is particularly excellent in providing a high-stress property, and further having maintainability of that high-stress property over repeated annealing.Type: GrantFiled: April 30, 2004Date of Patent: February 21, 2006Assignee: International Business Machines CorporationInventors: Ashima B. Chakravarti, Shreesh Narasimha, Victor Chan, Judson Holt, Satya N. Chakravarti
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Patent number: 6991979Abstract: A method for forming a CMOS device in a manner so as to avoid dielectric layer undercut during a pre-silicide cleaning step is described. During formation of CMOS device comprising a gate stack on a semiconductor substrate surface, the patterned gate stack including gate dielectric below a conductor with vertical sidewalls, a dielectric layer is formed thereover and over the substrate surfaces. Respective nitride spacer elements overlying the dielectric layer are formed at each vertical sidewall. The dielectric layer on the substrate surface is removed using an etch process such that a portion of the dielectric layer underlying each spacer remains. Then, a nitride layer is deposited over the entire sample (the gate stack, the spacer elements at each gate sidewall, and substrate surfaces) and subsequently removed by an etch process such that only a portion of said nitride film (the “plug”) remains.Type: GrantFiled: September 22, 2003Date of Patent: January 31, 2006Assignee: International Business Machines CorporationInventors: Atul C. Ajmera, Andres Bryant, Percy V. Gilbert, Michael A Gribelyuk, Edward P. Maciejewski, Renee T. Mo, Shreesh Narasimha
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Publication number: 20050287823Abstract: A silicon nitride spacer material for use in forming a PFET device and a method for making the spacer includes the use of a dual-frequency plasma enhanced CVD process wherein the temperature is in the range depositing a silicon nitride layer by means of a low-temperature dual-frequency plasma enhanced CVD process, at a temperature in the range 400° C. to 550° C. The process pressure is in the range 2 Torr to 5 Torr. The low frequency power is in the range 0 W to 50 W, and the high frequency power is in the range 90 W to 110 W. The precursor gases of silane, ammonia and nitrogen flow at flow rates in the ratio 240:3200:4000 sccm. The use of the silicon nitride spacer of the invention to form a PFET device having a dual spacer results in a 10%-15% performance improvement compared to a similar PFET device having a silicon nitride spacer formed by a RTCVD process.Type: ApplicationFiled: June 29, 2004Publication date: December 29, 2005Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Ravikumar Ramachandran, James Kelliher, Shreesh Narasimha, Jeffrey Sleight
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Publication number: 20050277263Abstract: Shallow trench isolation structures are formed without CMP by depositing a thick pad nitride and depositing oxide trench fill material such that: a) the material in the trenches is above the silicon surface by a process margin that allows for removal of trench fill in subsequent front end steps so that the final trench fill level is substantially coplanar with the silicon; and b) the oxide on the interior walls is easily removed, so that the pad nitride is removed in a wet etch.Type: ApplicationFiled: June 11, 2004Publication date: December 15, 2005Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Renee Mo, Shreesh Narasimha
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Publication number: 20050245081Abstract: Stress level of a nitride film is adjusted as a function of two or more of the following: identity of a starting material precursor used to make the nitride film; identity of a nitrogen-containing precursor with which is treated the starting material precursor; ratio of the starting material precursor to the nitrogen-containing precursor; a set of CVD conditions under which the film is grown; and/or a thickness to which the film is grown. A rapid thermal chemical vapor deposition (RTCVD) film produced by reacting a compound containing silicon, nitrogen and carbon (such as bis-tertiary butyl amino silane (BTBAS)) with NH3 can provide advantageous properties, such as high stress and excellent performance in an etch-stop application. An ammonia-treated BTBAS film is particularly excellent in providing a high-stress property, and further having maintainability of that high-stress property over repeated annealing.Type: ApplicationFiled: April 30, 2004Publication date: November 3, 2005Inventors: Ashima Chakravarti, Shreesh Narasimha, Victor Chan, Judson Holt, Satya Chakravarti
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Publication number: 20050236687Abstract: Methods of forming a strained Si-containing hybrid substrate are provided as well as the strained Si-containing hybrid substrate formed by the methods. In the methods of the present invention, a strained Si layer is formed overlying a regrown semiconductor material, a second semiconducting layer, or both. In accordance with the present invention, the strained Si layer has the same crystallographic orientation as either the regrown semiconductor layer or the second semiconducting layer. The methods provide a hybrid substrate in which at least one of the device layers includes strained Si.Type: ApplicationFiled: April 22, 2004Publication date: October 27, 2005Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Kevin Chan, Bruce Doris, Kathryn Guarini, Meikei Ieong, Shreesh Narasimha, Alexander Reznicek, Kern Rim, Devendra Sadana, Leathen Shi, Jeffrey Sleight, Min Yang
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Publication number: 20050064635Abstract: A method for forming a CMOS device in a manner so as to avoid dielectric layer undercut during a pre-silicide cleaning step is described. During formation of CMOS device comprising a gate stack on a semiconductor substrate surface, the patterned gate stack including gate dielectric below a conductor with vertical sidewalls, a dielectric layer is formed thereover and over the substrate surfaces. Respective nitride spacer elements overlying the dielectric layer are formed at each vertical sidewall. The dielectric layer on the substrate surface is removed using an etch process such that a portion of the dielectric layer underlying each spacer remains. Then, a nitride layer is deposited over the entire sample (the gate stack, the spacer elements at each gate sidewall, and substrate surfaces) and subsequently removed by an etch process such that only a portion of said nitride film (the “plug”) remains.Type: ApplicationFiled: September 22, 2003Publication date: March 24, 2005Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Atul Ajmera, Andres Bryant, Percy Gilbert, Michael Gribelyuk, Edward Maciejewski, Renee Mo, Shreesh Narasimha
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Publication number: 20040256700Abstract: An integrated semiconductor structure containing at least one device formed upon a first crystallographic surface that is optimal for that device, while another device is formed upon a second different crystallographic surface that is optimal for the other device is provided. The method of forming the integrated structure includes providing a bonded substrate including at least a first semiconductor layer of a first crystallographic orientation and a second semiconductor layer of a second different crystallographic orientation. A portion of the bonded substrate is protected to define a first device area, while another portion of the bonded substrate is unprotected. The unprotected portion of the bonded substrate is then etched to expose a surface of the second semiconductor layer and a semiconductor material is regrown on the exposed surface. Following planarization, a first semiconductor device is formed in the first device region and a second semiconductor device is formed on the regrown material.Type: ApplicationFiled: June 17, 2003Publication date: December 23, 2004Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Bruce B. Doris, Kathryn W. Guarini, Meikei Ieong, Shreesh Narasimha, Kern Rim, Jeffrey W. Sleight, Min Yang
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Patent number: 6825102Abstract: A method in which a defective semiconductor crystal material is subjected to an amorphization step followed by a thermal treatment step is provided. The amorphization step amorphizes, partially or completely, a region, including the surface region, of a defective semiconductor crystal material. A thermal treatment step is next performed so as to recrystallize the amorphized region of the defective semiconductor crystal material. The recrystallization is achieved in the present invention by solid-phase crystal regrowth from the non-amorphized region of the defective semiconductor crystal material.Type: GrantFiled: September 18, 2003Date of Patent: November 30, 2004Assignee: International Business Machines CorporationInventors: Stephen W. Bedell, Keith E. Fogel, Shreesh Narasimha, Devendra K. Sadana
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Publication number: 20040188766Abstract: The present invention relates to a Complementary Metal Oxide Semiconductor (CMOS) device having a lower external resistance and a method for manufacturing the CMOS device. The inventive MOSFET is produced by forming first suicide regions in a substrate as well as atop surface of a gate region and forming second silicide regions where second silicide thickness is greater than the first silicide thickness. The inventive method produces a low resistance first silicide in close proximity to the channel region of the device, where the incorporation of the first silicide decreases the external resistance of the device while the incorporation of the second silicide produces low sheet resistance interconnects.Type: ApplicationFiled: January 23, 2004Publication date: September 30, 2004Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Shreesh Narasimha, Patricia A. O'Neil
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Publication number: 20040188765Abstract: The present invention relates to a Complementary Metal Oxide Semiconductor (CMOS) device having a lower external resistance and a method for manufacturing the CMOS device. The inventive MOSFET is produced by forming first silicide regions in a substrate as well as atop surface of a gate region and forming second silicide regions where second silicide thickness is greater than the first silicide thickness. The inventive method produces a low resistance first silicide in close proximity to the channel region of the device, where the incorporation of the first silicide decreases the external resistance of the device while the incorporation of the second silicide produces low sheet resistance interconnects.Type: ApplicationFiled: March 28, 2003Publication date: September 30, 2004Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Shreesh Narasimha, Patricia A. O'Neil
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Publication number: 20040110351Abstract: A method of manufacturing a semiconductor device comprises implanting at an angle of about 20 to about 70 degrees a first halo dose of a dopant about a first portion of a perimeter of a source extension implant or a drain extension implant, wherein the first portion comprises a near channel region; and implanting at an angle of about 0 to about 20 degrees a second halo dose of the dopant about a second portion of the perimeter of the source extension implant or the drain extension implant, wherein the second portion is substantially free of the first portion, and wherein the angles are measured with respect to a vertical axis through the semiconductor device.Type: ApplicationFiled: December 5, 2002Publication date: June 10, 2004Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventor: Shreesh Narasimha