Abstract: An optical assembly may include an optical element comprising a first surface. An optical assembly may include a mount comprising a first surface. An optical assembly may include a first transmissive layer. An optical assembly may include a first adhesive layer disposed between a first surface of the first transmissive layer and the first surface of the optical element. An optical assembly may include a second adhesive layer disposed between a second surface of the first transmissive layer and the first surface of the mount, wherein the first transmissive layer is configured to transmit illumination to the first adhesive layer and the second adhesive layer to cure the first adhesive layer and the second adhesive layer.

Abstract: A system includes an optical source configured to emit a pulsed light beam, the optical source comprising one or more chambers, each of the one or more chambers configured to hold a gaseous gain medium, the gaseous gain medium being associated with an assumed gas life; at least one detection module configured to: receive and analyze data related to the pulsed light beam, and produce a beam quality metric based on the data related to the pulsed light beam; and a monitoring module configured to: analyze the beam quality metric, determine a health status of the gaseous gain medium based on the analysis of the beam quality metric, and produce a status signal based on the determined health status, the status signal indicating whether to extend use of the gaseous gain medium beyond the assumed gas life or to end use of the gaseous gain medium.

Abstract: An apparatus includes a vacuum chamber, a first component, a second component that is movable relative to the first component, and a gas injector. The vacuum chamber includes a first vacuum zone and a second vacuum zone. The first component is disposed in the first vacuum zone at an interface with the second vacuum zone. The second component is disposed in the second vacuum zone at the interface and separated from the first component by a gap. The gas injector is configured to inject a buffer gas in the gap between the first component and the second component from at least one hole in at least one of the first component and the second component. The buffer gas provides a dynamic seal between the first vacuum zone and the second vacuum zone during movement of the second component relative to the first component.

Abstract: Aspects of the present disclosure include methods for determining a parameter of a photodetector (e.g., a photodetector in a particle analyzer). Methods according to certain embodiments include irradiating a photodetector positioned in a particle analyzer with a light source (e.g., a continuous wave light source) at a first intensity for a first predetermined time interval, irradiating the photodetector with the light source at a second intensity for a second predetermined time interval, integrating data signals from the photodetector over a period of time that includes the first predetermined interval and the second predetermined interval and determining one or more parameters of the photodetector based on the integrated data signals. Systems (e.g., particle analyzers) having light source and a photodetector for practicing the subject methods are also described.

Abstract: Aspects of the present disclosure include methods for adjusting sensitivity of a photodiode in a light detection system. Methods according to certain embodiments include determining a background data signal from a photodetector at a plurality of detector gains, irradiating the photodetector with a light source at a plurality of different light intensities, generating data signals from the photodetector for the plurality of light intensities at each detector gain and adjusting the photodetector to the detector gain that corresponds to the lowest light irradiation intensity that generates a data signal resolvable from the background data signal. Systems (e.g., particle analyzers) having a light source and a light detection system that includes a photodetector for practicing the subject methods are also described. Non-transitory computer readable storage medium are also provided.

Abstract: Aspects of the present disclosure include methods for determining a parameter of a photodetector (e.g., a photodetector in a particle analyzer). Methods according to certain embodiments include irradiating a photodetector positioned in a particle analyzer with a light source (e.g., a continuous wave light source) at a first intensity for a first predetermined time interval, irradiating the photodetector with the light source at a second intensity for a second predetermined time interval, integrating data signals from the photodetector over a period of time that includes the first predetermined interval and the second predetermined interval and determining one or more parameters of the photodetector based on the integrated data signals. Systems (e.g., particle analyzers) having light source and a photodetector for practicing the subject methods are also described.

Abstract: Aspects of the present disclosure include methods for determining photodetector gain for a plurality of photodetectors in a light detection system. Methods according to certain embodiments include applying a reference voltage to each photodetector in the light detection system, generating a reference data signal for each photodetector at the reference voltage, irradiating with a light source the photodetectors at a plurality of different applied voltages, generating output data signals for each photodetector at each of the plurality of different voltages and calculating gain of the photodetectors at each of the plurality of different applied voltages based on the output data signals for each photodetector at each applied voltage and the reference data signal. Systems (e.g., particle analyzers) having a light source and a light detection system that includes a plurality of photodetectors for practicing the subject methods are also described. Non-transitory computer readable storage medium are also provided.

Abstract: Aspects of the present disclosure include methods for determining a parameter of a photodetector (e.g., a photodetector in a particle analyzer). Methods according to certain embodiments include irradiating a photodetector positioned in a particle analyzer with a light source (e.g., a continuous wave light source) at a first intensity for a first predetermined time interval, irradiating the photodetector with the light source at a second intensity for a second predetermined time interval, integrating data signals from the photodetector over a period of time that includes the first predetermined interval and the second predetermined interval and determining one or more parameters of the photodetector based on the integrated data signals. Systems (e.g., particle analyzers) having light source and a photodetector for practicing the subject methods are also described.

Abstract: Aspects of the present disclosure include methods for determining a parameter of a photodetector (e.g., a photodetector in a particle analyzer). Methods according to certain embodiments include detecting light from a light source with a photodetector for a first predetermined time interval, detecting a step signal with the photodetector, the step signal indicating a change in a parameter of the light source or a parameter of the photodetector, detecting light from the light source for a second predetermined time interval, integrating data signals over the first predetermined time interval and the second predetermined time interval and determining one or more parameters of the photodetector based on the integrated data signals. Systems (e.g., particle analyzers) having a light source and a photodetector for practicing the subject methods are also described.

Abstract: Aspects of the present disclosure include methods for adjusting sensitivity of a photodiode in a light detection system. Methods according to certain embodiments include determining a background data signal from a photodetector at a plurality of detector gains, irradiating the photodetector with a light source at a plurality of different light intensities, generating data signals from the photodetector for the plurality of light intensities at each detector gain and adjusting the photodetector to the detector gain that corresponds to the lowest light irradiation intensity that generates a data signal resolvable from the background data signal. Systems (e.g., particle analyzers) having a light source and a light detection system that includes a photodetector for practicing the subject methods are also described. Non-transitory computer readable storage medium are also provided.

Abstract: Aspects of the present disclosure include methods for determining a parameter of a photodetector (e.g., a photodetector in a particle analyzer). Methods according to certain embodiments include irradiating a photodetector positioned in a particle analyzer with a light source (e.g., a continuous wave light source) at a first intensity for a first predetermined time interval, irradiating the photodetector with the light source at a second intensity for a second predetermined time interval, integrating data signals from the photodetector over a period of time that includes the first predetermined interval and the second predetermined interval and determining one or more parameters of the photodetector based on the integrated data signals. Systems (e.g., particle analyzers) having light source and a photodetector for practicing the subject methods are also described.

Abstract: A system includes an optical source configured to emit a pulsed light beam, the optical source comprising one or more chambers, each of the one or more chambers configured to hold a gaseous gain medium, the gaseous gain medium being associated with an assumed gas life; at least one detection module configured to: receive and analyze data related to the pulsed light beam, and produce a beam quality metric based on the data related to the pulsed light beam; and a monitoring module configured to: analyze the beam quality metric, determine a health status of the gaseous gain medium based on the analysis of the beam quality metric, and produce a status signal based on the determined health status, the status signal indicating whether to extend use of the gaseous gain medium beyond the assumed gas life or to end use of the gaseous gain medium.