Patents by Inventor Shridhar C. Nath

Shridhar C. Nath has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5942894
    Abstract: A radially focused eddy current sensor detects longitudinal flaws in a metal tube. A drive coil induces eddy currents within the wall of the metal tube. A pick-up coil is spaced apart from the drive coil along the length of the metal tube. The pick-up coil is positioned with one end thereof lying adjacent the wall of the metal tube such that the pick-up coil's longitudinal axis is perpendicular to the wall of the metal tube. To isolate the pick-up coil from the magnetic flux of the drive coil and the flux from the induced eddy currents, except the eddy currents diverted by a longitudinal flaw, an electrically conducting material high in magnetic permeability surrounds all of the pick-up coil except its one end that is adjacent the walls of the metal tube. The electrically conducting material can extend into and through the drive coil in a coaxial relationship therewith.
    Type: Grant
    Filed: September 13, 1995
    Date of Patent: August 24, 1999
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Russell A. Wincheski, John W. Simpson, James P. Fulton, Shridhar C. Nath, Ronald G. Todhunter, Min Namkung
  • Patent number: 5847562
    Abstract: A thickness gauging instrument uses a flux focusing eddy current probe and two-point nonlinear calibration algorithm. The instrument is small and portable due to the simple interpretation and operational characteristics of the probe. A nonlinear interpolation scheme incorporated into the instrument enables a user to make highly accurate thickness measurements over a fairly wide calibration range from a single side of nonferromagnetic conductive metals. The instrument is very easy to use and can be calibrated quickly.
    Type: Grant
    Filed: May 8, 1997
    Date of Patent: December 8, 1998
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: James P. Fulton, Min Namkung, John W. Simpson, Russell A. Wincheski, Shridhar C. Nath
  • Patent number: 5698977
    Abstract: Flux-focusing electromagnetic sensor using a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. A ferrous shield isolates a high-turn pick-up coil from an excitation coil. Use of the magnetic shield produces a null voltage output across the receiving coil in presence of an unflawed sample. Redistribution of the current flow in the sample caused by the presence of flaws, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.Maximum sensor output is obtained when positioned symmetrically above the crack. By obtaining position of maximum sensor output, it is possible to track the fault and locate the area surrounding its tip.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: December 16, 1997
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: John W. Simpson, James P. Fulton, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung, Shridhar C. Nath
  • Patent number: 5648721
    Abstract: A flux-focusing electromagnetic sensor which uses a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks about circular fasteners and other circular inhomogeneities in high conductivity material. The unique feature of the device is the ferrous shield isolating a high-turn pick-up coil from an excitation coil, The use of the magnetic shield is shown to produce a null voltage output across the receiving coil in the presence of an unflawed sample. A redistribution of the current flow in the sample caused by the presence of flaws, however, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.By rotating the probe in a path around a circular fastener such as a rivet while maintaining a constant distance between the probe and the center of a rivet, the signal due to current flow about the rivet can be held constant.
    Type: Grant
    Filed: November 22, 1994
    Date of Patent: July 15, 1997
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Russell A. Wincheski, James P. Fulton, Shridhar C. Nath, John W. Simpson, Min Namkung
  • Patent number: 5617024
    Abstract: A flux-focusing electromagnetic sensor which uses a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. The unique feature of the device is the ferrous shield isolating a high-turn pick-up coil from an excitation coil. The use of the magnetic shield is shown to produce a null voltage output across the receiving coil in the presence of an unflawed sample. A redistribution of the current flow in the sample caused by the presence of flaws, however, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.The maximum sensor output is obtained when positioned symmetrically above the crack. Hence, by obtaining the position of the maximum sensor output, it is possible to track the fault and locate the area surrounding its tip.
    Type: Grant
    Filed: May 8, 1996
    Date of Patent: April 1, 1997
    Assignee: The United States of America as represented by the United States National Aeronautics and Space Administration
    Inventors: John W. Simpson, C. Gerald Clendenin, James P. Fulton, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung, Shridhar C. Nath