Patents by Inventor Shridhar Nath

Shridhar Nath has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8240210
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring device, such as a coordinate measuring machine (CMM), and integrating with a plurality of nondestructive examination (NDE) capabilities with a plurality of coordinate measuring device capabilities to form an inspection probe. The method further includes integrating the NDE inspection probe with the coordinate measuring device such that the inspection probe substantially simultaneously measures a plurality of NDE measurements and external/internal geometry and defects of machine component, which are linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed together with a CAD model to enable a direct comparison between the inspection data and the nominal requirements carried on the CAD model.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: August 14, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Dean Michael Robinson, Shridhar Nath, Nicholas Joseph Kray
  • Publication number: 20100205816
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring device, such as a coordinate measuring machine (CMM), and integrating with a plurality of nondestructive examination (NDE) capabilities with a plurality of coordinate measuring device capabilities to form an inspection probe. The method further includes integrating the NDE inspection probe with the coordinate measuring device such that the inspection probe substantially simultaneously measures a plurality of NDE measurements and external/internal geometry and defects of machine component, which are linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed together with a CAD model to enable a direct comparison between the inspection data and the nominal requirements carried on the CAD model.
    Type: Application
    Filed: February 18, 2009
    Publication date: August 19, 2010
    Inventors: Yanyan Wu, Dean Michael Robinson, Shridhar Nath, Nicholas Joseph Kray
  • Patent number: 7402999
    Abstract: A pulsed eddy current pipeline inspection device is provided. The pulsed eddy current pipeline inspection device comprises a plurality of stages longitudinally spaced apart from each other and adapted to move between a contracted position and an expanded position, and a plurality of sensors disposed around at least a portion of a circumference of each of the plurality of stages in the contracted position with at least one gap between sensors in each of the plurality of stages in the expanded position, the plurality of sensors being arranged such that the at least one gap in a first one of the plurality of stages is aligned with a portion of a second one of the plurality of stages that has sensors disposed thereon.
    Type: Grant
    Filed: November 30, 2005
    Date of Patent: July 22, 2008
    Assignee: General Electric Company
    Inventors: Yuri Plotnikov, Andrew May, Shridhar Nath, Changting Wang
  • Publication number: 20070222439
    Abstract: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
    Type: Application
    Filed: June 7, 2007
    Publication date: September 27, 2007
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Changting Wang, Yuri Plotnikov, William McKnight, Shridhar Nath, Gigi Gambrell, Mottito Togo, William Hennessy, John Ertel, Shyamsunder Mandayam
  • Publication number: 20070120559
    Abstract: A pulsed eddy current pipeline inspection device is provided. The pulsed eddy current pipeline inspection device comprises a plurality of stages longitudinally spaced apart from each other and adapted to move between a contracted position and an expanded position, and a plurality of sensors disposed around at least a portion of a circumference of each of the plurality of stages in the contracted position with at least one gap between sensors in each of the plurality of stages in the expanded position, the plurality of sensors being arranged such that the at least one gap in a first one of the plurality of stages is aligned with a portion of a second one of the plurality of stages that has sensors disposed thereon.
    Type: Application
    Filed: November 30, 2005
    Publication date: May 31, 2007
    Inventors: Yuri Plotnikov, Andrew May, Shridhar Nath, Changting Wang
  • Publication number: 20060144162
    Abstract: A method for diagnosing a vessel having a casing with multiple isolated fluid pathways disposed therein, is provided. The vessel provides for at least one fluid flow. The method includes disposing an ultrasonic device proximate to the vessel, emitting multiple ultrasonic probe signals from the ultrasonic device, evaluating the reflected signals for at least one characteristic of the at least one fluid flow through the flow area, and generating a set of fluid flow characteristics of the flow area based on the evaluating. The probe signals are configured to interact with a flow area and generate multiple reflected signals.
    Type: Application
    Filed: January 5, 2005
    Publication date: July 6, 2006
    Inventors: Thomas Batzinger, Shridhar Nath, Kenneth Herd
  • Publication number: 20060132123
    Abstract: Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
    Type: Application
    Filed: December 22, 2004
    Publication date: June 22, 2006
    Inventors: Changting Wang, Yuri Plotnikov, William McKnight, Shridhar Nath, Gigi Gambrell, Mottito Togo, William Hennessy, John Ertel, Shyamsunder Mandayam
  • Publication number: 20050264284
    Abstract: An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.
    Type: Application
    Filed: May 27, 2004
    Publication date: December 1, 2005
    Inventors: Changting Wang, Yuri Plotnikov, Shridhar Nath, William McKnight, Gigi Gambrell
  • Publication number: 20050057247
    Abstract: An omnidirectional eddy current probe includes a number of sense coils arranged in a stack having a principal axis. At least two of the sense coils are rotationally skewed about the principal axis relative to one another. The sense coils are operatively connected to each other and a drive coil is also positioned in the stack. An impulse through the drive coil induces a magnetic influx through a conducting material specimen having a surface, thereby generating eddy currents on the surface. Secondary magnetic field generated from the eddy currents produces corresponding signals in the sense coils, and the signals are then analyzed for the possibility of surface flaw in the conducting material.
    Type: Application
    Filed: September 12, 2003
    Publication date: March 17, 2005
    Inventors: Thomas Batzinger, Shridhar Nath, Curtis Rose
  • Patent number: 6429759
    Abstract: A contact arrangement for a circuit breaker is disclosed. The movable and the stationary contacts within the breaker are each split and angled such that one contact forms a female V cross sectional shape and the other forms a mating male V cross sectional shape. Together, these contacts split the current in a manner which reduces the popping force.
    Type: Grant
    Filed: February 14, 2000
    Date of Patent: August 6, 2002
    Assignee: General Electric Company
    Inventors: Daniel Schlitz, Shridhar Nath