Abstract: A test system and a test method for a rack and electronic devices disposed in the rack are provided. A test server performs data conversion processing on standalone testing information to make the standalone testing information converted into standalone testing information for the rack. The test server transmits rack testing information to an RMC board corresponding to the rack or transmits the standalone testing information for the rack to the electronic devices through connection nodes corresponding to the rack, so that the RMC board carries out rack testing of the rack according to the rack testing information, and each electronic device can perform standalone testing thereof according to the standalone testing information for the rack. Therefore, the technical effect of testing the rack and the electronic devices disposed in the rack is achieved.