Patents by Inventor Shu Shimada

Shu Shimada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11936500
    Abstract: An in-vehicle network system deployed in a vehicle includes a plurality of first nodes configured to perform an operation relevant to a first function in the vehicle, a second node configured to perform an operation relevant to a second function different from the first function in the vehicle; and a relay device configured to relay communication between the first nodes and the second node. The relay device is configured to start relay of communication between the first nodes earlier than the relay of communication between the first node and the second node at a time of startup.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: March 19, 2024
    Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Shu Ishizuka, Hiroya Ando, Taichi Matsumura, Masashi Amesara, Yutaka Ueda, Toshio Kawamura, Tomomi Kawamura, Yoshifumi Ohmori, Toshio Shimada, Yoshiro Hirata
  • Publication number: 20170162884
    Abstract: A stack structure for a planar solid oxide fuel cell is provided in the present specification, the stack structure including: one or two or more stacks in which two or more cells each having an anode, a solid electrolyte, and a cathode are laminated via a separator, the one or two or more stacks including: an anode gas flow channel which supplies anode gas to the anode; a cathode gas flow channel which supplies cathode gas to the cathode; and a cooling gas flow channel which is independent of the cathode gas flow channel, wherein the cooling gas flow channel supplies cooling gas to at least one of opposing surfaces of the cells of the one or two or more stacks in a laminating direction.
    Type: Application
    Filed: July 17, 2014
    Publication date: June 8, 2017
    Applicant: FCO Power, Inc.
    Inventor: Shu Shimada
  • Patent number: 8158311
    Abstract: An object of the present invention is to provide a method for managing a light exposure mask wherein: a mask inspection or a wafer inspection, in order to manage a contamination of a light exposure mask by a growing foreign matter, is not necessary; the method has general versatility regardless to the history of the mask; the method dose not increase time and cost for mask manufacturing and inspection; and the method is operated so that the mask can always be used in a clean state. Another object of the present invention is to provide a light exposure mask wherein a contamination by a growing foreign matter dose not occur.
    Type: Grant
    Filed: August 15, 2007
    Date of Patent: April 17, 2012
    Assignee: Dai Nippon Printing Co., Ltd.
    Inventors: Shu Shimada, Hideki Yamamoto, Akihiko Naitoh
  • Patent number: 8124301
    Abstract: The invention provides a gradated photomask for reducing photolithography steps and its fabrication process, which make use of a generally available photomask blank, prevents the reflectance of a light shield film from growing high, makes alignment easy during the formation of a semitransparent film, and enables the semi-transparent film on a light shield pattern with good step coverage.
    Type: Grant
    Filed: September 19, 2006
    Date of Patent: February 28, 2012
    Assignee: Dai Nippon Printing Co., Ltd.
    Inventors: Junji Fujikawa, Shu Shimada, Yuuichi Yoshida, Shiho Sasaki, Tsuyoshi Amano, Kimio Ito, Nobuhito Toyama, Hiroshi Mohri
  • Patent number: 7967917
    Abstract: The present invention provides a method of cleaning a storage case to be used for storing or transporting mask substrates such as photomasks and photomask blanks, semiconductor substrates such as semiconductor wafers, pellicles, or the like. The present invention: facilitates a regular cleaning operation, can be used also for a storage case of a complicated shape, does not require a large scale equipment or an expensive equipment to facilitate an environmental countermeasure, and provides high cleaning effect. The method of cleaning a storage case polluted by adhesion of a foreign substance of an organic material, an ionic foreign substances or an ionic crystal foreign substance physically absorbed, comprises a step of placing the storage case still in air flow of cleaned air or an inert gas in a temperature range from room temperature to 80° C. for desorbing and removing the foreign substance adhered to the storage case.
    Type: Grant
    Filed: August 16, 2007
    Date of Patent: June 28, 2011
    Assignee: Dai Nippon Printing Co., Ltd.
    Inventors: Shu Shimada, Noriyuki Takahashi, Hiroyuki Nakajima, Hiroko Tanaka, Nobuyuki Kanda
  • Patent number: 7718008
    Abstract: The present invention provides a method for cleaning a photo mask without the need for removal of the pellicle mounted on the photo mask, without the large scale equipment for washing with a solution, with a small number of steps for cleaning and inspection, and without the increase of the production cost.
    Type: Grant
    Filed: August 16, 2007
    Date of Patent: May 18, 2010
    Assignee: Dai Nippon Printing Co., Ltd.
    Inventors: Shu Shimada, Noriyuki Takahashi, Hiroko Tanaka, Hiroyuki Ishii, Yusuke Shoji, Masashi Ohtsuki
  • Publication number: 20090220867
    Abstract: The invention provides a gradated photomask for reducing photolithography steps and its fabrication process, which make use of a generally available photomask blank, prevents the reflectance of a light shield film from growing high, makes alignment easy during the formation of a semitransparent film, and enables the semitransparent film on a light shield pattern with good step coverage.
    Type: Application
    Filed: September 19, 2006
    Publication date: September 3, 2009
    Applicant: DAI NIPPON PRINTING CO., LTD
    Inventors: Junji Fujikawa, Shu Shimada, Yuuichi Yoshida, Shiho Sasaki, Tsuyoshi Amano, Kimio Ito, Nobuhito Toyama, Hiroshi Mohri
  • Publication number: 20090007939
    Abstract: The present invention provides a method of cleaning a storage case to be used for storing or transporting mask substrates such as photomasks and photomask blanks, semiconductor substrates such as semiconductor wafers, pellicles, or the like. The present invention: facilitates a regular cleaning operation, can be used also for a storage case of a complicated shape, does not require a large scale equipment or an expensive equipment to facilitate an environmental countermeasure, and provides high cleaning effect. The method of cleaning a storage case polluted by adhesion of a foreign substance of an organic material, an ionic foreign substances or an ionic crystal foreign substance physically absorbed, comprises a step of placing the storage case still in air flow of cleaned air or an inert gas in a temperature range from room temperature to 80° C. for desorbing and removing the foreign substance adhered to the storage case.
    Type: Application
    Filed: August 16, 2007
    Publication date: January 8, 2009
    Inventors: Shu SHIMADA, Noriyuki TAKAHASHI, Hiroyuki NAKAJIMA, Hiroko TANAKA, Nobuyuki KANDA
  • Publication number: 20080251100
    Abstract: The present invention provides a method for cleaning a photo mask without the need for removal of the pellicle mounted on the photo mask, without the large scale equipment for washing with a solution, with a small number of steps for cleaning and inspection, and without the increase of the production cost.
    Type: Application
    Filed: August 16, 2007
    Publication date: October 16, 2008
    Inventors: Shu SHIMADA, Noriyuki TAKAHASHI, Hiroko TANAKA, Hiroyuki ISHII, Yusuke SHOJI, Masashi OHTSUKI
  • Publication number: 20080102381
    Abstract: An object of the present invention is to provide a method for managing a light exposure mask wherein: a mask inspection or a wafer inspection, in order to manage a contamination of a light exposure mask by a growing foreign matter, is not necessary; the method has general versatility regardless to the history of the mask; the method dose not increase time and cost for mask manufacturing and inspection; and the method is operated so that the mask can always be used in a clean state. Another object of the present invention is to provide a light exposure mask wherein a contamination by a growing foreign matter dose not occur.
    Type: Application
    Filed: August 15, 2007
    Publication date: May 1, 2008
    Inventors: Shu Shimada, Hideki Yamamoto, Akihiko Naitoh