Abstract: An apparatus for measuring the optoelectric properties of an organic light-emitting device (OLED) comprising a platform, a goniometer, a three-axis moving device and a computer. The goniometer is disposed on one side of the platform and an OLED is disposed on the goniometer. The three-axis moving device is disposed on another side of the platform. The photo-detector is disposed on the three-axis moving device with the photo-detector toward the OLED on the goniometer. The goniometer, the three-axis moving device and the photo-detector are connected to the computer.

Abstract: An apparatus for measuring the optoelectric properties of an organic light-emitting device (OLED) comprising a platform, a goniometer, a three-axis moving device and a computer. The goniometer is disposed on one side of the platform and an OLED is disposed on the goniometer. The three-axis moving device is disposed on another side of the platform. The photo-detector is disposed on the three-axis moving device with the photo-detector toward the OLED on the goniometer. The goniometer, the three-axis moving device and the photo-detector are connected to the computer.

Abstract: A method for measuring optoelectronic characterstics of an organic light emitting diode. A computer, a power supply and a cavity are provided. The cavity has a tooling, on which at least one photodiode is mounted. A high temperature, high humidity, or high temperature and humidity condition is applied to the cavity. The computer is used to control the power supply for supplying a current or a voltage to the organic light emitting diode to generate a light with a brightness. A signal carrying brightness information of the light is then transmitted to the computer (two signals with different brightness have to be input to the computer first) for performing data process.

Abstract: An apparatus for measuring optoelectronic characterstics of an organic light emitting diode, comprising a computer, a power supply and a cavity. The cavity comprises a tooling, on which at least one photodiode is mounted. The computer is used to control the power supply for lighting up the organic light emitting diode, so as to control the optoelectronic characteristic measuring equipment for measuring a brightness generated by the organic light emitting diode. Thereby, the automatic measurement is attained.

Abstract: An apparatus for measuring optoelectronic characterstics of an organic light emitting diode, comprising a computer, a power supply and a cavity. The cavity comprises a tooling, on which at least one photodiode is mounted. The computer is used to control the power supply for lighting up the organic light emitting diode, so as to control the optoelectronic characteristic measuring equipment for measuring a brightness generated by the organic light emitting diode. Thereby, the automatic measurement is attained.

Abstract: A method for measuring optoelectronic characterstics of an organic light emitting diode. A computer, a power supply and a cavity are provided. The cavity has a tooling, on which at least one photodiode is mounted. A high temperature, high humidity, or high temperature and humidity condition is applied to the cavity. The computer is used to control the power supply for supplying a current or a voltage to the organic light emitting diode to generate a light with a brightness. A signal carrying brightness information of the light is then transmitted to the computer (two signals with different brightness have to be input to the computer first) for performing data process.