Patents by Inventor Shuangqing Li

Shuangqing Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11977744
    Abstract: A memory anomaly processing method and system, an electronic device, and a storage medium. The method includes: reading a memory error quantity of a target memory bank from a memory error register; when the memory error quantity is greater than a preset value, executing a hot-removal operation on the target memory bank; calculating a memory delay parameter, and writing the memory delay parameter into a memory controller, wherein the memory delay parameter is waiting time after the memory controller controls the target memory bank to receive a read/write command; and executing a hot-addition operation on the target memory bank, whereby the memory controller continues to execute a read/write operation on the target memory bank based on the memory delay parameter. It can be seen that, according to the present application, the memory read/write error rate may be reduced.
    Type: Grant
    Filed: August 21, 2020
    Date of Patent: May 7, 2024
    Assignee: INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD.
    Inventor: Shuangqing Li
  • Publication number: 20220391103
    Abstract: A memory anomaly processing method and system, an electronic device, and a storage medium. The method includes: reading a memory error quantity of a target memory bank from a memory error register; when the memory error quantity is greater than a preset value, executing a hot-removal operation on the target memory bank; calculating a memory delay parameter, and writing the memory delay parameter into a memory controller, wherein the memory delay parameter is waiting time after the memory controller controls the target memory bank to receive a read/write command; and executing a hot-addition operation on the target memory bank, whereby the memory controller continues to execute a read/write operation on the target memory bank based on the memory delay parameter. It can be seen that, according to the present application, the memory read/write error rate may be reduced.
    Type: Application
    Filed: August 21, 2020
    Publication date: December 8, 2022
    Inventor: Shuangqing LI
  • Patent number: 11296801
    Abstract: A method for calibrating crystal frequency offset through a radio frequency signal includes, in Step S1, a radio frequency port of a device is connected to one end of a radio frequency cable through a copper pipe connector and the other end of the radio frequency cable is connected to a Wireless Local Area Network (WLAN) tester which is connected with a control terminal. In Step S2, a user controls the WLAN tester to test the radio frequency signal of the device through the control terminal to obtain a test result, and determines whether a deviation of the radio frequency signal is qualified. If it is qualified, the user exits the test, otherwise the user regulates the crystal circuit of the device under test, and returns to Step S2. The method may not be affected by a probe, thus the measurement may be more accurate.
    Type: Grant
    Filed: October 31, 2018
    Date of Patent: April 5, 2022
    Assignee: Amlogic (Shanghai) Co., Ltd.
    Inventors: Shuangqing Li, Kun Zhang, Jie Feng
  • Publication number: 20210336708
    Abstract: A method for calibrating crystal frequency offset through a radio frequency signal includes, in Step S1, a radio frequency port of a device is connected to one end of a radio frequency cable through a copper pipe connector and the other end of the radio frequency cable is connected to a Wireless Local Area Network (WLAN) tester which is connected with a control terminal. In Step S2, a user controls the WLAN tester to test the radio frequency signal of the device through the control terminal to obtain a test result, and determines whether a deviation of the radio frequency signal is qualified. If it is qualified, the user exits the test, otherwise the user regulates the crystal circuit of the device under test, and returns to Step S2. The method may not be affected by a probe, thus the measurement may be more accurate.
    Type: Application
    Filed: October 31, 2018
    Publication date: October 28, 2021
    Inventors: Shuangqing Li, Kun Zhang, Jie Feng