Patents by Inventor Shugo Nishiyama

Shugo Nishiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • S/N ratio measuring method in eddy current testing on internal surface of pipe or tube
    Patent number: 8027796
    Abstract: A method in accordance with the present invention includes the steps of: separating an eddy current signal into an X-axis component and a Y-axis component to obtain signal waveform data of the respective components; excluding predetermined low-frequency components respectively from the respective signal waveform data thus obtained; calculating a noise voltage value V1 defined by the following Equation (1) based upon voltage values X(i) and Y(i) of the signal waveform data of the X-axis component and the Y-axis component from which the low-frequency components have been excluded; and calculating an S/N ratio by dividing a voltage value D of an eddy current signal corresponding to a predetermined artificial flaw by the noise voltage value V1: V ? ? 1 = ? / n · ? i = 1 n ? ( X ? ( i ) 2 + Y ? ( i ) 2 ) 1 / 2 ( 1 ) where n represents the number of samplings of the signal waveform data.
    Type: Grant
    Filed: October 27, 2006
    Date of Patent: September 27, 2011
    Assignee: Sumitomo Metal Industries, Ltd.
    Inventors: Shoji Kinomura, Yoshiyuki Nakao, Toshiya Kodai, Shugo Nishiyama
  • S/N Ratio Measuring Method in Eddy Current Testing on Internal Surface of Pipe or Tube
    Publication number: 20090138222
    Abstract: A method in accordance with the present invention includes the steps of: separating an eddy current signal into an X-axis component and a Y-axis component to obtain signal waveform data of the respective components; excluding predetermined low-frequency components respectively from the respective signal waveform data thus obtained; calculating a noise voltage value V1 defined by the following Equation (1) based upon voltage values X(i) and Y(i) of the signal waveform data of the X-axis component and the Y-axis component from which the low-frequency components have been excluded; and calculating an S/N ratio by dividing a voltage value D of an eddy current signal corresponding to a predetermined artificial flaw by the noise voltage value V1: V ? ? 1 = ? / n · ? i = 1 n ? ( X ? ( i ) 2 + Y ? ( i ) 2 ) 1 / 2 ( 1 ) where n represents the number of samplings of the signal waveform data.
    Type: Application
    Filed: October 27, 2006
    Publication date: May 28, 2009
    Inventors: Shoji Kinomura, Yoshiyuki Nakao, Toshiya Kodai, Shugo Nishiyama