Patents by Inventor Shuhui Qu

Shuhui Qu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240160824
    Abstract: A method of designing inputs of a circuit includes identifying, by a circuit input solver, input ports of the circuit, classifying, by the circuit input solver, each one of the input ports as a DC line port of a plurality of DC line ports or a switching control line port of a plurality of switching control line ports, identifying, by the circuit input solver, one of the DC line ports as a data line port, determining, by the circuit input solver, for an emission phase of the circuit, a plurality of first parameters corresponding to signals of the plurality of DC line ports, and determining, by the circuit input solver, for an initialization phase of the circuit, a plurality of second parameters corresponding to signals of the plurality of switching control line ports based on the plurality of first parameters.
    Type: Application
    Filed: May 31, 2023
    Publication date: May 16, 2024
    Inventors: Yannick Bliesener, Shuhui Qu, Zheng Wang
  • Publication number: 20240127030
    Abstract: A classification system includes: one or more processors; and memory including instructions that, when executed by the one or more processors, cause the one or more processors to: calculate reference Shapley values for features of a data sample based on a first classification model; and train a second classification model though multi-task distillation to: predict Shapley values for the features of the data sample based on the reference Shapley values and a distillation loss; and predict a class label for the data sample based on the predicted Shapley values and a ground truth class label for the data sample.
    Type: Application
    Filed: February 14, 2023
    Publication date: April 18, 2024
    Inventors: Qisen Cheng, Shuhui Qu, Kaushik Balakrishnan, Janghwan Lee
  • Patent number: 11948347
    Abstract: A method and a system are presented for controlling a performance of a fusion model. The method includes obtaining a first set and a second set of candidate models for a first and second neural networks, respectively. Each of the first and second set of candidate models is pre-trained with a first source and a second source, respectively. For each possible pairing of one candidate model from the first neural network and one candidate model from the second neural network, a model distance Dm is determined. A subset of possible pairings of one first candidate model and one second candidate model is selected based on the model distance Dm between them. Using the subset of possible parings, the first neural network and the second neural network are combined to generate two branches for a fusion model neural network.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: April 2, 2024
    Assignee: Samsung Display Co., Ltd.
    Inventors: Shuhui Qu, Janghwan Lee, Yan Kang, Jinghua Yao, Sai MarapaReddy
  • Publication number: 20240048724
    Abstract: According to some embodiments, a system includes: a memory, an encoder; a decoder, wherein the system is operable to: receive, at the encoder, an input video; divide, by the encoder, the input video into a plurality of video patches; select, by the encoder, codes corresponding to the plurality of video patches of the input video, from a codebook comprising the codes; determine, by the encoder, an assigned code matrix comprising the codes corresponding to the plurality of video patches of the input video; receive, by the decoder, the assigned code matrix from the encoder; and generate, by the decoder, a reconstructed video based on the assigned code matrix.
    Type: Application
    Filed: December 2, 2022
    Publication date: February 8, 2024
    Inventors: Shuhui QU, Qisen CHENG, Yannick BLIESENER, Janghwan LEE
  • Publication number: 20230316493
    Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.
    Type: Application
    Filed: May 19, 2023
    Publication date: October 5, 2023
    Inventors: Yan Kang, Janghwan Lee, Shuhui Qu, Jinghua Yao, Sai MarapaReddy
  • Publication number: 20230267599
    Abstract: A system and method for defect detection. In some embodiments, the method includes: identifying, by a first neural network, a suspicious area in a first image; selecting, from among a set of defect-free reference images, by a second neural network, a defect-free reference image corresponding to the first image; identifying, by a third neural network, in the defect-free reference image, a reference region corresponding to the suspicious area; and determining, by a fourth neural network, a measure of similarity between the suspicious area and the reference region.
    Type: Application
    Filed: April 21, 2022
    Publication date: August 24, 2023
    Inventors: Shuhui QU, Qisen CHENG, Janghwan LEE
  • Publication number: 20230267600
    Abstract: A system including: a memory, an encoder, a decoder, and a processor, the processor being connected to the memory, the encoder, and the decoder. The system is configured to: receive, at the encoder, an input image, divide, by the encoder, the input image into a plurality of image patches, select, by the encoder, codes corresponding to the plurality of image patches of the input image, from a codebook including the codes. The system is further configured to determine, by the encoder, an assigned code matrix including the codes corresponding to the plurality of image patches of the input image, receive, by the decoder, the assigned code matrix from the encoder. The system is further configured to generate, by the decoder, a reconstructed image based on the assigned code matrix.
    Type: Application
    Filed: April 25, 2022
    Publication date: August 24, 2023
    Inventors: Shuhui Qu, Qisen Cheng, Janghwan Lee
  • Publication number: 20230259760
    Abstract: A system and method for defect detection. The method may include training, with a first set of images, a first neural network including a first student neural network, and a first teacher neural network. The training of the first neural network may include introducing defects into a first subset of the first set of images, and training the first student neural network with the first set of images. The training of the first student neural network may include using a first cost function, that: for an image of the first set and not of the first subset, rewards similarity between a feature map of the first student neural network and a feature map of the first teacher neural network, and for an image of the first subset, rewards dissimilarity between a feature map of the first student neural network and a feature map of the first teacher neural network.
    Type: Application
    Filed: April 21, 2022
    Publication date: August 17, 2023
    Inventors: Qisen CHENG, Shuhui QU, Janghwan LEE
  • Patent number: 11694319
    Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: July 4, 2023
    Assignee: Samsung Display Co., Ltd.
    Inventors: Yan Kang, Janghwan Lee, Shuhui Qu, Jinghua Yao, Sai MarapaReddy
  • Publication number: 20220374720
    Abstract: Systems and methods for classifying products are disclosed. A first data sample having a first portion and a second portion is identified from a training dataset. A first mask is generated based on the first data sample, where the first mask is associated with the first portion of the first data sample. A second data sample is generated based on a noise input. The first mask is applied to the second data sample for outputting a third portion of the second data sample. The third portion of the second data sample is combined with the second portion of the first data sample for generating a first combined data sample. Confidence and classification of the first combined data sample are predicted. The first combined data sample is added to the training dataset in response to predicting the confidence and the classification.
    Type: Application
    Filed: July 2, 2021
    Publication date: November 24, 2022
    Inventors: Shuhui Qu, Janghwan Lee, Yan Kang
  • Publication number: 20220343140
    Abstract: Systems and method for classifying manufacturing defects are disclosed. A first machine learning model is trained with a training dataset, and a data sample that satisfies a criterion is identified from the training dataset. A second machine learning model is trained to learn features of the data sample. When an input dataset that includes first and second product data is received, the second machine learning model is invoked for predicting confidence of the first and second product data based on the learned features of the data sample. In response to predicting the confidence of the first and second product data, the first product data is removed from the dataset, and the first machine learning model is invoked for generating a classification based the second product data.
    Type: Application
    Filed: May 11, 2021
    Publication date: October 27, 2022
    Inventors: Shuhui Qu, Janghwan Lee, Yan Kang
  • Publication number: 20220318672
    Abstract: Systems and method for classifying manufacturing defects are disclosed. In one embodiment, a first data sample satisfying a first criterion is identified from a training dataset, and the first data sample is removed from the training dataset. A filtered training dataset including a second data sample is output. A first machine learning model is trained with the filtered training dataset. A second machine learning model is trained based on at least one of the first data sample or the second data sample. Product data associated with a manufactured product is received, and the second machine learning model is invoked for predicting confidence of the product data. In response to predicting the confidence of the product data, the first machine learning model is invoked for generating a classification based the product data.
    Type: Application
    Filed: May 3, 2021
    Publication date: October 6, 2022
    Inventors: Shuhui Qu, Janghwan Lee, Yan Kang
  • Patent number: 11435719
    Abstract: A system and method for classifying products manufactured via a manufacturing process. A processor receives an input dataset, and extracts features of the input dataset at two or more levels of abstraction. The processor combines the extracted features and provides the combined extracted features to a classifier. The classifier is trained based on the combined extracted features for learning a pattern of not-faulty products. The trained classifier is configured to receive data for a product to be classified, to output a prediction for the product based on the received data.
    Type: Grant
    Filed: November 22, 2019
    Date of Patent: September 6, 2022
    Assignee: Samsung Display Co., Ltd.
    Inventors: Sai MarapaReddy, Shuhui Qu, Janghwan Lee
  • Publication number: 20210319270
    Abstract: A method and a system are presented for controlling a performance of a fusion model. The method includes obtaining a first set and a second set of candidate models for a first and second neural networks, respectively. Each of the first and second set of candidate models is pre-trained with a first source and a second source, respectively. For each possible pairing of one candidate model from the first neural network and one candidate model from the second neural network, a model distance Dm is determined. A subset of possible pairings of one first candidate model and one second candidate model is selected based on the model distance Dm between them. Using the subset of possible parings, the first neural network and the second neural network are combined to generate two branches for a fusion model neural network.
    Type: Application
    Filed: July 24, 2020
    Publication date: October 14, 2021
    Inventors: Shuhui Qu, Janghwan Lee, Yan Kang, Jinghua Yao, Sai MarapaReddy
  • Publication number: 20210319546
    Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.
    Type: Application
    Filed: July 24, 2020
    Publication date: October 14, 2021
    Inventors: Yan Kang, Janghwan Lee, Shuhui Qu, Jinghua Yao, Sai MarapaReddy
  • Publication number: 20210096530
    Abstract: A system and method for classifying products manufactured via a manufacturing process. A processor receives an input dataset, and extracts features of the input dataset at two or more levels of abstraction. The processor combines the extracted features and provides the combined extracted features to a classifier. The classifier is trained based on the combined extracted features for learning a pattern of not-faulty products. The trained classifier is configured to receive data for a product to be classified, to output a prediction for the product based on the received data.
    Type: Application
    Filed: November 22, 2019
    Publication date: April 1, 2021
    Inventors: Sai MarapaReddy, Shuhui Qu, Janghwan Lee