Abstract: An image sensor test system (10) bringing input/output terminals of an image sensor into contact with a contact (61) of a test head (60), emitting light to alight receiving surface of the image sensor from a light source (80) and, while doing so, inputting/outputting electrical signals between the contact (61) of the test head (60) and the image sensor so as to test the optical properties of the image sensor, provided with a loader use inverting device (32) for inverting an image sensor loaded into a supply tray stacker in a state with the light receiving surface facing upward, a contact arm (43) for gripping a back surface of an opposite side to the light receiving surface of the image sensor and moving the image sensor to bring the image sensor into contact with a contact (61) of the test head (60) in the state with the light receiving surface facing downward, and an unloader use inverting device inverting and unloaded the tested image sensor.

Abstract: An image sensor test system (10) bringing input/output terminals of an image sensor into contact with a contact (61) of a test head (60), emitting light to alight receiving surface of the image sensor from a light source (80) and, while doing so, inputting/outputting electrical signals between the contact (61) of the test head (60) and the image sensor so as to test the optical properties of the image sensor, provided with a loader use inverting device (32) for inverting an image sensor loaded into a supply tray stacker in a state with the light receiving surface facing upward, a contact arm (43) for gripping a back surface of an opposite side to the light receiving surface of the image sensor and moving the image sensor to bring the image sensor into contact with a contact (61) of the test head (60) in the state with the light receiving surface facing downward, and an unloader use inverting device inverting and unloaded the tested image sensor.