Abstract: A light-emitting diode includes a substrate, a semiconductor stack layer, a DBR stack structure that includes a first material layer and a second material layer, which are repeatedly stacked. Optical thicknesses of the first material layer and the second material layer are capable of: reflecting light within a first wavelength range and within a first angle range, transmitting a part of light within the first wavelength range and within a second angle range, where the first angle range is less than the second angle range. A reflectivity in response to light with at least one wavelength in a second wavelength range and having an incident angle of 0-10 degrees is ?40%, the DBR stack structure has a color, and wavelengths contained in the second wavelength range are ? a critical wavelength of the color corresponding to the DBR stack structure through which AOI testing passes.

Abstract: A light-emitting device includes a substrate, a first and second mesa structures disposed on the substrate, at least one current blocking element, at least one conductive bridging element, and first and second conductive pads. The conductive bridging element is disposed on the current blocking element, and is electrically connected to the first and second mesa structures. The first and second conductive pads are electrically connected to the first and second mesa structures, respectively. The conductive bridging element has a projection image that is spaced apart from those of the first and second conductive pads in a plan view of the light-emitting device. A light-emitting module including the light-emitting device, and a display apparatus including the light-emitting device are also disclosed.

Abstract: A light-emitting diode includes a substrate and a semiconductor layered structure that is located on the substrate. The semiconductor layered structure includes at least one light-emitting unit, a semiconductor island-structure, and a trench. The trench is located between the at least one light-emitting unit and the semiconductor island-structure. A light-emitting device includes the light-emitting diode.

Abstract: A light emitting device includes a light-emitting laminate and an insulating reflective structure. The insulating reflective structure includes n pairs of dielectric layers stacked on the light-emitting laminate. Each of the n pairs of dielectric layers includes a first material layer and a second material layer. The first material layer has a first refractive index, and the second material layer has a second refractive index that is greater than the first refractive index of the first material layer. For each pair of dielectric layers among m1 pairs of dielectric layers out of the n pairs of dielectric layers, the first material layer has an optical thickness that is greater than that of the second material layer, where 0.5n?m1?n, and n and m1 are natural numbers greater than 0.

Abstract: Provided are an LED chip and a light emitting device, which include a light emitting epitaxial layer, a first insulating layer covering the light emitting epitaxial layer, and a first pad and a second pad located on the first insulating layer. Each of the first pad and the second pad includes a stress buffer layer, a nickel metal layer, and a protective layer. The stress buffer layer includes aluminum metal layers; and by adjusting the thickness distribution of the aluminum metal layers, an aluminum metal layer closest to the nickel metal layer is set to be the thickest, and the aluminum metal layers are thickened, especially the thickness of the aluminum metal layer closest to the nickel metal layer is greater than or equal to the thickness of the nickel metal layer, therefore, the ductility and tensile property of aluminum metal are utilized to play a role in stress buffering.

Abstract: A flip-chip light emitting diode includes an epitaxial structure, a first electrode, and a second electrode. The epitaxial structure includes a first semiconductor layer, a light emitting layer, and a second semiconductor layer. The light emitting layer is located between the first semiconductor layer and the second semiconductor layer. The first electrode is located on the epitaxial structure and is electrically connected to the first semiconductor layer. The second electrode is located on the epitaxial structure and is electrically connected to the second semiconductor layer. The first electrode and/or the second electrode is a multilayer metal structure. The multilayer metal structure includes a metal reflective layer, a first barrier layer, and a conductive metal layer stacked in sequence on the first semiconductor layer. A thickest layer in the multilayer metal structure is the conductive metal layer, and the conductive metal layer is an Al layer.

Abstract: Disclosed are a water quality analyzer and a method for analyzing water quality. The water quality analyzer includes a first disc system, a second disc system, a colorimetric system, a cleaning system, a mechanical sampling system, an analysis system and a central control display. The first disc system and the second disc system are axially rotatable. A plurality of sample locating positions and a chemical locating positions are provided on the first disc system along a circumference of the first disc system. A plurality of colorimetric cuvette locating positions are provided on the second disc system, and the colorimetric system is arranged at a circumference edge of the second disc system. The cleaning system and the mechanical sampling system are provided between the first disc system and the second disc system. The method includes water sampling, water sample injection, cleaning, reagent extraction, reagent injection, cleaning and colorimetric analysis.

Abstract: A light-emitting device includes a substrate, a first and second mesa structures disposed on the substrate, at least one current blocking element, at least one conductive bridging element, and first and second conductive pads. The conductive bridging element is disposed on the current blocking element, and is electrically connected to the first and second mesa structures. The first and second conductive pads are electrically connected to the first and second mesa structures, respectively. The conductive bridging element has a projection image that is spaced apart from those of the first and second conductive pads in a plan view of the light-emitting device. A light-emitting module including the light-emitting device, and a display apparatus including the light-emitting device are also disclosed.

Abstract: A device and a method of analyzing total cyanide in water samples, including a mixing tube, a stripping tube, a sampling pipe, a reaction pipe, a peristaltic pump, an air pump, a UV digester, a heater, a condenser, a drain pipe and a water sample detector. The mixing tube, the stripping tube, the sampling pipe and the reaction pipe are respectively connected to the peristaltic pump. The mixing tube is connected to the reaction pipe. A bottom of the stripping tube, the air pump, the UV digester, the heater and the condenser and are sequentially connected. The condenser is connected to the mixing tube. An upper portion of the stripping tube, the sampling pipe and the reaction pipe are connected to the drain pipe. An absorbance of the water in the mixing tube is measured by the sample detector, and used to calculate the total cyanide content by spectrophotometry.

Abstract: Disclosed are a water quality analyzer and a method for analyzing water quality. The water quality analyzer includes a first disc system, a second disc system, a colorimetric system, a cleaning system, a mechanical sampling system, an analysis system and a central control display. The first disc system and the second disc system are axially rotatable. A plurality of sample locating positions and a chemical locating positions are provided on the first disc system along a circumference of the first disc system. A plurality of colorimetric cuvette locating positions are provided on the second disc system, and the colorimetric system is arranged at a circumference edge of the second disc system. The cleaning system and the mechanical sampling system are provided between the first disc system and the second disc system. The method includes water sampling, water sample injection, cleaning, reagent extraction, reagent injection, cleaning and colorimetric analysis.

Abstract: A device and a method of analyzing total cyanide in water samples, including a mixing tube, a stripping tube, a sampling pipe, a reaction pipe, a peristaltic pump, an air pump, a UV digester, a heater, a condenser, a drain pipe and a water sample detector. The mixing tube, the stripping tube, the sampling pipe and the reaction pipe are respectively connected to the peristaltic pump. The mixing tube is connected to the reaction pipe. A bottom of the stripping tube, the air pump, the UV digester, the heater and the condenser and are sequentially connected. The condenser is connected to the mixing tube. An upper portion of the stripping tube, the sampling pipe and the reaction pipe are connected to the drain pipe. An absorbance of the water in the mixing tube is measured by the sample detector, and used to calculate the total cyanide content by spectrophotometry.