Patents by Inventor Shuk Ying Lai

Shuk Ying Lai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040112735
    Abstract: A magnetron sputter reactor for sputtering deposition materials such as nickel and cobalt, for example, and its method of use, in which self-ionized plasma (SIP) sputtering is promoted. SIP is promoted by a small magnetron having poles of unequal magnetic strength and a high power applied to the target during sputtering. One embodiment of the present inventions is directed to sputter depositing a metal layer by biasing a sputter target with pulsed power in which the power applied to the target alternates between low and high levels. The high levels are, in one embodiment, sufficiently high to maintain a plasma for ionizing deposition material. The low levels are, in one embodiment, sufficiently low such that the power applied to the target during the high and low levels is, on average, low enough to facilitate deposition of thin layers if desired.
    Type: Application
    Filed: December 17, 2002
    Publication date: June 17, 2004
    Applicant: Applied Materials, Inc.
    Inventors: Dinesh Saigal, John C. Forster, Shuk Ying Lai
  • Patent number: 6579783
    Abstract: Embodiments of the present invention generally relate to processes of making an improved salicide-gate. One embodiment of a method for forming a feature on a substrate comprises forming a gate structure on a substrate; forming spacers by the sidewalls of the gate; and depositing a relatively thin metal film, such as cobalt or titanium, over the gate at a high temperature.
    Type: Grant
    Filed: July 6, 2001
    Date of Patent: June 17, 2003
    Assignee: Applied Materials, Inc.
    Inventors: Dinesh Saigal, Shuk Ying Lai
  • Publication number: 20020019119
    Abstract: The present invention generally relates to an improved salicide-gate and process of making an improved salicide-gate. One embodiment of the process comprises forming a gate structure on a substrate; forming spacers by the sidewalls of the gate; and depositing a relatively thin metal film, such as cobalt or titanium, over the gate at a high temperatures.
    Type: Application
    Filed: July 6, 2001
    Publication date: February 14, 2002
    Inventors: Dinesh Saigal, Shuk Ying Lai