Patents by Inventor Shun Ishiyama

Shun Ishiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5961557
    Abstract: A design support system for executing logic verification so as to perform work management, progress state management and logic quality management efficiently in a logic verification process and so as to improve the man-hour for development and the throughput of computer resources. For every verification item to be executed, management information including a verification item number for identifying a verification item, confirmation information for indicating the fact that no failure has been confirmed in the verification item, a prerequisite verification item number for identifying another verification item required to be confirmed as a prerequisite for the verification item is stored in a memory of the system.
    Type: Grant
    Filed: May 29, 1996
    Date of Patent: October 5, 1999
    Assignees: Hitachi, Ltd., Hitachi Computer Electronics, Co., Ltd.
    Inventors: Kazunobu Morimoto, Shun Ishiyama, Osamu Tada, Satoshi Fujiwara
  • Patent number: 4743840
    Abstract: In a logic circuit which is logically divided into partial circuits each consisting of a logic block, data holding stages on the input and output sides therof, and a scan circuit segment associated with them, diagnostic data for a logic circuit section is obtained using the scan circuit segments in the respective partial circuits and wherein, only the scan circuit segments in the respective partial circuits are actuated to set values in the output side data holding stages and to read out the contents thereof as diagnostic test data for a scan circuit section.
    Type: Grant
    Filed: November 26, 1986
    Date of Patent: May 10, 1988
    Assignees: Hitachi Computer Engineering Co., Ltd., Hitachi, Ltd.
    Inventors: Yoshio Sato, Toshifumi Ishii, Shun Ishiyama
  • Patent number: 4703257
    Abstract: A logic circuit having a diagnostic function is disclosed in which each of first latches for applying data to combinational circuits included in the logic circuit and/or receiving data from the combinational circuits is provided with a second latch and a selector for selecting the output of the first latch in a first mode and for selecting the output of the second latch in a second mode. In a regular operation, the output of the first latch is never transferred through the second latch, and the selector is operated in the first mode. Accordingly, the output of the first latch is supplied directly to a succeeding combinational circuit, and thus the delay caused by the second latch in the prior art can be eliminated. Although the delay caused by the selector is unavoidable, this delay can be made far smaller than the delay caused by the second latch.
    Type: Grant
    Filed: December 18, 1985
    Date of Patent: October 27, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Takao Nishida, Toru Hiyama, Kaoru Moriwaki, Shun Ishiyama, Shunsuke Miyamoto