Patents by Inventor Shun NIIZUMA

Shun NIIZUMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11500369
    Abstract: An operation/maintenance management method of an integrated system including a plurality of components or devices includes selecting an index and a period for evaluating the integrated system, acquiring prediction information for input information for use in computation of the index, creating a future prediction scenario by combining the input information, computing an evaluation index related to the scenario, and comparing and displaying evaluation index computation results related to a plurality of scenarios.
    Type: Grant
    Filed: March 22, 2018
    Date of Patent: November 15, 2022
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Satoru Funahashi, Shintaro Kumano, Katsuhiko Abe, Keisuke Yamamoto, Makoto Kishi, Yukihiko Inoue, Shun Niizuma
  • Patent number: 11461727
    Abstract: A plant evaluation system is configured to calculate performance of a plant while receiving setting of operating conditions of the plant and devices installed in the plant and simulating a secular change occurring in the plant during an evaluation target period included in the operating conditions. At least one of the devices is added, a selection of a component improving performance of a certain device is received, and an improvement of the performance of the device by the component is expected and the performance of the plant is calculated.
    Type: Grant
    Filed: March 23, 2018
    Date of Patent: October 4, 2022
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Naoki Suzuki, Shintaro Kumano, Katsuhiko Abe, Keisuke Yamamoto, Makoto Kishi, Yukihiko Inoue, Shun Niizuma
  • Patent number: 11209811
    Abstract: A diagnostic device includes a storage unit that stores first information including a first abnormal event which occurred in the past in a plant, a first attribution event that is a cause of the first abnormal event, and a first occurrence probability of the first attribution event, in which a causal relationship between the first abnormal and attribution events is indicated by a tree structure, and second information including a second abnormal event which is supposed to occur in the plant but has not yet occurred, a second attribution event that is a cause of the second abnormal event, and a second occurrence probability of the second attribution event, in which a causal relationship between the second abnormal and attribution events is indicated by a tree structure; and an estimation unit that estimates the cause of the sign of the abnormality, based on the first and second information.
    Type: Grant
    Filed: September 1, 2017
    Date of Patent: December 28, 2021
    Assignee: MITSUBISHI POWER, LTD.
    Inventors: Masato Shida, Yukihiko Inoue, Kuniaki Aoyama, Ichiro Nagano, Shun Niizuma, Tomohiro Baba, Akihisa Endo, Takahiro Yamauchi, Tsuyoshi Kinoshita, Shinsaku Endo, Yasuoki Tomita, Katsuhiko Abe
  • Patent number: 11048245
    Abstract: An indicator detection system includes: a data acquiring unit configured to acquire operation data of a machine and operation history data indicating an operation history of the machine; an estimation unit configured to calculate a first estimated value of a parameter of the machine which is to be monitored on the basis of the operation data, the operation history data and an estimation model for estimating a value of the parameter at a time point corresponding to the operation history data for the parameter; and a state evaluating unit configured to evaluate a state of the machine on the basis of a difference between the first estimated value of the parameter from the estimation unit and a measured value or a second estimated value of the parameter included in the operation data acquired by the data acquiring unit.
    Type: Grant
    Filed: March 23, 2018
    Date of Patent: June 29, 2021
    Assignees: MITSUBISHI HEAVY INDUSTRIES, LTD., MITSUBISHI POWER, LTD.
    Inventors: Makoto Kishi, Shintaro Kumano, Katsuhiko Abe, Keisuke Yamamoto, Yukihiko Inoue, Shun Niizuma
  • Publication number: 20200278671
    Abstract: An operation/maintenance management method of an integrated system including a plurality of components or devices includes selecting an index and a period for evaluating the integrated system, acquiring prediction information for input information for use in computation of the index, creating a future prediction scenario by combining the input information, computing an evaluation index related to the scenario, and comparing and displaying evaluation index computation results related to a plurality of scenarios.
    Type: Application
    Filed: March 22, 2018
    Publication date: September 3, 2020
    Inventors: Satoru FUNAHASHI, Shintaro KUMANO, Katsuhiko ABE, Keisuke YAMAMOTO, Makoto KISHI, Yukihiko INOUE, Shun NIIZUMA
  • Publication number: 20200265361
    Abstract: A plant evaluation system is configured to calculate performance of a plant while receiving setting of operating conditions of the plant and devices installed in the plant and simulating a secular change occurring in the plant during an evaluation target period included in the operating conditions. At least one of the devices is added, a selection of a component improving performance of a certain device is received, and an improvement of the performance of the device by the component is expected and the performance of the plant is calculated.
    Type: Application
    Filed: March 23, 2018
    Publication date: August 20, 2020
    Applicants: Mitsubisi Heavy Industries, Ltd., Mitsubishi Hitachi Power Systems, Ltd.
    Inventors: Naoki SUZUKI, Shintaro KUMANO, Katsuhiko ABE, Keisuke YAMAMOTO, Makoto KISHI, Yukihiko INOUE, Shun NIIZUMA
  • Publication number: 20200103883
    Abstract: An indicator detection system includes: a data acquiring unit configured to acquire operation data of a machine and operation history data indicating an operation history of the machine; an estimation unit configured to calculate a first estimated value of a parameter of the machine which is to be monitored on the basis of the operation data, the operation history data and an estimation model for estimating a value of the parameter at a time point corresponding to the operation history data for the parameter; and a state evaluating unit configured to evaluate a state of the machine on the basis of a difference between the first estimated value of the parameter from the estimation unit and a measured value or a second estimated value of the parameter included in the operation data acquired by the data acquiring unit.
    Type: Application
    Filed: March 23, 2018
    Publication date: April 2, 2020
    Applicants: MITSUBISHI HEAVY INDUSTRIES, LTD., Mitsubishi Hitachi Power Systems, Ltd.
    Inventors: Makoto Kishi, Shintaro Kumano, Katsuhiko Abe, Keisuke Yamamoto, Yukihiko Inoue, Shun Niizuma
  • Publication number: 20200019150
    Abstract: A collection device includes a reception unit, a first inspection unit, and a first transmission request unit. The reception unit receives a data unit including operation data indicating an operation state of a plant and a guarantee value for guaranteeing authenticity of the operation data. The first inspection unit inspects the authenticity of the data unit by inspecting a quality of the data unit on the basis of the guarantee value and by inspecting the presence or absence of a loss of the data on the basis of a reception interval of the data unit. The first transmission request unit requests a transmission side of the data unit to retransmit the data unit when inspection results of the first inspection unit indicate no authenticity.
    Type: Application
    Filed: September 1, 2017
    Publication date: January 16, 2020
    Inventors: Masato SHIDA, Yukihiko INOUE, Kuniaki AOYAMA, Ichiro NAGANO, Shun NIIZUMA, Akihisa ENDO, Takahiro YAMAUCHI, Tsuyoshi KINOSHITA, Shinsaku ENDO
  • Publication number: 20190384275
    Abstract: A diagnostic device includes a storage unit that stores first information including a first abnormal event which occurred in the past in a plant, a first attribution event that is a cause of the first abnormal event, and a first occurrence probability of the first attribution event, in which a causal relationship between the first abnormal and attribution events is indicated by a tree structure, and second information including a second abnormal event which is supposed to occur in the plant but does not occur yet, a second attribution event that is a cause of the second abnormal event, and a second occurrence probability of the second attribution event, in which a causal relationship between the second abnormal and attribution events is indicated by a tree structure; and an estimation unit that estimates the cause of the sign of the abnormality, based on the first and second information.
    Type: Application
    Filed: September 1, 2017
    Publication date: December 19, 2019
    Inventors: Masato SHIDA, Yukihiko INOUE, Kuniaki AOYAMA, Ichiro NAGANO, Shun NIIZUMA, Tomohiro BABA, Akihisa ENDO, Takahiro YAMAUCHI, Tsuyoshi KINOSHITA, Shinsaku ENDO, Yasuoki TOMITA, Katsuhiko ABE