Patents by Inventor Shunichi HINO

Shunichi HINO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Image inspection apparatus and setting method for image inspection apparatus
    Patent number: 11087456
    Abstract: To enable a non-defective product image or a defective product image to be easily additionally learned in both a setting mode and a run mode. Designation as to whether an inspection target image displayed on a run mode screen is additionally learned as a non-defective product image or a defective product image is received. A distinguishing device generating unit additionally learns, as a non-defective product image or a defective product image, the inspection target image designated as the additional learning target and updates a distinguishing device.
    Type: Grant
    Filed: December 30, 2019
    Date of Patent: August 10, 2021
    Assignee: KEYENCE CORPORATION
    Inventors: Shunichi Hino, Daisuke Kida
  • Image inspection apparatus and setting method for image inspection apparatus
    Patent number: 11042977
    Abstract: To enable inspection setting flows appropriate for a rule-based inspection mode and a learning-based inspection mode to be easily created when these modes are implemented in an image inspection apparatus. The rule-based inspection mode and the learning-based inspection mode are implemented in the image inspection apparatus. In the setting mode in a rule-based inspection, the user can set an imaging condition, select an image processing tool, set the application range of an image processing tool, and adjust the parameters of the image processing tool. In the setting mode in a learning-based inspection, a non-defective product image and a defective product image are input to generate a distinguishing device.
    Type: Grant
    Filed: December 30, 2019
    Date of Patent: June 22, 2021
    Assignee: KEYENCE CORPORATION
    Inventors: Nobuyuki Kurihara, Shunichi Hino
  • Image Inspection Apparatus And Setting Method For Image Inspection Apparatus
    Publication number: 20200364840
    Abstract: To enable inspection setting flows appropriate for a rule-based inspection mode and a learning-based inspection mode to be easily created when these modes are implemented in an image inspection apparatus. The rule-based inspection mode and the learning-based inspection mode are implemented in the image inspection apparatus. In the setting mode in a rule-based inspection, the user can set an imaging condition, select an image processing tool, set the application range of an image processing tool, and adjust the parameters of the image processing tool. In the setting mode in a learning-based inspection, a non-defective product image and a defective product image are input to generate a distinguishing device.
    Type: Application
    Filed: December 30, 2019
    Publication date: November 19, 2020
    Applicant: Keyence Corporation
    Inventors: Nobuyuki KURIHARA, Shunichi HINO
  • Image Inspection Apparatus And Setting Method For Image Inspection Apparatus
    Publication number: 20200364841
    Abstract: To enable a non-defective product image or a defective product image to be easily additionally learned in both a setting mode and a run mode. Designation as to whether an inspection target image displayed on a run mode screen is additionally learned as a non-defective product image or a defective product image is received. A distinguishing device generating unit additionally learns, as a non-defective product image or a defective product image, the inspection target image designated as the additional learning target and updates a distinguishing device.
    Type: Application
    Filed: December 30, 2019
    Publication date: November 19, 2020
    Applicant: Keyence Corporation
    Inventors: Shunichi HINO, Daisuke KIDA