Patents by Inventor Shunsuke Ariyoshi

Shunsuke Ariyoshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11754580
    Abstract: A sample measurement method of performing first measurement for a blood coagulation test and second measurement for a test different from the blood coagulation test includes: dispensing a sample for use in the first measurement into a first container from a sample container; dispensing the sample for use in the second measurement into a second container different from the first container from the sample container from which the sample for use in the first measurement has been dispensed; performing the first measurement based on the sample dispensed into the first container; and performing the second measurement based on the sample dispensed into the second container.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: September 12, 2023
    Assignee: SYSMEX CORPORATION
    Inventors: Shunsuke Ariyoshi, Tsuyoshi Fukuzaki, Masaki Shiba
  • Publication number: 20190204349
    Abstract: A sample measurement method of performing first measurement for a blood coagulation test and second measurement for a test different from the blood coagulation test includes: dispensing a sample for use in the first measurement into a first container from a sample container; dispensing the sample for use in the second measurement into a second container different from the first container from the sample container from which the sample for use in the first measurement has been dispensed; performing the first measurement based on the sample dispensed into the first container; and performing the second measurement based on the sample dispensed into the second container.
    Type: Application
    Filed: December 26, 2018
    Publication date: July 4, 2019
    Applicant: SYSMEX CORPORATION
    Inventors: Shunsuke ARIYOSHI, Tsuyoshi FUKUZAKI, Masaki SHIBA
  • Patent number: 9618363
    Abstract: A specimen analysis system, a specimen analyzer, and a specimen analysis method are provided by which reexamination of a specimen can be executed more quickly than in conventional technology. A specimen analyzer measures a specimen and obtains an analysis result. The specimen analyzer determines the necessity of remeasurement of the specimen, based on a specimen analysis result. Also, the specimen analyzer determines, based on the specimen analysis result, whether or not determination of the necessity of remeasurement of the specimen based on examination information by the examination information management device is necessary. If it is determined that determination of the necessity of remeasurement of the specimen based on the examination information is necessary, the specimen analyzer makes a request to determine the necessity of remeasurement of the specimen based on the examination information, to the examination information management device.
    Type: Grant
    Filed: August 2, 2013
    Date of Patent: April 11, 2017
    Assignee: SYSMEX CORPORATION
    Inventors: Tetsuya Oda, Keisuke Kuwano, Daigo Fukuma, Shunsuke Ariyoshi
  • Patent number: 9500662
    Abstract: Disclosed is a sample analyzer comprising: a measurement unit including a reagent storage capable of holding a plurality of kinds of reagents, the measurement unit configured to measure a sample by use of a plurality of kinds of reagents held in the reagent storage in combination; a memory in which a calibration curve is stored in association with a reagent set used in creation of the calibration curve; and a controller programmed to perform operations, comprising: in a case where no calibration curve corresponding to a reagent set used in measurement of the sample has been stored, storing, in the memory, information indicating that the reagent set used in the measurement of the sample has been used in measurement, and when creating a calibration curve, automatically extracting the reagent set for which no calibration curve has been stored and for which the information has been stored.
    Type: Grant
    Filed: August 27, 2014
    Date of Patent: November 22, 2016
    Assignee: SYSMEX CORPORATION
    Inventor: Shunsuke Ariyoshi
  • Patent number: 9317658
    Abstract: A data management computer for a sample measuring apparatus is disclosed. The computer comprises a data storage, a display section; an input device; and a controller. The data storage stores results of measurements for a sample obtained by the sample measuring apparatus, the measurements including an initial measurement for a sample and a secondary measurement which is performed on the sample following the initial measurement. The controller is programmed to cause the display section to display a first result screen which shows a result of the initial measurement for a sample, receive a predefined operation by use of the input device while displaying the first result screen, and cause the display section to display, in a response to the predefined operation, a second result screen which shows a result of the secondary measurement for the sample.
    Type: Grant
    Filed: April 25, 2012
    Date of Patent: April 19, 2016
    Assignee: SYSMEX CORPORATION
    Inventors: Shunsuke Ariyoshi, Shunsuke Yao
  • Patent number: 9280642
    Abstract: A management system connected with a clinical testing apparatus is disclosed. The system acquires, from the clinical testing apparatus, a parameter that varies according to deterioration of the unit at a plurality of points of time, stores the parameters and/or analysis results that are obtained by analyzing the parameters, and provides a screen data for showing the stored parameters and/or the stored analysis results in a time-series format. A method for managing a clinical testing apparatus and a clinical testing system for the method are also disclosed.
    Type: Grant
    Filed: April 30, 2012
    Date of Patent: March 8, 2016
    Assignee: SYSMEX CORPORATION
    Inventors: Yusuke Suga, Naoki Shindo, Atsumasa Sone, Hiroyuki Koyama, Shunsuke Ariyoshi
  • Patent number: 9074971
    Abstract: A sample processing apparatus includes: a first sample processing unit; a second sample processing unit; and a data processing unit connected to the first and the second sample processing units. The data processing unit includes: a display device; an input device; and a controller configured to show a screen image on the display device, wherein the screen image comprises a shared region which is shared for displaying information of each of the first and the second sample processing units, a first operation section operable by a user to control the first sample processing unit and a second operation section operable by the user to control the second sample processing unit, and control the first sample processing unit in response to an operation of the first operation section, and control the second sample processing unit in response to an operation of the second operation section.
    Type: Grant
    Filed: October 26, 2011
    Date of Patent: July 7, 2015
    Assignee: SYSMEX CORPORATION
    Inventor: Shunsuke Ariyoshi
  • Patent number: 8996317
    Abstract: A sample analyzer comprising: a measuring unit, which comprises a signal output section for outputting a signal representing a characteristic of a measurement specimen prepared by mixing a sample with a reagent, and a signal adjusting section for adjusting the signal outputted from the signal output section, the measuring unit outputting a detection signal based on the signal adjusted by the signal adjusting section; and a result producing unit for producing an analysis result based on the detection signal outputted from the measuring unit and storing the analysis result therein is disclosed. A computer program product for the sample analyzer and a method for analyzing a sample using such a sample analyzer is also disclosed.
    Type: Grant
    Filed: August 25, 2010
    Date of Patent: March 31, 2015
    Assignee: Sysmex Corporation
    Inventor: Shunsuke Ariyoshi
  • Publication number: 20150064795
    Abstract: Disclosed is a sample analyzer comprising: a measurement unit including a reagent storage capable of holding a plurality of kinds of reagents, the measurement unit configured to measure a sample by use of a plurality of kinds of reagents held in the reagent storage in combination; a memory in which a calibration curve is stored in association with a reagent set used in creation of the calibration curve; and a controller programmed to perform operations, comprising: in a case where no calibration curve corresponding to a reagent set used in measurement of the sample has been stored, storing, in the memory, information indicating that the reagent set used in the measurement of the sample has been used in measurement, and when creating a calibration curve, automatically extracting the reagent set for which no calibration curve has been stored and for which the information has been stored.
    Type: Application
    Filed: August 27, 2014
    Publication date: March 5, 2015
    Inventor: Shunsuke ARIYOSHI
  • Patent number: 8942852
    Abstract: A sample processing system comprising: a sample processing apparatus configured to process a sample in a sample container; a transporting apparatus configured to transport a sample container to the sample processing apparatus; a first computer configured to perform information processing for the sample processing apparatus; a second computer connected to the first computer through a communication network and configured to control a transporting operation performed by the transporting apparatus; an input unit and a display commonly used for the first and second computers, wherein the first computer configured to control the display to show a first computer screen image, and to control the display to show a second computer screen image upon receiving a switching instruction via the input unit, and the second computer receives an input from the input unit via the second computer screen image shown on the display.
    Type: Grant
    Filed: April 17, 2012
    Date of Patent: January 27, 2015
    Assignee: Sysmex Corporation
    Inventors: Hiroo Tatsutani, Shunsuke Ariyoshi
  • Publication number: 20140119994
    Abstract: Disclosed is a sample analyzer comprising: a measurement section configured to store a reagent or consumable to be used in a measurement of a sample and to measure a sample with the stored reagent or consumable; a display section; and a controller programmed to control the display section to show a changeover support screen configured to help a changeover of an operation of the sample analyzer, the changeover support screen showing a residual amount information related to a residual amount of the reagent or consumable stored in the measurement section.
    Type: Application
    Filed: October 25, 2013
    Publication date: May 1, 2014
    Applicant: Sysmex Corporation
    Inventors: Shunsuke ARIYOSHI, Yasunori KAWATE, Toru MIZUMOTO
  • Patent number: 8706303
    Abstract: The present invention is a sample processing apparatus. The apparatus includes: a sample processing unit configured to process a sample; a display; a memory for storing an electronic manual for the sample processing apparatus; and a controller that is capable of showing a relevant part of the electronic manual on the display when a trouble has occurred in the sample processing unit, the relevant part of the electronic manual describing an operation procedure to deal with the trouble.
    Type: Grant
    Filed: April 30, 2012
    Date of Patent: April 22, 2014
    Assignee: Sysmex Corporation
    Inventors: Keisuke Kuwano, Shunsuke Ariyoshi, Tomomi Sugiyama
  • Patent number: 8700339
    Abstract: Disclosed is a sample processing apparatus, comprising: a sample processing unit for processing a sample with an auxiliary item used to process the sample; an output device for outputting a processing result by the sample processing unit; and a controller for determining whether or not the auxiliary item is appropriate for the sample processing by sample processing unit, and controlling, when determining that the auxiliary item is not appropriate for the sample processing by the sample processing unit, the output device so as to output the processing result and reliability information showing that the processing result has a low reliability. Also disclosed is a method for outputting the processing result by the sample processing apparatus and a computer program product.
    Type: Grant
    Filed: April 16, 2012
    Date of Patent: April 15, 2014
    Assignee: Sysmex Corporation
    Inventor: Shunsuke Ariyoshi
  • Publication number: 20130317773
    Abstract: A specimen analysis system, a specimen analyzer, and a specimen analysis method are provided by which reexamination of a specimen can be executed more quickly than in conventional technology. A specimen analyzer measures a specimen and obtains an analysis result. The specimen analyzer determines the necessity of remeasurement of the specimen, based on a specimen analysis result. Also, the specimen analyzer determines, based on the specimen analysis result, whether or not determination of the necessity of remeasurement of the specimen based on examination information by the examination information management device is necessary. If it is determined that determination of the necessity of remeasurement of the specimen based on the examination information is necessary, the specimen analyzer makes a request to determine the necessity of remeasurement of the specimen based on the examination information, to the examination information management device.
    Type: Application
    Filed: August 2, 2013
    Publication date: November 28, 2013
    Applicant: Sysmex Corporation
    Inventors: Tetsuya ODA, Keisuke KUWANO, Daigo FUKUMA, Shunsuke ARIYOSHI
  • Patent number: 8504301
    Abstract: The present invention is to present a sample analyzer comprising: an analysis result information generator for generating analysis result information including an analysis result of a sample; a display; a display controller for controlling the display so as to display the analysis result information generated by the analysis result information generator; an input receiver for receiving an input of a comment to one of the analysis result information; a memory for storing the comment received by the input receiver; and a determiner for determining whether another analysis result information to be displayed on the display meets with a predetermined condition, wherein the display controller controls the display so as to display the another analysis result information and the comment stored in the memory, when the determiner has determined that the another analysis result information meets with the predetermined condition.
    Type: Grant
    Filed: July 8, 2009
    Date of Patent: August 6, 2013
    Assignee: Sysmex Corporation
    Inventors: Shunsuke Ariyoshi, Toru Mizumoto, Hiroo Tatsutani
  • Publication number: 20120283980
    Abstract: A management system connected with a clinical testing apparatus is disclosed. The system acquires, from the clinical testing apparatus, a parameter that varies according to deterioration of the unit at a plurality of points of time, stores the parameters and/or analysis results that are obtained by analyzing the parameters, and provides a screen data for showing the stored parameters and/or the stored analysis results in a time-series format. A method for managing a clinical testing apparatus and a clinical testing system for the method are also disclosed.
    Type: Application
    Filed: April 30, 2012
    Publication date: November 8, 2012
    Inventors: Yusuke Suga, Naoki Shindo, Atsumasa Sone, Hiroyuki Koyama, Shunsuke Ariyoshi
  • Publication number: 20120282155
    Abstract: The present invention is a sample processing apparatus. The apparatus includes: a sample processing unit configured to process a sample; a display; a memory for storing an electronic manual for the sample processing apparatus; and a controller that is capable of showing a relevant part of the electronic manual on the display when a trouble has occurred in the sample processing unit, the relevant part of the electronic manual describing an operation procedure to deal with the trouble.
    Type: Application
    Filed: April 30, 2012
    Publication date: November 8, 2012
    Inventors: Keisuke Kuwano, Shunsuke Ariyoshi, Tomomi Sugiyama
  • Publication number: 20120272755
    Abstract: A data management computer for a sample measuring apparatus is disclosed. The computer comprises a data storage, a display section; an input device; and a controller. The data storage stores results of measurements for a sample obtained by the sample measuring apparatus, the measurements including an initial measurement for a sample and a secondary measurement which is performed on the sample following the initial measurement. The controller is programmed to cause the display section to display a first result screen which shows a result of the initial measurement for a sample, receive a predefined operation by use of the input device while displaying the first result screen, and cause the display section to display, in a response to the predefined operation, a second result screen which shows a result of the secondary measurement for the sample.
    Type: Application
    Filed: April 25, 2012
    Publication date: November 1, 2012
    Inventors: Shunsuke Ariyoshi, Shunsuke Yao
  • Patent number: RE48189
    Abstract: The present invention is a sample processing apparatus. The apparatus includes: a sample processing unit configured to process a sample; a display; a memory for storing an electronic manual for the sample processing apparatus; and a controller that is capable of showing a relevant part of the electronic manual on the display when a trouble has occurred in the sample processing unit, the relevant part of the electronic manual describing an operation procedure to deal with the trouble.
    Type: Grant
    Filed: January 8, 2016
    Date of Patent: September 1, 2020
    Assignee: Sysmex Corporation
    Inventors: Keisuke Kuwano, Shunsuke Ariyoshi, Tomomi Sugiyama
  • Patent number: RE49503
    Abstract: The present invention is a sample processing apparatus. The apparatus includes: a sample processing unit configured to process a sample; a display; a memory for storing an electronic manual for the sample processing apparatus; and a controller that is capable of showing a relevant part of the electronic manual on the display when a trouble has occurred in the sample processing unit, the relevant part of the electronic manual describing an operation procedure to deal with the trouble.
    Type: Grant
    Filed: July 28, 2020
    Date of Patent: April 25, 2023
    Assignee: SYSMEX CORPORATION
    Inventors: Keisuke Kuwano, Shunsuke Ariyoshi, Tomomi Sugiyama