Patents by Inventor Shunzo Hirakawa

Shunzo Hirakawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8918226
    Abstract: A temperature measuring method accurately measures a sheet-like object even when the sheet-like object has an uneven temperature distribution throughout. In this method, temperature measurement is conducted in a measuring area where the sheet-like object is to be measured for its physical quantity or in the vicinity of the measuring area during determination of the physical quantity by a physical quantity measuring device. One or more temperature sensors are located at a position proximal to each sheet-like object that streams in a predetermined direction relative to the temperature sensors, and air is jetted out toward the sheet-like object for creating an air curtain that surrounds each temperature sensor so that a gauge workspace substantially confining the atmosphere therein is defined over one or both of the opposite surfaces of the sheet-like object. The temperature sensors detect the temperature in the measuring area or its vicinity within the gauge workspace.
    Type: Grant
    Filed: July 28, 2009
    Date of Patent: December 23, 2014
    Assignee: Yamabun Electronics Co., Ltd.
    Inventors: Fumio Tojo, Shunzo Hirakawa, Toshiyasu Toyoda, Masaru Iguchi, Katayama Yusuke
  • Publication number: 20110130890
    Abstract: A temperature measuring method is disclosed in which, even when a sheet-like object has an uneven temperature distribution throughout itself, the sheet-like object is measured for temperature with accuracy. In this method, temperature measurement is conducted in a measuring area (S) where the sheet-like object (a) is to be measured for its physical quantity or in the vicinity of the measuring area during determination of the physical quantity by a physical quantity measuring means.
    Type: Application
    Filed: July 28, 2009
    Publication date: June 2, 2011
    Inventors: Fumio Tojo, Shunzo Hirakawa, Toshiyasu Toyoda, Masaru Iguchi, Katayama Yusuke
  • Patent number: 6441905
    Abstract: There is provided a sheet thickness and swell measurement method and apparatus to calibrate a characteristic map of a reference plane with accuracy and on demand, and to provide a simpler construction of means for creating the characteristic map of the reference plane and means for calibrating the characteristic map. Measurement heads 2 are moved to the width direction of sheet 9, and the thickness of the sheet is measured by the sheet thickness measurement sensors 3 installed in the measurement heads 2. The measured values of the sheet thickness are calibrated by a characteristic map MP of the moving mechanism 4 of the measurement head 2 with respect to the sheet width direction, which has been created in advance. Highly directional electromagnetic waves emitting means is arranged on one side of the main frame 1 for emitting highly directional electromagnetic waves 5a, such as light or beam, which define a reference plane for creating the characteristic map.
    Type: Grant
    Filed: March 10, 2000
    Date of Patent: August 27, 2002
    Assignee: Yamabun Electric Co., LTD
    Inventors: Fumjo Tojyo, Shunzo Hirakawa