Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: A layout of a semiconductor memory device includes a substrate and a ternary content addressable memory (TCAM). The TCAM is disposed on the substrate and includes a plurality of TCAM bit cells, where at least two of the TCAM bit cells are mirror-symmetrical along an axis of symmetry, and each of the TCAM bit cells includes two storage units electrically connected to two word lines respectively, and a logic circuit electrically connected to the storage units. The logic circuit includes two first reading transistors, and two second reading transistors, where each of the second reading transistors includes a gate and source and drain regions, the source and drain regions of the second reading transistors are electrically connected to two matching lines and the first reading transistors, respectively, where the word lines are disposed parallel to and between the matching lines.

Abstract: An optical path test system includes a return light test unit for emitting laser light to an optical path monitoring unit to simulate return light received by the optical path monitoring unit in a normal operation; a light path monitoring unit arranged on a light path of the return light testing unit for receiving the return light and normally emitting laser light; and a power detector for receiving the laser light emitted by the light path monitoring unit so as to monitor stability of output power of the chip when the light path monitoring unit receives the return light emitted by the return light testing unit. The technical solution in the present invention emits laser light to a tested laser chip to simulate return light received by the tested laser chip in a normal operation, and a return light resistance threshold of the laser chip can be accurately evaluated.

Abstract: An optical path test system includes a return light test unit for emitting laser light to an optical path monitoring unit to simulate return light received by the optical path monitoring unit in a normal operation; a light path monitoring unit arranged on a light path of the return light testing unit for receiving the return light and normally emitting laser light; and a power detector for receiving the laser light emitted by the light path monitoring unit so as to monitor stability of output power of the chip when the light path monitoring unit receives the return light emitted by the return light testing unit. The technical solution in the present invention emits laser light to a tested laser chip to simulate return light received by the tested laser chip in a normal operation, and a return light resistance threshold of the laser chip can be accurately evaluated.

Abstract: A holding wrench includes a clamping assembly and a pair of handles. The clamping assembly includes a housing, a transmission gear, a first latching member, a second latching member, and an adjusting subassembly. The first latching member and the second latching member engage with the transmission gear. The adjusting subassembly includes an adjusting member, a pair of pushing members protruding from the adjusting member, and a pair of resisting members. The adjusting member defines a pair of latching grooves. The pair of pushing members is located between the first latching member and the second latching member. When the adjusting member is moved toward the second latching member, one of the pair of pushing member pushes the second latching member away from the transmission gear, and the pair of resisting members latches into the pair of latching grooves, thereby positioning the adjusting member.

Abstract: A holding wrench includes a clamping assembly and a pair of handles. The clamping assembly includes a housing, a transmission gear, a first latching member, a second latching member, and an adjusting subassembly. The first latching member and the second latching member engage with the transmission gear. The adjusting subassembly includes an adjusting member, a pair of pushing members protruding from the adjusting member, and a pair of resisting members. The adjusting member defines a pair of latching grooves. The pair of pushing members is located between the first latching member and the second latching member. When the adjusting member is moved toward the second latching member, one of the pair of pushing member pushes the second latching member away from the transmission gear, and the pair of resisting members latches into the pair of latching grooves, thereby positioning the adjusting member.