Patents by Inventor Shusaku Maedo

Shusaku Maedo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of observing defect and observation apparatus using microscope
    Publication number: 20070024963
    Abstract: Detection efficiency is improved by saving time for setting beforehand a detailed condition before a review work. Various conditions are automatically set on the basis of defect information sent from a defect inspection apparatus and information acquired during actual reviewing to save time for setting the detailed condition before the review work and to decide automatically and within a short time a proper condition.
    Type: Application
    Filed: July 7, 2006
    Publication date: February 1, 2007
    Inventors: Shusaku Maedo, Kazuo Aoki